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Content tagged with Test & Measurement Designline posted in September 2003
Switcher series aims at low-power apps
Product News  
9/25/2003   Post a comment
Astrodyne's OFM/M series switching power supplies meet the space and performance requirements of low-power medical and dental instrumentation.
Less-costly Lecroy scopes court popular 350-MHz to 2-GHz range
Product News  
9/25/2003   Post a comment
Lecroy Corp., which is known for its high-end digital oscilloscopes, is moving down the price chain with the release of the WaveRunner 6000 series of scopes.
Instrumentation vendors rally around open ATE
News & Analysis  
9/9/2003   Post a comment
Leading suppliers of instruments for IC test have unveiled plans to support an emerging open standard for automatic test equipment (ATE). GuideTech, Roos Instruments and Wavecrest are working to develop third-party instruments for the open ATE architecture devised by the Semiconductor Test Consortium Inc. Mark LaPedus reports.


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As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.

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