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Content posted in March 2011
Static analysis vs. dynamic test: A matter of multiple choice?
Test & Measurement Designline Blogs  
3/28/2011   1 comment
In the diverse domain of software code analysis and test, the answer to the question of the right tool may be a matter of choosing among multiple choices appropriate to the application.
Expanding options for design with SiGe
Test & Measurement Designline Blogs  
3/21/2011   Post a comment
When it comes to developing the highest performance, most reliable, yet cost-effective products for leading-edge applications, design engineers in the RF/microwave industry need and want options
S-parameter measurements for the masses
Test & Measurement Designline Blogs  
3/15/2011   1 comment
S-parameters were king at this year's DesignCon, dominating many of the talks new products on display.
Why you should use LXI instruments in your next T&M system
Test & Measurement Designline Blogs  
3/9/2011   Post a comment
Once, combining separate instruments into an integrated test system meant GPIB interfaces. Today, a world of interface options are available, including Universal Serial Bus (USB) and LAN eXtensions for Instrumentation (LXI). Although there’s definitely a role for USB in T&M system integration, from the perspective of a test system integrator, I think LXI offers an edge.


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As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.

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