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Content tagged with Test & Measurement Designline posted in January 2011
Optiphase creates waveform and timing generator instrument using Opal Kelly XEM3001 FPGA module
News & Analysis  
1/31/2011   1 comment
Optiphase has created a PC-controlled Waveform and Timing Generator (WTG) instrument using the Opal Kelly XEM3001 FPGA module mated with a custom adapter PCB.
DesignCon: National, Rambus rev to 20G+
News & Analysis  
1/31/2011   1 comment
National, Molex and Rambus will be among dozens of companies at DesignCon unveiling capabilities to drive signals to 20 Gbits/s or higher for next-generation systems.
Sophisticated test set provides PCI Express 3.0 receiver characterization
Product News  
1/25/2011   Post a comment
A complex, demanding test requirement calls for a corresponding solution, as Agilent's PCI Express 3.0 test with J-BERT N4903B demonstrates
Precision pulse function arbitrary noise generator tackles higher speed, bandwidth R&D and test needs
Product News  
1/25/2011   Post a comment
Agilent 81160A does 330-MHz pulses, 500 MHz function/arbitrary waveforms with 2.5 Gsample/sec rate and 14-bit resolution
Analyzer tests IEEE 802.3at PoE powered devices
Product News  
1/12/2011   Post a comment
An automated IEEE 802.3at powered device analysis from Sifos Technologies provides one-button, fully automated test sequences and limit processing for critical powered device operating parameters.
Tektronix signal analyzer delivers high performance at mid-range cost
Product News  
1/4/2011   Post a comment
Tektronix releases signal analyzer that packs performance for embedded RF, radio communications, and spectrum management.


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As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.

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