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Content tagged with Test & Measurement Designline posted in April 2012
Innovative IC can't trap lightning, but can let you know it's coming
Product News  
4/30/2012   10 comments
Austriamicrosystems AS3935 Franklin Lightning Sensor IC senses approach via analog circuitry plus waveform-analysis algorithms
Gore starts business, develops tests for portable electronics
News & Analysis  
4/30/2012   1 comment
Gore has created a new business unit, Gore Portable Electronic Vents, to concentrate on solutions to protect portable devices from water, dust and dirt ingress while maintaining the integrity of sound transmission.
Standards effort seeks to put a charge in EV deployment
News & Analysis  
4/25/2012   9 comments
The American National Standards Institute is driving an effort to develop technical specs for electric vehicle technology and related efforts like battery development and an interoperable charging infrastructure.
Agilent PC software analyzes scope captures
Product News  
4/25/2012   Post a comment
The application supports a variety of popular waveform formats.
CISC's test system checks RFID tag performance
Product News  
4/25/2012   Post a comment
The unit comes with measurement software and a reference tag for self-calibration.
LeCroy regains oscilloscope bandwidth lead
Product News  
4/24/2012   1 comment
At 65 GHz, the Labmaster 10Zi is the world's highest-bandwidth oscilloscope
NI releases apps for LabView, CompactDAQ hardware
Product News  
4/17/2012   Post a comment
National Instruments has released several mobile apps that are compatible with LabView software and NI hardware.
MIMO channel emulator tackles complex testbeds
Product News  
4/17/2012   Post a comment
Azimuth Systems has launched the ACE MX2 MIMO channel emulator.
Flying-lead probe aids PCIe 3.0 protocol analysis
Product News  
4/17/2012   Post a comment
Intended for use with the Agilent U4301A PCIe 3.0 protocol-analyzer module, the U4324A flying-lead solder-down probe captures 8.0-GT/s (gigatransfer per second) traces from the DUT.
TriQuint and U.S. military team up on gallium nitride ICs
News & Analysis  
4/16/2012   15 comments
TriQuint Semiconductor will work with the U.S. Army Research Laboratory to develop high-frequency and mixed signal integrated circuits based on gallium nitride technology.
Nvidia calls for move to 450mm wafers
News & Analysis  
4/12/2012   6 comments
A top Nvidia engineer called for a move to 450mm wafers as one part of the solution to the growing complexity, cost and time-to-market challenges in chip design.
Real-time scope punches to 63-GHz true analog bandwidth, on two channels
Product News  
4/11/2012   Post a comment
Agilent Infiniium 90000 Q-Series also hits 33 GHz on four channels
Agilent Infiniium oscilloscope reaches 63-GHz-bandwidth
Product News  
4/11/2012   Post a comment
Examines Agilent's 63-GHz-bandwidth real-time-sampling DSO as it compares to other high-performance scopes available today.
Digital pressure sensors boast high resolution, accuracy
Product News  
4/11/2012   Post a comment
Customization includes pressure ranges, sensor interface, and communication protocol.
Apps ease test and measurement tasks on all levels
News & Analysis  
4/11/2012   2 comments
Testing has become a world of applications one can access and use from fixed and mobile devices to control the testing environment in both large enterprise settings as well as in local engineering labs.
Dual power booster adds serious muscle to op amp outputs
Product News  
4/9/2012   Post a comment
Cirrus Logic/Apex PB63 two-channel amp drives semiconductor, flat-panel test, motors up to ±75V/2A
Two-wire Hall sensors target body electronics
Product News  
4/6/2012   4 comments
Melexis switch & latch Hall effect sensors designed for rugged automotive, industrial, and consumer applications.
National security threat: hacking the smart grid
News & Analysis  
4/5/2012   4 comments
The nation’s smart grid is constantly under threat of real attack and potentially no amount of investment in securing it will help, according to a white hat security expert.
Tektronix delivers test solution for Thunderbolt physical layer electrical validation
Product News  
4/5/2012   Post a comment
Tektronix, Inc. has announced a comprehensive test solution for Thunderbolt technology, a new, high-speed, multi-protocol I/O technology designed to provide headroom for next generation display and I/O requirements. 
LeCroy rolls out WaveStation generator line
Product News  
4/4/2012   1 comment
The instrument's color display lets you view waveform shape, along with various parameters.
MEMS in sport gains speed
News & Analysis  
4/3/2012   6 comments
With sensors becoming ever smaller and less expensive, full-body motion-tracking systems are becoming increasingly available, demystifying sporting success and putting computer measurable science into physical training.

Autonomous vehicles on our roads soon? What could go wrong with that? Listen in as EE Times' Junko Yoshida asks industry experts what the intended and unintended consequences will be.
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