LeCroy on the rise?
Test & Measurement Designline Blogs 5/31/2012 3 comments
How will LeCroy's acquisition news affect the high-end scope market in terms of the “big three:” Tektronix, Agilent, and LeCroy?
Test & Measurement Designline Blogs 4/17/2012 3 comments
There's been a lot of news and events surrounding oscilloscopes lately, so I thought I would do a round up for you.
DESIGN TIP: The Tortoise and the Hare
Test & Measurement Designline Blogs 5/25/2011 2 comments
Your primo product has a problem—a bad problem. You know you have an all-hands-on-deck situation, but how do you reach a solution as quickly as possible?
DESIGN TIP: The glass should be not quite full
Test & Measurement Designline Blogs 5/12/2011 Post a comment
Let’s say you’re developing a new product and getting it to market quickly is your highest priority. What’s the best approach to help your team reach its product introduction goal as fast as possible?
The six basic audio tests in video tutorials
Test & Measurement Designline Blogs 4/27/2011 3 comments
A series of video tutorials on "the six basic audio measurements" - produced by audio test company Audio Precision - covers the topics of frequency response, THD+N, phase, SNR, crosstalk and level & gain.
Expanding options for design with SiGe
Test & Measurement Designline Blogs 3/21/2011 Post a comment
When it comes to developing the highest performance, most reliable, yet cost-effective products for leading-edge applications, design engineers in the RF/microwave industry need and want options
Why you should use LXI instruments in your next T&M system
Test & Measurement Designline Blogs 3/9/2011 Post a comment
Once, combining separate instruments into an integrated test system meant GPIB interfaces. Today, a world of interface options are available, including Universal Serial Bus (USB) and LAN eXtensions for Instrumentation (LXI). Although there’s definitely a role for USB in T&M system integration, from the perspective of a test system integrator, I think LXI offers an edge.
Who Needs Pulsed I-V Testing?
Test & Measurement Designline Blogs 2/9/2011 Post a comment
Recently, there has been a surge in the number of applications that require ultra-fast I-V measurements, which involve generating pulsed waveforms, then measuring the resulting signals before the DUT has an opportunity to relax.
What Graphene Offers for Future Electronic Devices
Test & Measurement Designline Blogs 12/7/2010 4 comments
Recently, several of my colleagues at Keithley made a customer visit to the Condensed Matter Physics Lab at the University of Manchester. That visit coincided with the announcement that Drs. Geim and Novoselov had just been awarded the 2010 Nobel Prize in Physics.
The changing face of electronic test instrumentation
Test & Measurement Designline Blogs 10/21/2010 1 comment
Over the last 20 years, many different types of software applications have evolved to help relieve the test engineer from spending huge blocks of time writing code. Today, software products exist to create waveforms, analyze vector signals and make highly accurate measurements using advanced methodologies. These software tools can be integrated into a larger automated test environment and many instruments are now PC-based so the applications can now run directly on the instrument.
T&M gets dedicated designline
Test & Measurement Designline Blogs 10/4/2010 1 comment
Welcome to the Test & Measurement Designline, the latest addition to the EE Times Group's 'heads down' communities designed to help engineers tackle practical, technical and software challenges to bring product specification to reality.
NIWeek photo shoot (part 1)
Test & Measurement Designline Blogs 8/25/2009 Post a comment
It's been a few weeks since I attended NIWeek in Austin, but I still have more content coming from that show. I did manage to bring my digital camera and take some pictures. Here is the diary of my two and a half days there--in image form (part one).
A virtual instrument reality check: Where's it really at?
Test & Measurement Designline Blogs 11/12/2004 Post a comment
Leaps in processing power, I/O speeds, and local memory characterize today's system-ready test instruments. Agilent Technologies' program manager Marsh Faber tells why system-ready equipment is a major evolutionary phase in test, packing every bit as much impact as IEEE-488/GPIB did when it was introduced back in 1972. This in spite of so-called virtual instruments.
Using S parameters for signal integrity analysis
Test & Measurement Designline Blogs 2/23/2004 Post a comment
S parameters aren't just for microwave engineers any more; they're becoming important for analog and digital design. In this feature, Optimal's Ching-Chao Huang (right) reveals methods that will help you get accurate S parameters for signal integrity analysis.