Truchard and Kodosky of NI: Enthusiasm undimmed News & Analysis 3/30/2012 1 comment Dr. James Truchard and Jeff Kodosky, two cofounders of National Instruments Corp. (Austin, Texas) honored with the lifetime achievement award at the UBM Electronics ACE awards on Tuesday (March 27), sat down with EE Times to discuss a 35-year progress since the formation of their company.
Software speeds cellular UE testing Product News 3/7/2012 Post a comment Agilent's N5972A interactive functional test software provides an automated and simplified interface for testing cellular user equipment in a controlled laboratory environment
Product Roundup: Mobile World Congress, part 2 Product News 3/2/2012 Post a comment Wish you had made it to Barcelona? Never fear, intrepid reporter Larry Desjardin (contributing editor for Test & Measurement World) was on the scene, covering the best and brightest test equipment on display at Mobile World Congress.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.