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Content tagged with Test & Measurement
posted in January 2008
Agilent unveils DDR2, DDR3 BGA probes for scopes, analyzers
Product News  
1/31/2008   Post a comment
Agilent Technologies claims the industry's first DDR2 and DDR3 ball-grid array (BGA) probes for oscilloscopes and logic analyzers.
Rohde & Schwarz signal generator upgrade tackles CDMA 1xEVDO
Product News  
1/31/2008   Post a comment
In the downlink, data rates are selectable along with rate index and packet size, traffic content can be defined, and a matrix allows flexible testing of reverse power control.
DDR3 clock reference board reaches 800-MHz
Product News  
1/31/2008   Post a comment
Designed specifically for high performance testing, the DDR3 clock reference board from Inphi Corp. enables comprehensive validation of DDR3 RDIMMs and registers.
Test instrument delivers pulse and noise generation
Product News  
1/30/2008   Post a comment
Agilent Technologies claims to introduce the industry's first pulse function arbitrary noise generator, which is said to provide superior signal quality combined with versatile waveforms for general-purpose bench tests or advanced serial data stress tests.
Test your distortion hearing ability
Audio DesignLine Blog  
1/30/2008   Post a comment
Test your ability to detect nonlinear distortion for different music signals and loudspeaker types with this online interactive listening test.
Dual-axis gyroscopes tout small size
Product News  
1/30/2008   Post a comment
InvenSense has introduced the IDG-1100 family of dual-axis gyroscopes, measuring 4 x 5 x 1.2 mm.
Microwave spectrum analyzers lower the cost of wireless system testing
Product News  
1/25/2008   Post a comment
Anritsu Company has enhanced its MS271xB family of economy microwave spectrum analyzers with specialized demodulation hardware and pre-written test routines for six popular wireless system configurations.
Anritsu adds specialized demodulation hardware to its economy microwave spectrum analyzers
Product News  
1/25/2008   Post a comment
Thirteen options are available for the MS271xB family as software test programs with pre-written test routines cover RF measurement and demodulation.
Measuring HD performance with Tektronix' Picture Quality Analyser and other tools
Design How-To  
1/25/2008   Post a comment
While the quality of analog and full-bandwidth digital video can be characterised indirectly by measuring the distortions of static test signals, compressed television systems pose a far more difficult challenge. Picture quality in a compressed system can change dynamically based on a combination of data rate, picture complexity, and the encoding algorithm employed.
Handheld laser meter delivers ease of use
Product News  
1/24/2008   Post a comment
Ophir-Spiricon has introduced an advanced handheld laser meter with a brilliant color display for laser beam measurement.
Multichannel analyzer simplifies audio test automation
Product News  
1/24/2008   Post a comment
Audio Precision has added a new digital I/O module and new functionality for simplifying audio test automation to its APx500 series of multichannel audio analyzers.
Test platform supports all UMTS bands
Product News  
1/24/2008   Post a comment
Anritsu Company has added test functions for W-CDMA mobile terminal UMTS bands XI and III to its ME7873F performance test system.
IFT software delivers real-world stress test for cellular phones
Product News  
1/24/2008   Post a comment
Agilent Technologies has introduced new interactive functional test (IFT) software for its 8960 Series 10 (E5515C) wireless communications test set.
Temperature measurement instrument provides RTD inputs
Product News  
1/23/2008   Post a comment
Data Translation has released the DT9872, a RTD version of the TEMPpoint temperature measurement instrument product line, in a compact, rugged 2U rack-mountable enclosure.
Compact LAN oscilloscope delivers benchtop performance, high-channel density
Product News  
1/21/2008   Post a comment
ZTEC's compact ZT4610 1-GHz LAN oscilloscopes offer benchtop performance and high-channel density for ATE, aerospace and defense, and embedded applications.
IC-based scope function redefines system integrity analysis
Product News  
1/21/2008   Post a comment
Vitesse Semiconductor claims its advanced high-speed IC-based oscilloscope function will significantly change the economics of signal integrity analysis and network reliability.
PIN diode switch delivers greater-than 80 dB isolation
Product News  
1/21/2008   Post a comment
Agilent Technologies has introduced a family of coaxial solid-state PIN diode switches that includes single-pole double-throw (SPDT), single-pole four-throw (SP4T) and transfer switch models.
Optical analyzers extend reach
Design How-To  
1/21/2008   Post a comment
No radio engineer would think of doing without a spectrum analyzer, but developers working in the electromagnetic spectrum's optical range have had little choice.
TREK : ESD event detector helps protect sensitive processes
Product News  
1/21/2008   Post a comment
The TREK Model 900 ESD Event Detector is a diagnostic tool for manufacturing environments that are sensitive to electrostatic discharge (ESD), including electronic, semiconductor & medical device manufacturing and assembly.
SIGNAL CHAIN BASIC Series (Part 6): Op Amp Input Voltage Offset
Design How-To  
1/19/2008   Post a comment
The SIGNAL CHAIN BASICS series continues with this introduction to Input Voltage Offset, a key op amp parameter
