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Content tagged with Test & Measurement Designline posted in March 2012
Truchard and Kodosky of NI: Enthusiasm undimmed
News & Analysis  
3/30/2012   1 comment
Dr. James Truchard and Jeff Kodosky, two cofounders of National Instruments Corp. (Austin, Texas) honored with the lifetime achievement award at the UBM Electronics ACE awards on Tuesday (March 27), sat down with EE Times to discuss a 35-year progress since the formation of their company.
Agilent MIMO PXI vector signal analyzer offers 780 MHz analysis bandwidth
Product News  
3/27/2012   Post a comment
New multichannel solution claims full analysis of 802.11ac signals
CoreCommander, Autobuzz JTAG tools to debut at DESIGN show
Product News  
3/16/2012   Post a comment
JTAG Technologies, a vendor of test and debug tools based on boundary-scan, is launching CoreCommander at the DESIGN West conference and exhibition due to be held in San Jose, Calif., March 26 to 29.
Fluke handheld checks Ethernet connectivity
Product News  
3/14/2012   Post a comment
LinkRunnerAT has a profile function that enables custom test sets.
System verifies LTE location-based services
Product News  
3/14/2012   Post a comment
R&S platform performs standard and network-operator-specific LBS tests.
WLAN security and performance monitoring solution uses software sensor agent
Product News  
3/11/2012   Post a comment
Fluke Networks has released a new version of its premier WLAN security and performance monitoring solution, AirMagnet Enterprise, Version 10, which offers the industry's first software sensor agent, allowing customers to use both software and hardware sensors to optimize cost, deployment and security monitoring needs.
B&B Electronics Ulinx UHR401 and Ulinx UHR402 USB isolators
Product News  
3/9/2012   Post a comment
B&B Electronics' latest USB isolators are built to withstand industrial networking hazards like shock, drop, vibration, electromagnetic interference and temperature extremes.
Configurable analog front ends bridge NDIR gas, pH-sensing transducers and MCUs
Product News  
3/8/2012   Post a comment
Texas Instruments LMP91050 and LMP91200 AFEs provide critical interface functions and sensor management
Tek releases six new scopes
Product News  
3/7/2012   Post a comment
Optimized for cost-efficiency, Tektronix bench oscilloscopes target embedded, debug, and analysis
R&S radio communications tester expands LTE options
Product News  
3/7/2012   Post a comment
Platform tests signaling and audio quality of VoLTE-enabled user equipment.
Software speeds cellular UE testing
Product News  
3/7/2012   Post a comment
Agilent's N5972A interactive functional test software provides an automated and simplified interface for testing cellular user equipment in a controlled laboratory environment
Product Roundup: Mobile World Congress, part 2
Product News  
3/2/2012   Post a comment
Wish you had made it to Barcelona? Never fear, intrepid reporter Larry Desjardin (contributing editor for Test & Measurement World) was on the scene, covering the best and brightest test equipment on display at Mobile World Congress.


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In conjunction with unveiling of EE Times’ Silicon 60 list, journalist & Silicon 60 researcher Peter Clarke hosts a conversation on startups in the electronics industry. One of Silicon Valley's great contributions to the world has been the demonstration of how the application of entrepreneurship and venture capital to electronics and semiconductor hardware can create wealth with developments in semiconductors, displays, design automation, MEMS and across the breadth of hardware developments. But in recent years concerns have been raised that traditional venture capital has turned its back on hardware-related startups in favor of software and Internet applications and services. Panelists from incubators join Peter Clarke in debate.
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