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Content tagged with Test & Measurement Designline posted in January 2011
Optiphase creates waveform and timing generator instrument using Opal Kelly XEM3001 FPGA module
News & Analysis  
1/31/2011   1 comment
Optiphase has created a PC-controlled Waveform and Timing Generator (WTG) instrument using the Opal Kelly XEM3001 FPGA module mated with a custom adapter PCB.
DesignCon: National, Rambus rev to 20G+
News & Analysis  
1/31/2011   1 comment
National, Molex and Rambus will be among dozens of companies at DesignCon unveiling capabilities to drive signals to 20 Gbits/s or higher for next-generation systems.
Sophisticated test set provides PCI Express 3.0 receiver characterization
Product News  
1/25/2011   Post a comment
A complex, demanding test requirement calls for a corresponding solution, as Agilent's PCI Express 3.0 test with J-BERT N4903B demonstrates
Precision pulse function arbitrary noise generator tackles higher speed, bandwidth R&D and test needs
Product News  
1/25/2011   Post a comment
Agilent 81160A does 330-MHz pulses, 500 MHz function/arbitrary waveforms with 2.5 Gsample/sec rate and 14-bit resolution
Analyzer tests IEEE 802.3at PoE powered devices
Product News  
1/12/2011   Post a comment
An automated IEEE 802.3at powered device analysis from Sifos Technologies provides one-button, fully automated test sequences and limit processing for critical powered device operating parameters.
Tektronix signal analyzer delivers high performance at mid-range cost
Product News  
1/4/2011   Post a comment
Tektronix releases signal analyzer that packs performance for embedded RF, radio communications, and spectrum management.


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