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Content posted in May 2013
Video: Funny magic trick
Programmable Logic DesignLine Blog  
5/31/2013   Post a comment
I just ran across a video on YouTube (where else) billed as "Easily the funniest magic trick I've ever seen!" So, of course, I had to take a look…
Mega-cool Image Blender app for the iPad
Programmable Logic DesignLine Blog  
5/22/2013   1 comment
This is a simple and clean iPhone and iPad app with a single purpose – blending multiple images together.
ARM TechCon 2013 – Call for Papers Now Open
Programmable Logic DesignLine Blog  
5/22/2013   Post a comment
Now in its seventh year, ARM TechCon is ranked one of the top three critical events in the embedded sector.
Mega-cool Camera Lucida app for the iPad
Programmable Logic DesignLine Blog  
5/21/2013   5 comments
Initially I assumed that this app was for drawing on the iPad screen … I was so wrong!
Video: Dancing Lego
Programmable Logic DesignLine Blog  
5/20/2013   Post a comment
This video involves a Raspberry Pi, five servos, and a bunch of Lego…
A Camera Lucida for the 21st Century
Programmable Logic DesignLine Blog  
5/13/2013   7 comments
A few days ago I became aware of a rather interesting project on KickStarter.com...
Yours truly profiled in Circuit Cellar magazine
Programmable Logic DesignLine Blog  
5/6/2013   7 comments
Glancing through the contents list my orbs fell across the eye-catching title: "An Interview with Clive 'Max' Maxfield"
Awesome Moustache Camera at Design West
Programmable Logic DesignLine Blog  
5/1/2013   3 comments
I have to admit that I am in awe of the most amazing "Moustache Camera" I saw at Design West.


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As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.

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