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posted in January 2011
DesignCon2011 preview
Social Mania  
1/31/2011   Post a comment
A preview of events at DesignCon2011 in Santa Clara, Calif.
Optiphase creates waveform and timing generator instrument using Opal Kelly XEM3001 FPGA module
News & Analysis  
1/31/2011   1 comment
Optiphase has created a PC-controlled Waveform and Timing Generator (WTG) instrument using the Opal Kelly XEM3001 FPGA module mated with a custom adapter PCB.
Loudspeakers: Objective evaluations - Part 3: Comparing the subjective and objective domains
Design How-To  
1/26/2011   2 comments
Part 3 of an excerpt from "Sound Reproduction: The Acoustics and Psychoacoustics of Loudspeakers and Rooms" reviews results of the author's elaborate subjective-objective investigation into loudspeaker evaluation.
Sophisticated test set provides PCI Express 3.0 receiver characterization
Product News  
1/25/2011   Post a comment
A complex, demanding test requirement calls for a corresponding solution, as Agilent's PCI Express 3.0 test with J-BERT N4903B demonstrates
Precision pulse function arbitrary noise generator tackles higher speed, bandwidth R&D and test needs
Product News  
1/25/2011   Post a comment
Agilent 81160A does 330-MHz pulses, 500 MHz function/arbitrary waveforms with 2.5 Gsample/sec rate and 14-bit resolution
Tradeoff: Dynamic range and bandwidth in signal analysis
Design How-To  
1/21/2011   9 comments
Examining the tradeoff between dynamic range and bandwidth in signal analysis.
The mysterious case of the Chicago blackouts
Engineering Investigations  
1/13/2011   7 comments
Engineers are baffled by a sub-transmission line for an electric company losing power at dinner time
Chip market set for modest growth in 2011
Blog  
1/13/2011   2 comments
For now Peter Clarke is seeing 2011 as a "normal" year for the semiconductor industry in which growth is set to be in the 2 to 6 percent range.
Analyzer tests IEEE 802.3at PoE powered devices
Product News  
1/12/2011   Post a comment
An automated IEEE 802.3at powered device analysis from Sifos Technologies provides one-button, fully automated test sequences and limit processing for critical powered device operating parameters.
The Evolution of Smart Switching: The Impact of On-Board Test Script Processor Architecture
Blog  
1/12/2011   Post a comment
Fortunately for electronic components manufacturers, who face ongoing pressure to reduce cost of test by boosting throughput, some switch hardware vendors continue to invest in the development of smart switching technology using more sophisticated on-board testing intelligence.
Noise, noise everywhere in an early ultrasound scanner
Engineering Investigations  
1/7/2011   22 comments
A junior engineer investigates noise problems with a cardiac imager and learns the value of writing everything down and not forgetting that the smallest fix may save a lot of work
Troubleshooting engineer gets the jitters
Engineering Investigations  
1/7/2011   4 comments
When his card fails Wander Transfer, an engineer wonders how the unit is going to meet spec when the stimulus exceeds spec
Automotive connectors evolve to meet complex demands and EV challenges
Design How-To  
1/7/2011   1 comment
While initially adapted from industrial designs, the increasing complexity of automotive electronics has created demands for interconnects that vary greatly from the traditional pin-and-socket connectors—and can adapt to electric and hybrid vehicles.
Tektronix signal analyzer delivers high performance at mid-range cost
Product News  
1/4/2011   Post a comment
Tektronix releases signal analyzer that packs performance for embedded RF, radio communications, and spectrum management.
Top 10 RF/microwave design articles for 2010
Design How-To  
1/4/2011   Post a comment
Drum roll please! It has been a great year on the RF and Microwave Designline. Here are the Top 10 articles, as voted by your page turns...


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