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Content tagged with Test & Measurement Designline posted in July 2003
Shakeout looms for IC test houses, says ASE exec
News & Analysis  
7/31/2003   Post a comment
In the 1980s and 1990s, a slew of companies took a page out of the silicon foundry business model and created the so-called chip-testing outsourcing industry.
Keithley cuts staff amid losses, sales drop
News & Analysis  
7/30/2003   Post a comment
Instrument and IC-test provider Keithley Instruments Inc. laid off a "small percentage" of its workforce amid losses and a drop in sales.
Credence, FEI roll out products at Semicon
News & Analysis  
7/17/2003   Post a comment
Credence Systems Corp. (Fremont, Calif.) and FEI Company (Hillsboro, Ore.), two key vendors of tools that allow engineers to debug directly on silicon, unveiled new products and acquisition this week that could help design teams coping with leading-edge ICs.
Korean firms discuss chipmaking in Brunei, says report
News & Analysis  
7/17/2003   Post a comment
South Korean companies have started discussions on the creation of a chip manufacturing center in the Islamic state of Brunei, according to a report from Brunei Direct website.
Intel-Advantest ATE consortium releases new specs
News & Analysis  
7/16/2003   Post a comment
The Semiconductor Test Consortium Inc. (STC) today (July 16) released the second draft of its specifications for an open IC test architecture and has set up a support center in Santa Clara, Calif.
Electroglas sells DFM software line FEI
News & Analysis  
7/15/2003   Post a comment
Electroglas Inc., a supplier of wafer probing and test handling solutions, today (July 15) announced that it has sold its design-for-manufacturing (DFM) software to FEI Co. for $6 million in cash plus the assumption of certain liabilities.
How to Make Diagnostic Software More Reusable
News & Analysis  
7/15/2003   Post a comment
The fastest way to market is to reuse software that is already written, tested, and documented. The more "hardware intimate" the software, the harder it is to reuse it on a different system or platform. This has always been the case for diagnostic software, whose responsibility it is to verify the proper operation of the hardware. It would seem that reusing diagnostic software is difficult, if not impossible. However, with a few rules and some disciplined programming, you can make diagnostics th
NPTest to become more nimble under new owners
News & Analysis  
7/14/2003   Post a comment
Closing a long--and sometimes cloudy chapter--with Schlumberger Ltd., IC-test pioneer NPTest Inc. will shortly have a new owner that is expected to reinvigorate the company and make it more nimble, according to executives.
NPTest debuts open and modular tester
News & Analysis  
7/14/2003   Post a comment
NPTest Inc. will take the Semicon West trade show today (July 14) to roll out an "open" and modular IC tester that promises to lower the cost of semiconductor test by a factor of two.
How to Reduce Digitizing Oscilloscope Delta-Time Errors
News & Analysis  
7/12/2003   Post a comment
Making accurate delta-time measurements can be difficult, especially when trying to measure jitter. To ensure accuracy, you need to understand the various types of delta-time measurements, as well as the sources of errors. Here's a primer on what to look for.
Credence denies it is negotiating to buy NPTest
News & Analysis  
7/7/2003   Post a comment
Credence Systems Corp. said Monday (July 7, 2007) that, despite published reports to the contrary, it is not negotiating with either Schlumberger Limited or Francisco Partners and Shah Management to acquire NPTest Inc. (see June 27 story).


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6 comments
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1 Comment
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5 comments
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Rich Quinnell
16 comments
As every developer knows, there are the paper specifications for a product design, and then there are the real requirements. The paper specs are dry, bland, and rigidly numeric, making ...

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