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Content tagged with Test & Measurement Designline posted in February 2000
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Concerns raised over Japan tech programs
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2/24/2000   Post a comment
The Semiconductor Industry Association is raising questions over the Japanese government's multimillion-dollar plan to fund research aimed at busting through fundamental chip technology barriers and reviving Japan's semiconductor industry. The moves could reopen some old wounds in U.S.-Japanese semiconductor trade relations.
Nozawa joins DSP Group in Japan
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2/24/2000   Post a comment
Partial cable, DTV agreement reached
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2/23/2000   Post a comment
The cable industry and TV manufacturers have settled a lengthy dispute over digital TV-cable compatibility but must still resolve copy-protection issues or face a government review.
Bookham lands Kilby as director
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2/23/2000   Post a comment
SRAM standards should drive comms: vendors
News & Analysis  
2/16/2000   Post a comment
A pair of new SRAM standards will help increase sales into the booming communications markets, memory vendors said Wednesday (Feb. 16). JEDEC completed work on a standard packaging and pinout for multi-chip modules that include both SRAM and flash silicon, while a three-company consortium has developed a new, quad-data-rate SRAM design for networking applications.
PC industry group promotes serial interface
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2/16/2000   Post a comment
The parallel interface ribbon cable, long an internal staple of PCs, may soon be a computing relic. A group of PC industry companies is pushing to develop an industry specification that would drop the parallel interface in favor of a serial design.
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As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.

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