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Content posted in March 2011
Static analysis vs. dynamic test: A matter of multiple choice?
Test & Measurement Designline Blogs  
3/28/2011   1 comment
In the diverse domain of software code analysis and test, the answer to the question of the right tool may be a matter of choosing among multiple choices appropriate to the application.
Expanding options for design with SiGe
Test & Measurement Designline Blogs  
3/21/2011   Post a comment
When it comes to developing the highest performance, most reliable, yet cost-effective products for leading-edge applications, design engineers in the RF/microwave industry need and want options
S-parameter measurements for the masses
Test & Measurement Designline Blogs  
3/15/2011   1 comment
S-parameters were king at this year's DesignCon, dominating many of the talks new products on display.
Why you should use LXI instruments in your next T&M system
Test & Measurement Designline Blogs  
3/9/2011   Post a comment
Once, combining separate instruments into an integrated test system meant GPIB interfaces. Today, a world of interface options are available, including Universal Serial Bus (USB) and LAN eXtensions for Instrumentation (LXI). Although there’s definitely a role for USB in T&M system integration, from the perspective of a test system integrator, I think LXI offers an edge.


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What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.

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