LeCroy on the rise? Test & Measurement Designline Blogs 5/31/2012 3 comments How will LeCroy's acquisition news affect the high-end scope market in terms of the “big three:” Tektronix, Agilent, and LeCroy?
Scope roundup Test & Measurement Designline Blogs 4/17/2012 3 comments There's been a lot of news and events surrounding oscilloscopes lately, so I thought I would do a round up for you.
DESIGN TIP: The Tortoise and the Hare Test & Measurement Designline Blogs 5/25/2011 2 comments Your primo product has a problem—a bad problem. You know you have an all-hands-on-deck situation, but how do you reach a solution as quickly as possible?
DESIGN TIP: The glass should be not quite full Test & Measurement Designline Blogs 5/12/2011 Post a comment Let’s say you’re developing a new product and getting it to market quickly is your highest priority. What’s the best approach to help your team reach its product introduction goal as fast as possible?
The six basic audio tests in video tutorials Test & Measurement Designline Blogs 4/27/2011 3 comments A series of video tutorials on "the six basic audio measurements" - produced by audio test company Audio Precision - covers the topics of frequency response, THD+N, phase, SNR, crosstalk and level & gain.
Expanding options for design with SiGe Test & Measurement Designline Blogs 3/21/2011 Post a comment When it comes to developing the highest performance, most reliable, yet cost-effective products for leading-edge applications, design engineers in the RF/microwave industry need and want options
Why you should use LXI instruments in your next T&M system Test & Measurement Designline Blogs 3/9/2011 Post a comment Once, combining separate instruments into an integrated test system meant GPIB interfaces. Today, a world of interface options are available, including Universal Serial Bus (USB) and LAN eXtensions for Instrumentation (LXI). Although there’s definitely a role for USB in T&M system integration, from the perspective of a test system integrator, I think LXI offers an edge.
Who Needs Pulsed I-V Testing? Test & Measurement Designline Blogs 2/9/2011 Post a comment Recently, there has been a surge in the number of applications that require ultra-fast I-V measurements, which involve generating pulsed waveforms, then measuring the resulting signals before the DUT has an opportunity to relax.
What Graphene Offers for Future Electronic Devices Test & Measurement Designline Blogs 12/7/2010 4 comments Recently, several of my colleagues at Keithley made a customer visit to the Condensed Matter Physics Lab at the University of Manchester. That visit coincided with the announcement that Drs. Geim and Novoselov had just been awarded the 2010 Nobel Prize in Physics.
The changing face of electronic test instrumentation Test & Measurement Designline Blogs 10/21/2010 1 comment Over the last 20 years, many different types of software applications have evolved to help relieve the test engineer from spending huge blocks of time writing code. Today, software products exist to create waveforms, analyze vector signals and make highly accurate measurements using advanced methodologies. These software tools can be integrated into a larger automated test environment and many instruments are now PC-based so the applications can now run directly on the instrument.
T&M gets dedicated designline Test & Measurement Designline Blogs 10/4/2010 1 comment Welcome to the Test & Measurement Designline, the latest addition to the EE Times Group's 'heads down' communities designed to help engineers tackle practical, technical and software challenges to bring product specification to reality.
NIWeek photo shoot (part 1) Test & Measurement Designline Blogs 8/25/2009 Post a comment It's been a few weeks since I attended NIWeek in Austin, but I still have more content coming from that show. I did manage to bring my digital camera and take some pictures. Here is the diary of my two and a half days there--in image form (part one).
A virtual instrument reality check: Where's it really at? Test & Measurement Designline Blogs 11/12/2004 Post a comment Leaps in processing power, I/O speeds, and local memory characterize today's system-ready test instruments. Agilent Technologies' program manager Marsh Faber tells why system-ready equipment is a major evolutionary phase in test, packing every bit as much impact as IEEE-488/GPIB did when it was introduced back in 1972. This in spite of so-called virtual instruments.
As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.
January 2016 Cartoon Caption ContestBob's punishment for missing his deadline was to be tied to his chair tantalizingly close to a disconnected cable, with one hand superglued to his desk and another to his chin, while the pages from his wall calendar were slowly torn away.122 comments