Truchard and Kodosky of NI: Enthusiasm undimmed News & Analysis 3/30/2012 1 comment Dr. James Truchard and Jeff Kodosky, two cofounders of National Instruments Corp. (Austin, Texas) honored with the lifetime achievement award at the UBM Electronics ACE awards on Tuesday (March 27), sat down with EE Times to discuss a 35-year progress since the formation of their company.
Software speeds cellular UE testing Product News 3/7/2012 Post a comment Agilent's N5972A interactive functional test software provides an automated and simplified interface for testing cellular user equipment in a controlled laboratory environment
Product Roundup: Mobile World Congress, part 2 Product News 3/2/2012 Post a comment Wish you had made it to Barcelona? Never fear, intrepid reporter Larry Desjardin (contributing editor for Test & Measurement World) was on the scene, covering the best and brightest test equipment on display at Mobile World Congress.
As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.
January 2016 Cartoon Caption ContestBob's punishment for missing his deadline was to be tied to his chair tantalizingly close to a disconnected cable, with one hand superglued to his desk and another to his chin, while the pages from his wall calendar were slowly torn away.122 comments