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Content tagged with Test & Measurement Designline posted in February 2011
NI blows the lid off VSA performance in PXI form factor
Product News  
2/21/2011   Post a comment
Last week I sat down with a team from National Instruments, they had a new vector signal analyzer (VSA) in a PXI form factor to show me that offers industry-leading performance for automated test.
Spirent simplifies MIMO device testing with new software
Product News  
2/14/2011   1 comment
At Mobile World Congress, Spirent releases software to help predict user experiences with MIMO LTE devices.
Don't worry, be happy: Design, test, verification support for LTE-Advanced is here
Product News  
2/14/2011   Post a comment
World Mobile Congress is venue for array of LTE-Advanced products from Agilent
Agilent announces lineup for MWC
Product News  
2/8/2011   Post a comment
Agilent goes all out for 3G, 4G, LTE-Advanced testing demonstrations at Mobile World Congress in Barcelona, Feb 14-17.
TI OPA2320 operational amplifiers
Product News  
2/2/2011   Post a comment
TI expanded its 1.8-V precision operational amplifier portfolio with a new line of devices for low-noise, high-impedance sensor measurement.
Updated: Pictures from DesignCon 2011
News & Analysis  
2/2/2011   Post a comment
Here are a few images from DesignCon 2011, an event in Santa Clara, Calif., this week known for its focus on high-speed design.
It’s a mad, mad, electronics test world
News & Analysis  
2/1/2011   4 comments
The proliferation of wireless devices and the demand for low-cost and high-performance products are all part of global wireless traffic that is expected to grow to 600 Terabytes per month mostly consisting of audio and video streams by 2014, according to market reports.


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Rich Quinnell

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12 comments
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Book Review: Controlling Radiated Emissions by Design
Martin Rowe
1 Comment
Controlling Radiated Emissions by Design, Third Edition, by Michel Mardiguian. Contributions by Donald L. Sweeney and Roger Swanberg. List price: $89.99 (e-book), $119 (hardcover).