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Content tagged with Test & Measurement Designline posted in October 2012
Tektronix boosts PCIe 3.0 Tx/Rx automation test
Product News  
10/26/2012   Post a comment
A new interference test set and other enhancements to Tektronix’ BERTScope bit-error-rate testers and PCI Express test software give silicon, host, and card designers a powerful automated transmitter/receiver compliance and debug platform for the PCI Express 3.0 bus standard.
Test laser diodes with dual-channel picoammeter/voltage source
Product News  
10/18/2012   Post a comment
Keithley's picoammeter provides two independent picoammeter/source channels in a 2U, half-rack enclosure, allowing simultaneous 6-1/2-digit measurements across both channels.
Mentor upgrades formal verification tools
News & Analysis  
10/17/2012   Post a comment
Mentor Graphics enhanced its Questa tools, automating functions to expand coverage and ease use of formal verification techniques in chip design.
Agilent DMM withstands extreme winter weather
Product News  
10/12/2012   Post a comment
A handheld digital multimeter with a 4.5-digit OLED display, the U1273AX from Agilent Technologies operates in temperatures as low as –40°C for maintenance and troubleshooting in cold winter weather.
RTD data logger is accurate to within ±0.05°C
Product News  
10/5/2012   Post a comment
Omega's compact data-logging module employs a 100-O platinum RTD sensing element for temperature measurement in the manufacturing lab, as well as R&D environments.


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Add USB Battery Charging Protocols to an Android-Based Design
Rajaram Regupathy, Cypress Semiconductor
Post a comment
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