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Content tagged with Test & Measurement Designline posted in February 2000
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Concerns raised over Japan tech programs
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2/24/2000   Post a comment
The Semiconductor Industry Association is raising questions over the Japanese government's multimillion-dollar plan to fund research aimed at busting through fundamental chip technology barriers and reviving Japan's semiconductor industry. The moves could reopen some old wounds in U.S.-Japanese semiconductor trade relations.
Nozawa joins DSP Group in Japan
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2/24/2000   Post a comment
Partial cable, DTV agreement reached
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2/23/2000   Post a comment
The cable industry and TV manufacturers have settled a lengthy dispute over digital TV-cable compatibility but must still resolve copy-protection issues or face a government review.
Bookham lands Kilby as director
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2/23/2000   Post a comment
SRAM standards should drive comms: vendors
News & Analysis  
2/16/2000   Post a comment
A pair of new SRAM standards will help increase sales into the booming communications markets, memory vendors said Wednesday (Feb. 16). JEDEC completed work on a standard packaging and pinout for multi-chip modules that include both SRAM and flash silicon, while a three-company consortium has developed a new, quad-data-rate SRAM design for networking applications.
PC industry group promotes serial interface
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2/16/2000   Post a comment
The parallel interface ribbon cable, long an internal staple of PCs, may soon be a computing relic. A group of PC industry companies is pushing to develop an industry specification that would drop the parallel interface in favor of a serial design.
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What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.

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