Credence, FEI roll out products at Semicon News & Analysis 7/17/2003 Post a comment Credence Systems Corp. (Fremont, Calif.) and FEI Company (Hillsboro, Ore.), two key vendors of tools that allow engineers to debug directly on silicon, unveiled new products and acquisition this week that could help design teams coping with leading-edge ICs.
Electroglas sells DFM software line FEI News & Analysis 7/15/2003 Post a comment Electroglas Inc., a supplier of wafer probing and test handling solutions, today (July 15) announced that it has sold its design-for-manufacturing (DFM) software to FEI Co. for $6 million in cash plus the assumption of certain liabilities.
How to Make Diagnostic Software More Reusable News & Analysis 7/15/2003 Post a comment The fastest way to market is to reuse software that is already written, tested, and documented. The more "hardware intimate" the software, the harder it is to reuse it on a different system or platform. This has always been the case for diagnostic software, whose responsibility it is to verify the proper operation of the hardware. It would seem that reusing diagnostic software is difficult, if not impossible. However, with a few rules and some disciplined programming, you can make diagnostics th
NPTest to become more nimble under new owners News & Analysis 7/14/2003 Post a comment Closing a long--and sometimes cloudy chapter--with Schlumberger Ltd., IC-test pioneer NPTest Inc. will shortly have a new owner that is expected to reinvigorate the company and make it more nimble, according to executives.
NPTest debuts open and modular tester News & Analysis 7/14/2003 Post a comment NPTest Inc. will take the Semicon West trade show today (July 14) to roll out an "open" and modular IC tester that promises to lower the cost of semiconductor test by a factor of two.
How to Reduce Digitizing Oscilloscope Delta-Time Errors News & Analysis 7/12/2003 Post a comment Making accurate delta-time measurements can be difficult, especially when trying to measure jitter. To ensure accuracy, you need to understand the various types of delta-time measurements, as well as the sources of errors. Here's a primer on what to look for.
A Book For All Reasons Bernard Cole1 Comment Robert Oshana's recent book "Software Engineering for Embedded Systems (Newnes/Elsevier)," written and edited with Mark Kraeling, is a 'book for all reasons.' At almost 1,200 pages, it ...