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Content tagged with Test & Measurement Designline posted in July 2013
Japan to Form Power Device Initiative
News & Analysis  
7/31/2013   11 comments
Unlike the CE market, there are no established testing procedures for power devices used in vehicles or other high-voltage, high-current infrastructure equipment. It could result in life and death issues, warned an Advantest executive.
Questions On EMC Pre-Compliance Testing for Radiated Emissions
News & Analysis  
7/31/2013   5 comments
Answers to questions on how to perform pre-compliance testing for radiated emissions.
Cut ADC Skewing Errors
News & Analysis  
7/30/2013   4 comments
A digital-signal-processing technique can remove unwanted frequencies from interleaved sampled signals.
Asset Tackles System Debug
News & Analysis  
7/29/2013   1 comment
How fast can you bring up design prototypes and get them into manufacturing?
LeCroy Reignites Scope Wars With 100GHz Oscilloscope
News & Analysis  
7/25/2013   10 comments
Teledyne LeCroy has raised the bar by demonstrating a 100GHz prototype scope for high-speed measurements.
Plugfest Pulls G.Vector Suppliers Together
News & Analysis  
7/25/2013   4 comments
The UNH-IOL gathering gives VDSL2 product makers a chance to test interoperability.
Scoping out the Latest in Oscilloscopes
News & Analysis  
7/24/2013   8 comments
The current crop of scopes offers more channels, flexible resolution, and ultra-broad bandwidth.
What Is DLNA?
News & Analysis  
7/22/2013   4 comments
If you are interested in wireless home networking, then DLNA compliance is important. Find out what you need to “know before you go” to test.
T&M Turns to Open-Source, Kickstarter
News & Analysis  
7/22/2013   26 comments
A test-and-measurement startup is launching the open-source Red Pitaya project and credit-card-sized instrument board on its crowdfunding site.
Test USB 3.0 Compliance
News & Analysis  
7/18/2013   9 comments
Also known as SuperSpeed USB, USB 3.0 from the USB-IF (USB Implementer’s Forum) brings a 5 Gb/s signaling rate to USB, which is a 10X increase in performance from Hi-Speed USB. But how do you test it?
SRC, Intel Shrink Environmental Footprint of Chip Building
News & Analysis  
7/16/2013   6 comments
Intel and Semiconductor Research Corp. have developed a semiconductor gas distribution system purging algorithm that cuts ultra-high purity gas usage 20-percent and the time required to purge by 30 percent, thus cutting costs while improving throughput.
Mobile Interconnect Standards on the Move
News & Analysis  
7/15/2013   4 comments
The PCIe SIG announces its work on the Mobile PCIe specification and how it relates to the MIPI Alliance’s M-PHY physical layer.
Did Upside-Down Sensors Cause Rocket Crash?
News & Analysis  
7/10/2013   36 comments
A spectacular rocket crash might be due to a backward connector.
Fab Tool Market Expected to Contract Again
News & Analysis  
7/9/2013   10 comments
The semiconductor processing equipment is projected to contract for the second straight year, but rebound in a big way in 2014, according to the SEMI trade group.
For Durability Testing, Ford Turns to Robots
News & Analysis  
7/1/2013   12 comments
Automotive companies are known as pioneers in robotic technologies. They’ve honed their robotic skills to improve their production lines. Now robots are going to work as test drivers, says Ford.
Troubleshooting at the Network Edge
News & Analysis  
7/1/2013   1 comment
The rise of bring-your-own-devices (BYOD) and the ubiquitous nature of WiFi has led to an entirely new set of problems and challenges at the network edge.
Power Analyzers Optimize New Electric Motor Designs for Electric Vehicles
News & Analysis  
7/1/2013   1 comment
Yokogawa power analyzers are playing a key part in tests designed to optimize the efficiency of a new generation of motors for electric vehicles being developed by German drives specialist FEAAM.


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