Truchard and Kodosky of NI: Enthusiasm undimmed News & Analysis 3/30/2012 1 comment Dr. James Truchard and Jeff Kodosky, two cofounders of National Instruments Corp. (Austin, Texas) honored with the lifetime achievement award at the UBM Electronics ACE awards on Tuesday (March 27), sat down with EE Times to discuss a 35-year progress since the formation of their company.
Software speeds cellular UE testing Product News 3/7/2012 Post a comment Agilent's N5972A interactive functional test software provides an automated and simplified interface for testing cellular user equipment in a controlled laboratory environment
Product Roundup: Mobile World Congress, part 2 Product News 3/2/2012 Post a comment Wish you had made it to Barcelona? Never fear, intrepid reporter Larry Desjardin (contributing editor for Test & Measurement World) was on the scene, covering the best and brightest test equipment on display at Mobile World Congress.
In conjunction with unveiling of EE Times’ Silicon 60 list, journalist & Silicon 60 researcher Peter Clarke hosts a conversation on startups in the electronics industry. One of Silicon Valley's great contributions to the world has been the demonstration of how the application of entrepreneurship and venture capital to electronics and semiconductor hardware can create wealth with developments in semiconductors, displays, design automation, MEMS and across the breadth of hardware developments. But in recent years concerns have been raised that traditional venture capital has turned its back on hardware-related startups in favor of software and Internet applications and services. Panelists from incubators join Peter Clarke in debate.