Designers are taking back the JTAG test bus! Blog 10/30/2003 Post a comment It's not just for test anymore: Recent extensions to JTAG not only enhance its test coverage, but also make it useful for design as well, says this National Semiconductor technologist. Suppliers of CPLD's and FPGA's were quick to support IEEE 1532 standard for Boundary-Scan-based In-System-Configuration of programmable devices. Now designers have a way to develop flexible systems where functionality can be adapted to a specific customer or application, he says.
Geotest Rolls High Density PXI RF Mux Product News 10/29/2003 Post a comment At AUTOTESTCON 2003, test equipment maker Geotest-Marvin Test Systems rolled out its Model GX6062 PXI high-density RF multiplexer. The GX6062 product offers 12 groups of 1:4 multiplexers that can be software-controlled to provide various configurations---all maintaining a full 200 MHz of bandwidth.
Anritsu Accord With TestMart Part of Mil/Gov Plan Product News 10/29/2003 Post a comment Test-and-measurement company Anritsu inks an accord with service provider TestMart. Under the terms of the pact, TestMart will provide government marketplace services to Anritsu, part of a plan to better serve military personnel, government users, and contractors.
National Instruments Enhances Design and Simulation Software Product News 10/29/2003 Post a comment National Instruments announces a product called MATRIXx 6.3. Priced at just under $1700 a pop, it's billed as the company's first release of the control design and simulation software suite it acquired back in January. With updates and enhancements, it's also an initial step in National Instruments long-term plan for MATRIXx support.
Agilent Test Gear Enables Huge SONET Stress Test Product News 10/29/2003 Post a comment Agilent Technologies says its equipment played a key role in conducting the industry's largest stress test on an optical core-to-edge transport network. Agilent's OmniBER XM network simulator was used during the test to simulate and measure worst-case failure and recovery results.
Free Software Upgrades EDGE Cellphone Testers Product News 10/29/2003 Post a comment Test-and-measurement equipment vendor Willtek Communications GmbH is now giving out free software for the company's test gear that lets technicians at service centers rapidly test and align the transmitter sections of EDGE-capable mobile phones.
LeCroy Upgrades Serial Data Capture/Analysis Product News 10/29/2003 Post a comment High-speed o'scope maker LeCroy Corp. upgrades its Serial Data Analyzer instruments with a serial data trigger. With this news, LeCroy claims its upgrade is the fastest serial data pattern trigger in the oscilloscope industry.
Why Telecom Test Equipment Must Target The Factory Floor Product News 10/28/2003 Post a comment Although measurement integrity and reproducibility are important attributes for production testing, instrument accuracy can be taken as an article of faith these days. That can let you turn your attention to factors such as productivity, space, and cost, says Mark Hoersten, VP of Business Management at Keithley Instruments.
USB Data-Acq Attack News & Analysis 10/22/2003 Post a comment Legacy PC users may miss them, but most new PCs are devoid of parallel printer ports, and in many cases even the venerable serial I/O connector. Universal Serial Bus is taking center stage, as Centronix and RS-232 conventions fade into PC history.
Communications Test Equipment Evolves In Hard Times News & Analysis 10/22/2003 Post a comment Senior Tech Editor Alex Mendelsohn summarizes the state of the industry with respect to communications-oriented test-and-measurement. Despite a sluggish economy (or perhaps because of it), test gear continues to get better, faster, and cheaper.
EMI from the Ground Up: Maxwell to CISPR News & Analysis 10/7/2003 Post a comment Sooner or later, every power supply designer finds this out for himself --- that if anything has the potential to cause a return to the drawing board at the very last moment, it is either a thermal issue, a safety related issue, or a stubborn EMI problem, says National Semiconductor's Sanjaya Maniktala, in the introduction to this multi-part series on EMI effects. In Part 1, here, Sanjaya offers insights into the European and ISO standards that mandate analysis of board level signals. Part 2 sho
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.