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Content tagged with Test & Measurement Designline posted in October 2007
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Functional tester targets automotive apps
Product News  
10/31/2007   Post a comment
Agilent Technologies has introduced a low-cost, small-footprint functional tester designed for automotive test markets.
VenturEast launches $150 million India fund
News & Analysis  
10/31/2007   Post a comment
Venture capital continues to pour into India on the heels of new investments by Google Inc. and Cisco Systems in recent days.
Ofcom chief airs concerns about EU telecom regulation
News & Analysis  
10/31/2007   Post a comment
National telecoms regulators in Europe have started flexing their muscles about plans by the European Commission to shake up the regulatory framework and setting up a pan-European watchdog.
Philips signs up for Moore Microprocessor Patent portfolio
News & Analysis  
10/30/2007   Post a comment
Royal Philips Electronics has become the 23rd company in as many months to purchase a Moore Microprocessor Patent portfolio license, and the third major European company to purchase a license following Schneider Electric, Nokia Corporation and Lego.
TI's sub-1 GHz RF SoC integrates USB controller
Product News  
10/30/2007   Post a comment
The CC1111 is particularly useful when designed into a low-power sensor network utilizing TI's proprietary SimpliciTI network protocol.
Seagate shutters Northern Ireland facility
News & Analysis  
10/30/2007   Post a comment
Hard drives specialist Seagate Technology is abandoning one of its two manufacturing plants in Northern Ireland, which will result in about 780 full time employees losing their jobs.
Cisco plans new $100 million venture fund in India
News & Analysis  
10/30/2007   Post a comment
Cisco Systems Inc. will invest another $100 million in early-stage Indian technology companies, doubling venture funding it announced two years ago as part of its $1.1 billion investment plan for India.
Memory tester targets multi-chip packages
Product News  
10/30/2007   Post a comment
The T5781 test system from Advantest offers high test speeds of 533-Mbits/s for next-generation MCPs, devices that combine multiple memory types, including NAND, NOR and DRAM, in a single package.
Failure module simulates faults for auto electronic control unit testing
Product News  
10/30/2007   Post a comment
ETAS has released the ES4440 Compact Failure Simulation Module to insert electrical faults in the wire harness of a powertrain Electronic Control Unit (ECU) to verify the software and hardware passes diagnostics tests.
Wafer probe cards lower wire-bond logic, SoC test costs
Product News  
10/30/2007   Post a comment
FormFactor has developed a family of advanced wafer probe cards designed to address the rising cost and technology challenges associated with testing wire bond logic and system-on-chip (SoC) devices.
Boundary scan system debugs/tests complex PCBs in one package
Product News  
10/29/2007   Post a comment
XJTAG has released version 2.0 of its XJTAG boundary scan development system that offers several enhancements that simplify and speed up printed-circuit-board (PCB) debug and test.
2 Gbits/s test system targets bi-directional interfaces
Product News  
10/29/2007   Post a comment
Advantest's 2 Gbits/s test solution with 36-channels, zero round trip, and multi-strobe technology provides high accuracy testing of source-synchronous interfaces including DDR2/DDR3.
Probing solution delivers oscilloscope measurements in extreme temperatures
Product News  
10/29/2007   Post a comment
Agilent says it has introduced the industry's first probing solution for making oscilloscope measurements in environmental chambers and in other applications with extreme temperature conditions.
Test bench allows engineers to validate DisplayPort designs
Product News  
10/29/2007   Post a comment
Tektronix latest test product represents a complete bench for engineers wanting to optimize and validate the performance of their DisplayPort designs.
State of the Engineer: Immigration--The reactionary side of engineering
News & Analysis  
10/29/2007   Post a comment
Although engineers are decidedly open-minded about "green" technology, they are much less liberally disposed toward immigrants.
Sun-led 'eco consortium' tackles India's infrastructure
Product News  
10/29/2007   Post a comment
Sun Microsystems has formed an "eco consortium" with Hitachi Data, APC-MGE, AMD and India's Wipro Infotech to help Indian businesses cope with India's infrastructure problems and "green" their businesses.
Google expands its venture-funding role in India
Product News  
10/29/2007   Post a comment
Search giant Google Inc., describing the Indian market as hamstrung by a dearth of early-stage venture capital, announced two more pacts here that aim to give it more breadth in the venture funding of companies in the country.
