Garbage in / garbage out: Input filters enhance A/D converter measurements News & Analysis 11/27/2002 Post a comment Analog-to-Digital Converters (A/D converters) are capable of quite impressive noise and distortion performance. However, even the best signal generators and synthesizers produce signals that are not spectrally pure enough to evaluate noise and distortion performance of A/D converters. A National apps guy reminds us that even the best test set ups can benefit from an input filter.
Differential Hall-effect sensors aid rotational speed control News & Analysis 11/27/2002 Post a comment The rotational speed of motors with gear teeth can be precisely monitored and controlled with new-generation Hall-effect sensors. BiCMOS technology provides devices with high-sensitivity and speed, and yet small enough to fit inside motor housings or other tight spaces. Allegro's ace applications engineer explains their principles of operation, and provides a guideline for analog signal conditioning.
Diving into the 802.11i Spec: A Tutorial News & Analysis 11/26/2002 Post a comment The 802.11i specification will play a big role in improving the overall security capabilities of current and future WLAN networks. Here's a look at the key technical ingredients of this draft specification.
COT: post design considerations News & Analysis 11/25/2002 Post a comment The proliferation of libraries and intellectual property (IP) in the customer-owned tooling (COT) world has lowered the barrier of entry for those interested in moving to a COT design flow.
Microcontrollers/Microprocessors Out in Force at Embedded Systems News & Analysis 11/15/2002 Post a comment The East and West Coast Embedded Systems Conferences are always great shows for learning about the latest and greatest embedded software and hardware products. TechOnLine's Jim Lipman discusses some of the more interesting recently announced microprocessor, microcontroller, and silicon cores, several which will be featured at the upcoming show.
From wall plug to nano circuit: power chips go hand-in-hand with SoC technology News & Analysis 11/14/2002 Post a comment The conversion from bus voltage to final nanoscale load often requires low voltages at hundreds of Amperes, says this prolific Fairchild product planner. The key to efficiency, he writes in the November 18th issue of Planet Analog magazine, may have a lot to do with power factor correction... Reno Rosetti also authored an online guest column (an opinion piece) on the prospects for putting power management under digital control.
Stabilizing voltage mode converters with ceramic output capacitors News & Analysis 11/14/2002 Post a comment Power supply designers have a variety of choices available when selecting output filter capacitors. This selection is typically steered by the initial design goals, whether it is lowest cost, smallest size, lowest ripple voltage, or transient load response. These Texas Instruments engineers say there's a lot of mileage to be gained from ceramics, like small size and low cost. Just watch that ESR, they advise.
Stabilizing buck converters with transconductance amplifiers News & Analysis 11/14/2002 Post a comment Synchronous buck converters have received great attention in low power, low voltage DC-DC converter applications due to their high efficiency. In this application note, International Rectifier engineers show how to stabilize buck converters using as transductance device as the error amplifier in the voltage regulation circuit. A transconductance amplifier, they point out, multiplies the difference of input voltage with a certain gain to generate a current into the output node. These guys offer t
Commercialization Issues of MEMS/MST/Micromachines: An Updated Industry Report Card Product News 11/13/2002 1 comment Like virtually all other electronic-industry segments, microelectromechanical Systems (MEMS) did not escape the economic slowdown of 2002. Roger Grace, President of Roger Grace Associates, presents a "report card" on the MEMS industry, comparing where it is now versus 2001, and explains the reasons certain MEMS parameters received the grades they did.