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Content tagged with Test & Measurement Designline posted in November 2003
Racal adds GSM test cases to conformance platform
Product News  
11/24/2003   Post a comment
GSM test cases for a Racal Instruments Wireless Solutions' conformance test platform are validated by the Validation Competence Center of CETECOM. You now have a new single-souce conformance source.
GPS test set emulates realworld jamming
Product News  
11/24/2003   Post a comment
As embedded GPS proliferates in OEM products, the need for a test set that can emulate realworld jamming is increasingly important. This one from Noise/Com that fills the bill.
Multi-channel PC-hosted data recorder is USB-enabled
Product News  
11/21/2003   Post a comment
Here are some rack-mounted instruments that give you a way to implement data recording in a modular manner, with lots of signal processing to boot. That, plus USB, should make spell cost effectiveness.
Heard on the Beat: NPTest readies IPO
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11/21/2003   Post a comment
Advanced Test Equipment Can Shorten Time To Market For New Fiber Optic Communication Gear
News & Analysis  
11/21/2003   Post a comment
The recent battering of optical network and related stocks, along with those of other technology companies, belies the underlying fundamentals of the communications industry. In the face of financial turbulence and consolidations, the long-term outlook for optical networking remains positive. Capacity expansions for opto devices are being coupled with vigorous cost reduction efforts to help bring down component and system prices, which the industry recognizes as a necessity.
1-GHz bandwidth now an option on Gage PCI bus digitizers
Product News  
11/20/2003   Post a comment
Canadian instrument maker Gage Applied Technologies is debuting a 1-GHz bandwidth option for the company's most popular digitizer.
Rohde and Schwarz's latest RF test fixture packs integrated image processing
Product News  
11/19/2003   Post a comment
To simplify complicated test sequences when testing wireless modules or instruments with RF interfaces, European test-and-measurement mogul Rohde & Schwarz has a new RF test fixture. It includes image processing.
CD-ROM or paper: PXI guide's available
Product News  
11/19/2003   Post a comment
A new guide, in either CD-ROm or paper, showcases over fifty PXI products, including a 3U/6U "combo" chassis and what's billed as the industries fastest PXI controller.
Agilent Technologies demos PCI Express development tools
Product News  
11/19/2003   Post a comment
New additions to Agilent's PCI Express test, validation, and management products promise to help EEs bring PCI Express and other serial I/O technologies to market a lot faster.
Handheld RF spectrum analyzers take to the field
Product News  
11/18/2003   Post a comment
Focus-On: Battery powered and nomadic RF spectrum analyzers now give you spectral views in the field---at radio sites and even atop towers. Many of the latest portables also handshake with bench-bound PCs, too.
LabVIEW and data-acq hardware comes pre-installed on ruggedized portables
Product News  
11/13/2003   Post a comment
Data-acq and test-and-measurement vendor National Instruments rolls out its Measurement Ready Systems Partner Program. It's billed as a collaborative effort between NI and specialized computer vendors to create data acquisition systems built with NI LabVIEW software and NI data acquisition hardware.
USB Pod Captures/Generates Signals
Product News  
11/12/2003   Post a comment
The 480-Mbit/s speed of Universal Serial Bus v2.0 proves its worth in a diminutive multi-function test pod. Here's a quick and dirty way to leverage USB communications with a lab PC.
Agilent debuts first integrated WLAN tester
News & Analysis  
11/11/2003   Post a comment
Agilent Technologies Inc. has unveiled the world's first integrated test system for use in testing a wide range of wireless-local area networking (WLAN) protocols.
What about us?
News & Analysis  
11/7/2003   Post a comment
The consensus is that the chip-equipment industry will be flat in 2003, but the business will rebound and grow in 2004. One indicator is to see what's happening behind the scenes at two vendors--Applied Materials and Varian.
Value-added tax deemed anticompetitive by Semiconductor Industry Association
News & Analysis  
11/3/2003   Post a comment
A long-running battle between the United States and China, which strikes at the heart of massive semiconductor investment in Asia's largest market, is heating up once again. Parts Search

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What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.

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