Optical power meter delivers fast testing of multiport devices
Product News  
1/16/2008   Post a comment
Agilent's optical power meter enables fast measurement of all multiport devices including multiplexers, PON splitters, wavelength switches and ROADMs, delivering increased throughput and higher operational efficiency.
Tampa Microwave expands simulator product line
Product News  
1/16/2008   Post a comment
Tampa Microwave has added three models to its satellite simulator product family.
JDSU delivers structured cabling test products
Product News  
1/14/2008   Post a comment
JDSU will unveil several new task-ready tools for network and enterprise test including the LanScaperPRO network tester, TestifierPRO cable tester and fiber-optic test kits at the Winter BICSI Conference 2008.
Rohde & Schwarz's signal generators meet all broadcast requirements
Product News  
1/14/2008   Post a comment
The same look and feel of each instrument's user interface makes it easy to switch between the the R&S SFE100, R&S SFE, and R&S SFU.
Oscilloscopes add FlexRay measurement application
Product News  
1/11/2008   Post a comment
Agilent Technologies has added a measurement application that provides FlexRay triggering, protocol decode, debug and eye-diagram analysis capabilities for its Infiniium series oscilloscopes.
Vector signal analysis software offers increased data measurement accuracy
Product News  
1/11/2008   Post a comment
Agilent has upgraded its 89600 Series vector signal analysis (VSA) software to interface with its Acqiris 10-bit and 12-bit CompactPCI broadband digitizers.
RF power meter combines measurement accuracy with small size
Product News  
1/11/2008   Post a comment
National Instruments has introduced the company's first USB-controlled true RMS RF power meter for automated test, measurement and monitoring applications in a small footprint.
Fiber inspection probe delivers improved fault-detection rate
Product News  
1/11/2008   Post a comment
EXFO Electro-Optical Engineering Inc. has launched its FIP-400 fiber inspection probe for all types of field network architectures.
Test platform performs DSL and triple-play service verification
Product News  
1/11/2008   Post a comment
EXFO Electro-Optical Engineering has released a copper test module for the AXS-200 SharpTESTER platform, which tests the full 30-MHz VDSL2 spectrum over copper access networks.
Semiconductor characterization software adds parallel test, parametric die sort features
Product News  
1/11/2008   Post a comment
Keithley Instruments has announced the availability of its Automated Characterization Suite (ACS) V3.2 software for semiconductor test and characterization at the device, wafer, and cassette level.
Mentor Graphics expands JTAG debug probe support
Product News  
1/11/2008   Post a comment
Designed for a multicore environment, the MAJIC series probes provide JTAG connection to the debug support unit designed into each OCTEON Plus cnMIPS core.
Agilent to introduce 3GPP LTE test solutions
Product News  
1/10/2008   Post a comment
Agilent Technologies will introduce new solutions for 3GPP Long Term Evolution (LTE) at the 2008 Mobile World Congress.
Test tools address powerline network performance issues
Product News  
1/9/2008   Post a comment
Asoka USA has introduced two network test tools at the Consumer Electronics Show (CES) that are designed to identify and assess powerline network performance issues.
Avoiding noise and EMI problems in DSP systems
Design How-To  
1/7/2008   Post a comment
Noise and EMI can disrupt the operation of a DSP system or cause the design to fail FCC certification. Here's how to avoid these problems with PCB layout and return path decoupling.
SIGNAL CHAIN BASICS Series (Part 5): Introduction to the Instrumentation Amplifier
Design How-To  
1/4/2008   Post a comment
The series continues with this Introduction to instrumentation amplifiers (in amps)
Measuring video quality: Can objective metrics match human eyes?
Design How-To  
1/4/2008   Post a comment
Can objective metrics replace the "gifted" human eye when evaluating video quality? In short -- no -- but they have an important purpose. Subjective video analysis is costly, time consuming, and difficult to repeat. Objective metrics act as important evidence, while subjective analysis provides the confirmation.


EE Life
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Max Maxfield

Aging Brass: Cow Poop vs. Horse Doo-Doo
Max Maxfield
37 comments
As you may recall, one of the things I want to do with the brass panels I'm using in my Inamorata Prognostication Engine is to make them look really old. Since everything is being mounted ...

EDN Staff

11 Summer Vacation Spots for Engineers
EDN Staff
11 comments
This collection of places from technology history, museums, and modern marvels is a roadmap for an engineering adventure that will take you around the world. Here are just a few spots ...

Glen Chenier

Engineers Solve Analog/Digital Problem, Invent Creative Expletives
Glen Chenier
11 comments
- An analog engineer and a digital engineer join forces, use their respective skills, and pull a few bunnies out of a hat to troubleshoot a system with which they are completely ...

Larry Desjardin

Engineers Should Study Finance: 5 Reasons Why
Larry Desjardin
45 comments
I'm a big proponent of engineers learning financial basics. Why? Because engineers are making decisions all the time, in multiple ways. Having a good financial understanding guides these ...

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