Fast parametric measurement-unit chips have small footprints Product News 7/27/2005 Post a comment Expanding an existing line of standards-based per-pin parametric measurement unit ICs, chip maker Semtech is dishing up a family of three PPMU devices. They're claimed to have extremely fast settling times and the smallest form-factors for 40-mA devices. The use of BiCMOS also permits them to accommodate a 16.25-V range.
Ethernet board supports GigE Vision realtime imaging standard Product News 7/27/2005 Post a comment An off-the-shelf OEM board can add GigE connectivity to industrial machine-vision and consumer cameras. The Pleora iPORT PT1000-VB In-Camera Engine lets you integrate high-performance GigE connectivity into almost any camera simply by changing out the back-end interface electronics. eeProductCenter Senior Tech Editor Alex Mendelsohn reports.
PC/104 board runs eight simultaneous A/D channels Product News 7/25/2005 Post a comment Check out this less-than-$1000 analog/digital plug-in board. Operating at 100-ksample/s/channel rates, this PC/104 form-factor plug-in touts simultaneous channel sampling, a capability that's usually found only on more costly cards.
Pattern/pulse stimulus generator spans 150-MHz to 7-GHz Product News 7/25/2005 Post a comment If you're adopting a leading-edge serial transmission technology such as Fiber Channel or PCI Express, or designing a microwave RF deck, characterizing your hardware at speeds between 4-GHz and 6-GHz can be a daunting task. That's where Agilent Technologies's new pulse-pattern generator comes in. It's a memory-based instrument that can be used from 150-MHz all the way up to 7-GHz.
Triple-play network test gear addresses voice, video, data Product News 7/21/2005 Post a comment Here's news of four test-and-management approaches that address the convergence of voice, video, and data. These so-called triple-play tools are slated to assist service providers, network equipment manufacturers, and cable providers to ensure performance and reliability of next-generation networks.
Powerful final-test memory system debuts Product News 7/21/2005 Post a comment Automatic test equipment maker Agilent Technologies now has a new final-test memory tester targeting multi-chip packages and discrete flash. Dubbed the Versatest Series Model V5500, this ATE system offers a tester-per-site architecture.
Testers handle various A-GPS wireless location-based services Product News 7/19/2005 Post a comment Instrumentation conglomerate Aeroflex is rolling out test capability to address the emerging development and conformance test requirements of Assisted-GPS. A-GPS is the heart of location-based services for cellphones. Aeroflex's systems are intended to test A-GPS systems in the lab.
Compact converters put logic on fiber Product News 7/19/2005 Post a comment Test-and-measurement house Highland Technology now has both electrical-to-optical and optical-to-electrical converters that are compatible with the company's digital delay/pulse generator and other VME-packaged electrical/optical converter products. Use these to transmit error-free data over long distances using fiber.
HP cuts 14,500 workers News & Analysis 7/19/2005 Post a comment Hewlett-Packard Co. said it will lay off 14,500 workers over the next 18 months, or about 10 percent of its workforce.
Motorola opens R&D centers in Bangalore, Taipei News & Analysis 7/13/2005 Post a comment Motorola Inc. has opened research and design centers in Bangalore and Taipei, both focused on developing solutions for seamless mobility in telecom switching, embedded communications, broadband and ultra wideband wireless.
IBM to offer CMOS image sensor foundry services Product News 7/13/2005 Post a comment IBM Corp. has announced it would make available technology and manufacturing services for complementary metal oxide semiconductor (CMOS) image sensors for use in camera-phones, digital still cameras and other consumer products.
Keithley makes book on test techniques Product News 7/12/2005 Post a comment Keithley Instruments' new 140-page handbook, "Overcoming the Measurement Challenges of Advanced Semiconductor Technologies: DC, Pulsed, and RF—From Modeling to Manufacturing" describes emerging measurement challenges for semiconductor manufacturers as they move into the 65 nm technology node and beyond.
Semizone s’allie à l’IMEC pour développer l’enseignement en ligne News & Analysis 7/12/2005 Post a comment L’IMEC vient de conclure un partenariat stratégique avec Semizone Inc. afin de proposer des supports de formation et d’enseignement en ligne pour les concepteurs d’ASIC et de systèmes sur puce, les ingénieurs et les techniciens travaillant dans le domaine de la fabrication de semi-conducteurs.
Honeywell invests in Albany Nanotech News & Analysis 7/11/2005 Post a comment Honeywell Electronic Materials will invest at least $5 million during the next five years into laboratory equipment and research activities at Albany NanoTech, as well as locate laboratories and researchers at the center to work on next generation materials for the semiconductor industry
Federal court reverses California court decision on SanDisk patent suit News & Analysis 7/11/2005 Post a comment 151 SanDisk Corp. has announced that the U.S Court of Appeals for the Federal Court has reversed a summary judgement by a California District Court regarding SanDisk's '987 memory card patent, thus renewing the memory disk supplier's almost four-year old patent infringement suit against Ritec, Pretec, and Memorex.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.