Schlumberger's Saber unit to provide IC-testing services on rival testers from Agilent News & Analysis 10/31/2001 Post a comment SAN JOSE -- In a slight change in strategy, Schlumberger Semiconductor Solutions' Saber unit has begun to offer test and engineering consulting services on testers from a rival--Agilent Technologies Inc.
Previously, Saber--a business unit of Schlumberger Semiconductor of San Jose--offered design, test, engineering, and consulting services for customers exclusively on Schlumberger's own line automatic test equipment (ATE).
Speaker advocates smarter test methods News & Analysis 10/31/2001 Post a comment Chip makers will be forced to "test smarter" with new, adaptive testing methods in order to maintain historic quality levels without increasing costs, according to Phil Nigh, a senior engineer at IBM Microelectronics, speaking Tuesday (Oct. 30) at the International Test Conference.
LogicVision raises about $40.5 million in IPO News & Analysis 10/31/2001 Post a comment SAN JOSE -- LogicVision Inc.--a supplier of built-in-self-test (BIST) technology that promises to reduce the cost of chip-testing--here today announced that it commenced its initial public offering.
The company sold 4,500,000 shares of its common stock at a price of $9.00 per share, for a total of $40.5 million. The deal was managed by UBS Warburg LLC, SG Cowen Securities Corp. and Dain Rauscher Inc.
Credence offers one-stop design-to-test solution for chip makers News & Analysis 10/30/2001 Post a comment FREMONT, Calif. -- Credence Systems Corp. here today announced a one-stop design-to-test solution that promises to reduce chip-testing costs for IC makers.
Credence's Quartet Series of automatic test equipment (ATE) now supports Integrated Measurement Systems Inc.'s (IMS) pre-silicon test debug solution, dubbed VirtualTester. IMS is a subsidiary of Credence, based in Fremont.
Teradyne upgrades Tiger tester to support new protocols News & Analysis 10/29/2001 Post a comment BALTIMORE -- During the International Test Conference (ITC) here today, Teradyne Inc. here added high-speed, serializer/ deserializer test capabilities to its flagship line of VLSI logic testers.
Teradyne has added 3.2-gigabits-per-second, serializer/deserializer (SerDes) Port Qualifier (SPQ) capabilities to its Tiger line of automatic test equipment (ATE). The new capabilities are aimed to meet the test needs for devices, based on SerDes, InfiniBand, SONET/SDH, and related technologies, said J
Keithley upgrades test system for fiber-optic applications News & Analysis 10/26/2001 Post a comment CLEVELAND -- Keithley Instruments Inc. here today announced that it has upgraded its test system for use in fiber-optic applications.
The company's L-I-V (Light-Current-Voltage) Test Systems can be used to test laser-diode modules used in fiber-optic equipment. The test system can also be used to qualify and sort laser-diodes components for optical read/write heads in data storage devices.
SZ Testsysteme to expand ATE capabilities in alliance with Q-Star News & Analysis 10/26/2001 Post a comment AMERANG, Germany -- Expanding the capabilities of its mixed-signal test lines, Germany's SZ Testsysteme AG here announced a strategic alliance with Q-Star Test of Brugge, Belgium.
Under the terms, SZ will offer IDD-enabled test and
measurement capabilities on its testers, based on technologies from Q-Star. Q-Star will provide hardware, software and other capabilities for SZ, such as IDDQ, IDDT and dynamic IDD.
ASE believes slump bottomed out in IC-assembly/test during in Q3 News & Analysis 10/25/2001 Post a comment TAIPEI, Taiwan -- Advanced Semiconductor Engineering Inc. here today reported a net loss of NT$679 million ($20 million) on sales of NT$8.4 billion ($247 million) in the third quarter. The supplier of chip-assembly and testing services said its revenues were 40% lower than NT$13.9 billion in Q3 last year, and 1% lower on a sequential basis from the second quarter.
Improving Test Efficiency with Concurrent Test Design How-To 10/24/2001 Post a comment As SoC complexity increases, the cost of testing SoCs also rises rapidly, often becoming a significant portion of total chip cost. Agilent's Kathleen Kollitz discusses how ATE concurrent test can significantly increase tester throughput, thus lowering test and, ultimately, chip cost.
Chip gear index rises back up slightly, but orders, shipments slip News & Analysis 10/23/2001 Post a comment SAN JOSE -- New orders for chip production tools fell slightly less than shipments in September vs. August, according to North American-based suppliers. The result was a slight increase in the book-to-bill ratio of North American companies at 0.65 in September, said the Semiconductor Equipment and Materials International (SEMI) trade group today.
Aehr, Pycon to offer compatible 'plug-&-play' IC burn-in boards News & Analysis 10/12/2001 Post a comment FREMONT, Calif. -- Aehr Test Systems here today announced a partnership with Pycon Inc. in nearby Santa Clara to jointly provide low-cost "plug-and-play" burn-in boards for testing and rooting out early failures in integrated circuits. These boards will be used in Aehr's burn-in and test systems.