EE Times Salary Survey e-mail response: Kenneth Rousseau
News & Analysis  
10/29/2007   Post a comment
EE Times Salary Survey e-mail response: Kenneth Rousseau
EE Times Salary Survey e-mail response: Matthew Burns
News & Analysis  
10/29/2007   Post a comment
EE Times Salary Survey e-mail response: Matthew Burns
EE Times Salary Survey e-mail response: Michael Bandel
News & Analysis  
10/29/2007   Post a comment
EE Times Salary Survey e-mail response: Michael Bandel
EE Times Salary Survey e-mail response: Roger Landon
News & Analysis  
10/29/2007   Post a comment
EE Times Salary Survey e-mail response: Roger Landon
EE Times Salary Survey e-mail response: Shaun McMaster
News & Analysis  
10/29/2007   Post a comment
EE Times Salary Survey e-mail response: Shaun McMaster
Strong growth seen in September chip sales
News & Analysis  
10/29/2007   Post a comment
Global chip sales surged by 5 percent in September, to $22.6 billion from the $21.5 billion recorded in August, the fastest increase so far this year, following an excellent August, according to figures from the World Semiconductor Trade Statistics (WSTS) organization.
Synopsys boosts manufacturing test quality
Product News  
10/26/2007   Post a comment
Aimed at design organizations worldwide, the TetraMAX small delay defect automatic test pattern generator (ATPG) from Synopsys is designed to improve manufacturing test quality compared with conventional at-speed test methods.
Network probing platform monitors video transport in IPTV networks
Product News  
10/26/2007   Post a comment
Tektronix has introduced a network monitoring platform that monitors quality of video transport services in IPTV networks in real-time.
Tester combines lab testing with a portable form factor
Product News  
10/26/2007   Post a comment
JDSU has introduced the ONT-503, a compact 40/43G tester that combines lab testing needs with a portable form factor.
Anritsu's microwave signal synthesizer delivers super fast switching
Product News  
10/26/2007   Post a comment
The MG37020A utilizes advanced VCO-based hardware architecture to achieve its switching speed of 100 microseconds per point.
Mobile WiMAX test system delivers high measurement throughput
Product News  
10/25/2007   Post a comment
Agilent Technologies and Fujitsu Microelectronics partner to deliver chipset test system for Mobile WiMAX with high measurement throughput.
Panel explores the expanded role of test in DFM
News & Analysis  
10/25/2007   Post a comment
What role does testing have in the design-for-manufacturing process? Plenty, according to a panel of experts from industry and academia at the International Test Conference.
Ultrawideband under the gun
Product News  
10/25/2007   Post a comment
In the race to a gigabit-per-second wireless link for the digital home, some ultrawideband backers are gasping for air while Wi-Fi proponents are revving up for the next lap.
ST takes fresh approach to MCU evaluation
Product News  
10/25/2007   Post a comment
ST has developed a self-contained, pre-programmed evaluation package for the recently-announced STM32 flash microcontroller family that provides both a fun introduction and serious development tools and links to an on-line development community.
TI fellow defines conditions and requirements for adaptive test at ITC
News & Analysis  
10/24/2007   Post a comment
In his address at the International Test Conference in Santa Clara, Calif., Ken Butler, TI fellow at Texas Instruments, said growth in portable applications calls for the adoption of adaptive test, and that these changes in test strategies require corresponding modifications to design-for-test (DFT) tools and automatic test equipment (ATE).
FPGA debugger works at full speed
Product News  
10/24/2007   Post a comment
EDA startup EDAptability has announced the availability of its FPGA and ASIC debugging tool TotalScope. With a combination of RTL level elaboration, model extraction and modification techniques with simulation, the tool offers unrivaled signal visibility, the company claims.
JTAG signal multiplexer offers secondary port autodetection
Product News  
10/23/2007   Post a comment
Maxim claims to introduce the industry's first MicroTCA-compliant JTAG multiplexer with 18 secondary and 3 master ports in a single chip.
