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Content tagged with Test & Measurement Designline posted in February 2000
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Concerns raised over Japan tech programs
News & Analysis  
2/24/2000   Post a comment
The Semiconductor Industry Association is raising questions over the Japanese government's multimillion-dollar plan to fund research aimed at busting through fundamental chip technology barriers and reviving Japan's semiconductor industry. The moves could reopen some old wounds in U.S.-Japanese semiconductor trade relations.
Nozawa joins DSP Group in Japan
Product News  
2/24/2000   Post a comment
Partial cable, DTV agreement reached
News & Analysis  
2/23/2000   Post a comment
The cable industry and TV manufacturers have settled a lengthy dispute over digital TV-cable compatibility but must still resolve copy-protection issues or face a government review.
Bookham lands Kilby as director
Product News  
2/23/2000   Post a comment
SRAM standards should drive comms: vendors
News & Analysis  
2/16/2000   Post a comment
A pair of new SRAM standards will help increase sales into the booming communications markets, memory vendors said Wednesday (Feb. 16). JEDEC completed work on a standard packaging and pinout for multi-chip modules that include both SRAM and flash silicon, while a three-company consortium has developed a new, quad-data-rate SRAM design for networking applications.
PC industry group promotes serial interface
News & Analysis  
2/16/2000   Post a comment
The parallel interface ribbon cable, long an internal staple of PCs, may soon be a computing relic. A group of PC industry companies is pushing to develop an industry specification that would drop the parallel interface in favor of a serial design.
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Book Review: Controlling Radiated Emissions by Design
Martin Rowe
1 Comment
Controlling Radiated Emissions by Design, Third Edition, by Michel Mardiguian. Contributions by Donald L. Sweeney and Roger Swanberg. List price: $89.99 (e-book), $119 (hardcover).