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LeCroy on the rise?
Test & Measurement Designline Blogs  
5/31/2012   3 comments
How will LeCroy's acquisition news affect the high-end scope market in terms of the “big three:” Tektronix, Agilent, and LeCroy?
Scope roundup
Test & Measurement Designline Blogs  
4/17/2012   3 comments
There's been a lot of news and events surrounding oscilloscopes lately, so I thought I would do a round up for you.
Go 'back to the basics' to solve switching and measurement problems
Test & Measurement Designline Blogs  
6/15/2011   1 comment
For many engineers, solving a measurement problem is a matter of going back to the basics of switching. Here are some common switching-related error sources to consider when troubleshooting measurement problems.
DESIGN TIP: The Tortoise and the Hare
Test & Measurement Designline Blogs  
5/25/2011   2 comments
Your primo product has a problem—a bad problem. You know you have an all-hands-on-deck situation, but how do you reach a solution as quickly as possible?
DESIGN TIP: The glass should be not quite full
Test & Measurement Designline Blogs  
5/12/2011   Post a comment
Let’s say you’re developing a new product and getting it to market quickly is your highest priority. What’s the best approach to help your team reach its product introduction goal as fast as possible?
The six basic audio tests in video tutorials
Test & Measurement Designline Blogs  
4/27/2011   3 comments
A series of video tutorials on "the six basic audio measurements" - produced by audio test company Audio Precision - covers the topics of frequency response, THD+N, phase, SNR, crosstalk and level & gain.
Spread-spectrum clocking to reduce EMI: clever or cheat?
Test & Measurement Designline Blogs  
4/13/2011   24 comments
This common technique can help you meet a spec or solve a problem, but has worrisome implications as well.
Static analysis vs. dynamic test: A matter of multiple choice?
Test & Measurement Designline Blogs  
3/28/2011   1 comment
In the diverse domain of software code analysis and test, the answer to the question of the right tool may be a matter of choosing among multiple choices appropriate to the application.
Expanding options for design with SiGe
Test & Measurement Designline Blogs  
3/21/2011   Post a comment
When it comes to developing the highest performance, most reliable, yet cost-effective products for leading-edge applications, design engineers in the RF/microwave industry need and want options
S-parameter measurements for the masses
Test & Measurement Designline Blogs  
3/15/2011   1 comment
S-parameters were king at this year's DesignCon, dominating many of the talks new products on display.
Why you should use LXI instruments in your next T&M system
Test & Measurement Designline Blogs  
3/9/2011   Post a comment
Once, combining separate instruments into an integrated test system meant GPIB interfaces. Today, a world of interface options are available, including Universal Serial Bus (USB) and LAN eXtensions for Instrumentation (LXI). Although there’s definitely a role for USB in T&M system integration, from the perspective of a test system integrator, I think LXI offers an edge.
Who Needs Pulsed I-V Testing?
Test & Measurement Designline Blogs  
2/9/2011   Post a comment
Recently, there has been a surge in the number of applications that require ultra-fast I-V measurements, which involve generating pulsed waveforms, then measuring the resulting signals before the DUT has an opportunity to relax.
What Graphene Offers for Future Electronic Devices
Test & Measurement Designline Blogs  
12/7/2010   4 comments
Recently, several of my colleagues at Keithley made a customer visit to the Condensed Matter Physics Lab at the University of Manchester. That visit coincided with the announcement that Drs. Geim and Novoselov had just been awarded the 2010 Nobel Prize in Physics.
The changing face of electronic test instrumentation
Test & Measurement Designline Blogs  
10/21/2010   1 comment
Over the last 20 years, many different types of software applications have evolved to help relieve the test engineer from spending huge blocks of time writing code. Today, software products exist to create waveforms, analyze vector signals and make highly accurate measurements using advanced methodologies. These software tools can be integrated into a larger automated test environment and many instruments are now PC-based so the applications can now run directly on the instrument.
T&M gets dedicated designline
Test & Measurement Designline Blogs  
10/4/2010   1 comment
Welcome to the Test & Measurement Designline, the latest addition to the EE Times Group's 'heads down' communities designed to help engineers tackle practical, technical and software challenges to bring product specification to reality.
Hot on the trail of an elusive current fluctuation
Test & Measurement Designline Blogs  
7/29/2010   6 comments
An engineer relies on first principles to troubleshoot a solar cell testing system
Where's a good calibration lab when you need one?
Test & Measurement Designline Blogs  
7/27/2010   10 comments
An exasperated engineer struggles to troubleshoot a scope with a funky frequency response
NIWeek photo shoot (part 1)
Test & Measurement Designline Blogs  
8/25/2009   Post a comment
It's been a few weeks since I attended NIWeek in Austin, but I still have more content coming from that show. I did manage to bring my digital camera and take some pictures. Here is the diary of my two and a half days there--in image form (part one).
A virtual instrument reality check: Where's it really at?
Test & Measurement Designline Blogs  
11/12/2004   Post a comment
Leaps in processing power, I/O speeds, and local memory characterize today's system-ready test instruments. Agilent Technologies' program manager Marsh Faber tells why system-ready equipment is a major evolutionary phase in test, packing every bit as much impact as IEEE-488/GPIB did when it was introduced back in 1972. This in spite of so-called virtual instruments.
Opinion: If you're seeking test system flexibility, modular instrumentation isn't the only way to go
Test & Measurement Designline Blogs  
12/16/2003   Post a comment
Many EEs feel that test-and-measurement flexibility is best achieved with modular instruments, But, they're only one of many ways to reach the goal. Grant Drenkow, Solutions Planner at Agilent Technologies's Test and Measurement Group explains why he believes there are tradeoffs.


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In conjunction with unveiling of EE Times’ Silicon 60 list, journalist & Silicon 60 researcher Peter Clarke hosts a conversation on startups in the electronics industry. One of Silicon Valley's great contributions to the world has been the demonstration of how the application of entrepreneurship and venture capital to electronics and semiconductor hardware can create wealth with developments in semiconductors, displays, design automation, MEMS and across the breadth of hardware developments. But in recent years concerns have been raised that traditional venture capital has turned its back on hardware-related startups in favor of software and Internet applications and services. Panelists from incubators join Peter Clarke in debate.
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