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Content tagged with Test & Measurement
posted in October 2000
ASE Test reports 51.7% growth in Q3 sales, hikes spending plans
News & Analysis  
10/26/2000   Post a comment
TAIPEI, Taiwan -- ASE Test Ltd. here today reported a 51.7% increase in net sales to $120.8 million in the third quarter compared to $79.6 million in the same period last year. The contract chip-testing company said its net revenues were 17.6% higher than $102.7 million in the second quarter.
MindReady gears up to buy Yelo
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10/26/2000   Post a comment
Credence buys tester IP supplier NewMillennia Solutions
News & Analysis  
10/26/2000   Post a comment
FREMONT, Calif.--Credence Systems Corp. here today announced it has acquired full ownership of NewMillennia Solutions Inc., a supplier of design-for-test technology and embedded intellectual property (IP) used in system-on-chip designs. The purchase is aimed at increasing Credence's ability to support next-generation test requirements in complex ICs.
Cohu expects rebound in chip-test handler orders
News & Analysis  
10/20/2000   Post a comment
SAN DIEGO -- Cohu Inc. this week said it was encouraged by industry forecasts showing a potential uptick in demand for semiconductor-test handlers in the next several years as backend assembly and chip-testing operations catch up with strong growth in wafer fabs. On Thursday, Cohu reported its sales grew 25% to $77.2 million in the third quarter, compared to $61.7 million in the period last year.
K&S to buy test-interconnect supplier Cerprobe for $225 million
News & Analysis  
10/12/2000   Post a comment
WILLOW GROVE, Pa.--Kulicke & Soffa Industries Inc. here today announced it will acquire Cerprobe Corp. of Gilbert, Ariz., for $225 million in cash to expand its business into chip-testing and wafer-probe interconnect systems. Under an agreement approved by directors of both companies, K&S will pay $20 in cash for Cerprobe common stock.
Signal and noise levels underline ADSL line driver, receiver design
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10/10/2000   Post a comment
ADSL transmissions are affected by signal and noise levels on the telephone line, which appear in specific segments of the frequency spectrums. TI's Jim Quarfoot offers pointers for driver/receiver design.
Agilent forms system-on-chip test unit
News & Analysis  
10/4/2000   Post a comment
ATLANTIC CITY, N.J. -- Agilent Technologies Inc. has formed a new system-on-chip (SoC) test business unit to focus on the market segment, which the company says will grow to $8 billion by 2005.
New processor bus technique is good, bad news for testers
News & Analysis  
10/4/2000   Post a comment
ATLANTIC CITY, N.J. -- New generations of microprocessors are using source synchronous data transfer techniques to speed up processing and eliminate errors, but this approach is also creating testing challenges, according to large suppliers of test equipment at the International Test Conference (ITC) here this week.
Credence rolls out benchtop test system for RF devices
News & Analysis  
10/4/2000   Post a comment
ATLANTIC CITY, N. J. -- At the International Test Conference here, Credence Systems Corp. officially rolled out a benchtop vector-analyzer system for use in testing high-speed, radio-frequency (RF) devices. Called the MI 4115A MVNATM (Modulated Vector Network Analyzer), the company's new benchtop system utilizes a high-performance, vector-error correction technology in order to test and analyze next-generation RF devices, such as third-generation (3G) chips, Bluetooth ICs, and others.
Lower cost testers for system-on-chip products take off
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10/4/2000   Post a comment
ATLANTIC CITY, N.J. -- During the International Test Conference here, Advantest Corp. jumped into the booming lower-cost test market for system-on-chip (SoC) devices by unveiling a more austere version of its high-end logic and mixed-signal testers.
Mosaid rolls out tester for fast prototype memories
News & Analysis  
10/2/2000   Post a comment
SANTA CLARA, Calif. -- The Systems Division of Mosaid Technologies Inc. today announced a new low-cost engineering test system for prototype high-speed memory devices. The MS4205 system is designed for testing fast DRAMs, SRAMs, flash memories, embedded ICs, and related devices, said John Bateson, vice president of marketing and business development for Mosaid's Systems Division here.
LTX takes equity stake in StepTech
News & Analysis  
10/2/2000   Post a comment
WESTWOOD, Mass.-- LTX Corp. here today announced that it has made an equity investment in StepTech, Inc., a supplier of semiconductor test equipment, instrumentation, and other products, for an undisclosed amount. The deal also gives LTX exclusive rights to certain technologies from StepTech. The Hopkinson, Mass.,-based company specializes in developing test instruments and software for wireless and mixed-signal testing applications.


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