Researchers propose new design technique
News & Analysis  
10/23/2007   Post a comment
Researchers from the Indian Institute of Technology together with another institute in Kolkata have proposed a layout-aware, coverage-driven technique for Illinois Scan Architecture used to cut test application time and test data volume in high-density circuits.
Search gets serious for CMOS replacement
News & Analysis  
10/22/2007   Post a comment
Semiconductors are on their last legs. At least that's the consensus of researchers who are looking for the next "big thing." What that thing will be is up for debate.
Converters enable four-port network analysis in W-band applications
News & Analysis  
10/22/2007   Post a comment
ZVA-Z110 mm-wave converters add the W-band frequency range of 75 GHz to 110 GHz to the high-end network analyzers from Rohde & Schwarz. This covers important frequency bands used in emerging vehicle distance radar applications (77 GHz) or aerospace and defense applications (94 GHz).
Large named new NRO director
News & Analysis  
10/19/2007   Post a comment
Intelligence veteran Scott Large has been named director of the National Reconnaissance Office, the Defense Department.
ITU includes WiMax in IMT-2000 wireless suite
News & Analysis  
10/19/2007   Post a comment
The International Telecommunications Union's Radiocommunication Sector will include WiMax in the IMT-2000 suite of wireless standards.
Automatic test pattern generation with on-chip compression improves test quality
Product News  
10/19/2007   Post a comment
Magma's advanced automatic test pattern generation (ATPG) products support simultaneous analysis of multiple fault models, leverage multi-threading and on-chip compression to improve test quality and reduce turnaround time and costs of nanometer ICs.
Updated: Four chip makers in China added to U.S. export list
News & Analysis  
10/19/2007   Post a comment
Four chip makers are among the five companies approved by the Commerce Department as "validated end-users" of U.S. technology exports to China, the agency said.
Japan wants more foreign investors
News & Analysis  
10/19/2007   Post a comment
In order to maintain an economic and technology leadership position, it's imperative to be aware and mindful of trends, developments and events shaping the global market. Silicon Valley is no longer the center of the universe. To that end, EE Times vice president and editorial director Richard Wallace recently conducted an email interview with Tadashi Izawa, the incoming president of JETRO (Japan External Trade Organization).
Microwave signal generator achieves fast switching
Product News  
10/18/2007   Post a comment
Anritsu Company has introduced the MG37020A fast-switching microwave signal generator that uses an advanced VCO-based hardware architecture to achieve a switching speed of 100 microseconds per point.
Test platform offers conformance testing of Ethernet OAM
Product News  
10/18/2007   Post a comment
Agilent has announced the availability of a single-platform solution for protocol emulation and conformance testing of Ethernet Operations, Administration and Maintenance (E-OAM).
RF module delivers testing of multi-port RF SoC devices
Product News  
10/18/2007   Post a comment
Advantest has introduced a RF test solution for low-cost testing of multi-port RF SoC devices used widely in cellular phones and other wireless products and equipment.
Oscilloscope PCI Express card records two channels at 200 MS/s
Product News  
10/18/2007   Post a comment
Strategic Test has introduced the UF2e-2031 oscilloscope PCI Express card that is suited for applications that require high-speed data acquisition and deep memory.
Signal generator delivers 100 microsecond switching speed over 10 MHz to 20 GHz
News & Analysis  
10/18/2007   Post a comment
The MG37020A fast-switching microwave signal generator, from Anritsu utilizes an advanced VCO-based hardware architecture to achieve best-in-class frequency switching speed.
1-GHz oscilloscopes deliver 5 GS/s sampling rate
Product News  
10/17/2007   Post a comment
LeCroy Corp. has introduced two M-Type 1-GHz oscilloscopes that bring LeCroy's large display/small footprint and 5 GS/s sampling rate to 1-GHz oscilloscopes.
Laptop manufacturer to build Vietnam plant
News & Analysis  
10/17/2007   Post a comment
Vietnam's nascent electronics industry scored another success earlier this month when Taiwanese laptop manufacturer Compal received the go-ahead to set up a $500 million factory in the country.
Cadence links up with Europe's research centers
News & Analysis  
10/17/2007   Post a comment
Cadence Design Systems' European unit is forming an academic network to promote the proliferation of advanced design technologies at European engineering universities.
Page 1 / 2   >   >>


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