Instrumentation vendors rally around open ATE News & Analysis 9/9/2003 Post a comment Leading suppliers of instruments for IC test have unveiled plans to support an emerging open standard for automatic test equipment (ATE).
GuideTech, Roos Instruments and Wavecrest are working to develop third-party instruments for the open ATE architecture devised by the Semiconductor Test Consortium Inc. Mark LaPedus reports.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.