Doing Moore with less Blog 5/27/2010 Post a comment For years, Numetrics has helped leading semiconductor R&D groups improve their development productivity. Today, it is launching a free trial product for EE Times readers that showcases some of the capability those R&D organizations use before they start their design projects.
Two ways to learn and share ideas Industrial Control DesignLine Blog 5/26/2010 Post a comment Check out MEMS symposium at The Sensors Expo on June 7th in Rosemont, IL. Also, here's an opportunity to show and tell your team's industrial control projects.
Opinion: Microsoft needs a K Blog 5/26/2010 3 comments Unexplained in the restructuring of Microsoft's consumer division is where it will get the new blood to replace J Allard at a time when the consumer device sector is exploding with creative ideas and the Windows giant has been playing catch up.
Help Erach Desai's daughter Programmable Logic DesignLine Blog 5/25/2010 Post a comment Erach Desai, a longtime analyst in the EDA and semiconductor community, is facing his worst nightmare. His 16-year-old daughter, Jacqueline, has been diagnosed with stage IV osteosarcoma, a rare form of bone cancer. They could use a helping hand.
Securing the smart grid Blog 5/10/2010 1 comment Despite the dire warnings that the emerging U.S. smart grid might be too smart for anyone's good, the folks working on the buildout of a new American power grid insist that they have network security issues in hand.
Life, attachments and how to smash a CRT Signal Processing DesignLine Blog 5/7/2010 6 comments It’s funny how you never realize how much something has woven itself into the fabric of your life until you sit down and try and figure out the best way to smash it to smithereens.
Why the electronics industry needs 3-D technology Blog 5/6/2010 Post a comment Why 3D extraction? It all comes down to the need to create, from the layout view, a more precise electrical circuit model, which when simulated gives the designer performance characteristics such as timing, power and noise, as well as other important parameters like gain, bandwidth and reliability.