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Content tagged with Test & Measurement Designline posted in November 2010
Intersil Li-ion battery manager IC ensures performance and safety
Product News  
11/30/2010   Post a comment
Device emphasizes accuracy, diagnostics, and robust communication.
Aeroflex IPO raises $232 million
News & Analysis  
11/22/2010   2 comments
Aeroflex Holding Corp. priced its initial public offering of 17,250,000 shares of common stock at a price to the public of $13.50 per share last week. The company granted the underwriters a 30-day option to purchase up to an additional 2,587,500 shares at a 6.25 percent discount.
Plessey signs to make 'disruptive' sensor
News & Analysis  
11/11/2010   7 comments
An electric potential sensor that promises to be highly disruptive in multiple markets is set to be manufactured and commercialized by Plessey Semiconductors Ltd.
Mentor and ARM link for memory test
News & Analysis  
11/3/2010   Post a comment
Mentor Graphics Corp. is working with ARM to provide an automated memory test and repair solution for ARM embedded memories and processor cores. Interoperability has been established between Mentor Graphics Corp.’s Tessent memory test and repair solution and ARM’s family of cores and embedded memory IP.


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As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.

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