Expanding options for design with SiGe Test & Measurement Designline Blogs 3/21/2011 Post a comment When it comes to developing the highest performance, most reliable, yet cost-effective products for leading-edge applications, design engineers in the RF/microwave industry need and want options
Why you should use LXI instruments in your next T&M system Test & Measurement Designline Blogs 3/9/2011 Post a comment Once, combining separate instruments into an integrated test system meant GPIB interfaces. Today, a world of interface options are available, including Universal Serial Bus (USB) and LAN eXtensions for Instrumentation (LXI). Although there’s definitely a role for USB in T&M system integration, from the perspective of a test system integrator, I think LXI offers an edge.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.