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posted in January 2013
Meet Test and Measurement World's Test Engineer of the Year
The Engineering Life - Around the Web  
1/31/2013   Post a comment
Peter Spitzer, a member of the TRICENTIS team since 2008, honored for his achievements.
Software tool identifies RF spectrum IMD frequencies
Product News  
1/30/2013   Post a comment
Launched by Kaltman Creations LLC, RF-intermodPRO is new software product that aids in calculating, predicting and identifying intermodulation interference of wireless devices.
Silicon Valley Nation: VCs still hate you
Blog  
1/24/2013   7 comments
VC investment fell nearly across the board in 2012, but the electronics industry remains especially neglected.
Application simplifies eMMC compliance testing
News & Analysis  
1/22/2013   Post a comment
In response to the latest JEDEC specification, Agilent introduced the N6465A test application for embedded multimedia card (eMMC) compliance test.
Digital signal level meter tests DVB-C channels
Product News  
1/17/2013   Post a comment
Capable of conducting analog and digital measurements of cable TV networks, the A0N00010 digital signal level meter from GAO Comm measures the average power of the DVB-C signal, as well as frequency power levels.
Troubleshooting and verifying 8b/10b encoded signals with a real-time oscilloscope
Design How-To  
1/17/2013   1 comment
Few serial technologies have become more widely adopted than 8b/10b coding. Any designer will eventually need the ability to efficiently analyze 8b/10b encoded signals using common instrumentation such a real-time oscilloscope.
Mouser adds test gear from Keithley
Design How-To  
1/11/2013   Post a comment
Component distributor Mouser Electronics said it has added test instruments specialist Keithley Instruments to its roster.
DesignCon SMEs: Tough Path to 25G+ High-Speed Signals
News & Analysis  
1/11/2013   5 comments
A hornet's nest of issues -- crosstalk, loss, and noise -- are challenges on the road to 40G and beyond.
Thin film chip resistor arrays offer tolerances as low as 0.1%
Product News  
1/11/2013   2 comments
The RAVN Series from Stackpole is a thin film based chip array designed for applications with tight tolerance or tight TCR requirements.
2012 Modular Instrument Predictions: Results
Design How-To  
1/11/2013   Post a comment
Larry Desjardin reviews his Top 10 industry predictions for 2012. How did he do?
Agilent Fellow Joel Dunsmore on art of test & measurement
News & Analysis  
1/10/2013   1 comment
How Joel Dunsmore, the son of bakers, became one of the most noted minds in the world of test and measurement.
DesignCon Offers Free Expo Passes
News & Analysis  
1/7/2013   Post a comment
The chip & systems conference, Jan. 28-31 in Santa Clara, also has a dozen free training sessions.
Analyze This: Electronics winners & losers in 2012
Blog  
1/2/2013   21 comments
A look back and a look ahead at the top trends in the global electronics industry.
National Instruments acquires LTE tester
Design How-To  
1/2/2013   Post a comment
National Instruments has acquired wireless testing specialist Signalion, a German firm that is part of Dresden's tight-knit communications R&D community.


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NEXT UPCOMING BROADCAST
In conjunction with unveiling of EE Times’ Silicon 60 list, journalist & Silicon 60 researcher Peter Clarke hosts a conversation on startups in the electronics industry. One of Silicon Valley's great contributions to the world has been the demonstration of how the application of entrepreneurship and venture capital to electronics and semiconductor hardware can create wealth with developments in semiconductors, displays, design automation, MEMS and across the breadth of hardware developments. But in recent years concerns have been raised that traditional venture capital has turned its back on hardware-related startups in favor of software and Internet applications and services. Panelists from incubators join Peter Clarke in debate.
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