Why you need RTL virtual prototyping News & Analysis 3/28/2003 Post a comment Cadence Design Systems' Suk Lee traces the evolution of silicon virtual prototyping, and proposes a "continuous convergence" methodology for solving timing closure problems.
Simple techniques for making verification reusable News & Analysis 3/21/2003 Post a comment Peter Spyra, verification engineer at design services startup Integre Technologies, describes a number of techniques for verification reuse with Verisity's "e" language in this detailed tutorial. An accompanying article provides code examples.
Mobile generation needs FRAM News & Analysis 3/17/2003 Post a comment In the late 1990s, after more than a decade of ferroelectric-memory development, several companies succeeded in the high-volume production of low-density (less than 1-Mbit) ferroelectric RAM.
What designers need to know about structural test News & Analysis 3/6/2003 Post a comment As functional testing becomes impractical, structural IC test becomes crucial, says Credence's Marc Loranger (right). In this tutorial, he shows you why, and details the EDA software and ATE hardware that's needed to support it.
Fault coverage founders on speed News & Analysis 3/3/2003 Post a comment Regardless of the test methodology employed, the goal of manufacturing test is to identify, or screen out, defective devices before they are embedded into a system or shipped to the end customer.
Battle-hardened veterans of the electronics industry have heard of the “connected car” so often that they assume it’s a done deal. But do we really know what it takes to get a car connected and what its future entails? Join EE Times editor Junko Yoshida as she moderates a panel of movers and shakers in the connected car business. Executives from Cisco, Siemens and NXP will share ideas, plans and hopes for connected cars and their future. After the first 30 minutes of the radio show, our listeners will have the opportunity to ask questions via live online chat.