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Content tagged with Test & Measurement
posted in January 2013
Meet Test and Measurement World's Test Engineer of the Year
The Engineering Life - Around the Web  
1/31/2013   Post a comment
Peter Spitzer, a member of the TRICENTIS team since 2008, honored for his achievements.
Software tool identifies RF spectrum IMD frequencies
Product News  
1/30/2013   Post a comment
Launched by Kaltman Creations LLC, RF-intermodPRO is new software product that aids in calculating, predicting and identifying intermodulation interference of wireless devices.
Silicon Valley Nation: VCs still hate you
Blog  
1/24/2013   7 comments
VC investment fell nearly across the board in 2012, but the electronics industry remains especially neglected.
Application simplifies eMMC compliance testing
News & Analysis  
1/22/2013   Post a comment
In response to the latest JEDEC specification, Agilent introduced the N6465A test application for embedded multimedia card (eMMC) compliance test.
Digital signal level meter tests DVB-C channels
Product News  
1/17/2013   Post a comment
Capable of conducting analog and digital measurements of cable TV networks, the A0N00010 digital signal level meter from GAO Comm measures the average power of the DVB-C signal, as well as frequency power levels.
Troubleshooting and verifying 8b/10b encoded signals with a real-time oscilloscope
Design How-To  
1/17/2013   1 comment
Few serial technologies have become more widely adopted than 8b/10b coding. Any designer will eventually need the ability to efficiently analyze 8b/10b encoded signals using common instrumentation such a real-time oscilloscope.
Mouser adds test gear from Keithley
Design How-To  
1/11/2013   Post a comment
Component distributor Mouser Electronics said it has added test instruments specialist Keithley Instruments to its roster.
DesignCon SMEs: Tough Path to 25G+ High-Speed Signals
News & Analysis  
1/11/2013   5 comments
A hornet's nest of issues -- crosstalk, loss, and noise -- are challenges on the road to 40G and beyond.
Thin film chip resistor arrays offer tolerances as low as 0.1%
Product News  
1/11/2013   2 comments
The RAVN Series from Stackpole is a thin film based chip array designed for applications with tight tolerance or tight TCR requirements.
2012 Modular Instrument Predictions: Results
Design How-To  
1/11/2013   Post a comment
Larry Desjardin reviews his Top 10 industry predictions for 2012. How did he do?
Agilent Fellow Joel Dunsmore on art of test & measurement
News & Analysis  
1/10/2013   1 comment
How Joel Dunsmore, the son of bakers, became one of the most noted minds in the world of test and measurement.
DesignCon Offers Free Expo Passes
News & Analysis  
1/7/2013   Post a comment
The chip & systems conference, Jan. 28-31 in Santa Clara, also has a dozen free training sessions.
Analyze This: Electronics winners & losers in 2012
Blog  
1/2/2013   21 comments
A look back and a look ahead at the top trends in the global electronics industry.
National Instruments acquires LTE tester
Design How-To  
1/2/2013   Post a comment
National Instruments has acquired wireless testing specialist Signalion, a German firm that is part of Dresden's tight-knit communications R&D community.


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