Pre-validation interoperability test software is for 3G cellphones Product News 10/31/2005 Post a comment If you've ever grappled with 3G cellphone pre-validation interoperability testing, you'll be interested in new Windows-based software from Anritsu. It's new network simulation library for its existing signaling tester hardware lets you conduct pre-validation of interoperability testing between 3G user equipment and the world's various 3G networks.
I/O module packs on-board Web server Product News 10/26/2005 Post a comment There have been a number of USB data-acq module products introduced of late, but here's one with a built-in Web server. A compact module can replace a PC-based system for many data acquisition and control applications, including remote monitoring of equipment, wireless data collection, and Web enabling of legacy systems. eeProductCenter Senior Tech Editor Alex Mendelsohn reports.
System to identify AC distribution impedance Product News 10/26/2005 Post a comment Are you worried about poor AC power quality and excess energy use in your facility? For performing energy management and power quality studies, a very new company called Z Meters is readying a product that will address those concerns. It will use time-synchronized multi-point measurement and correlation techniques to characterize the impedance of an AC power distribution system.
Development tool supports hardware-independent mobile test Product News 10/25/2005 Post a comment Here's news of a hardware-independent and modular R&D tool for the development, testing, and debugging of mobile terminal applications. The GCF/PTCRB-compliant platform is a one-box tester facilitating the development and implementation of individual test scenarios during the engineering design phase of mobile applications.
Freebie RF terminology guide clears the air Product News 10/25/2005 Post a comment Test-and-measurement house Keithley Instruments is publishing a free guide to understanding the vocabulary of wireless. The 32-page booklet defines a variety of technical terms and acronyms, and includes some useful tables.
Wireless USB tools to address ultra-wideband development, test Product News 10/25/2005 Post a comment Supporting certified Wireless Universal Serial Bus and WiMedia UWB interface standards, new protocol analysis and traffic-generation tools soon to be released from LeCroy promise to provide insight at each stage of a product's development lifecycle. These tools come just as the WUSB v1.0 spec has been published.
IC test software gets better, supports Teradyne FLEX Product News 10/25/2005 Post a comment Semiconductor test provider Pintail Technologies is releasing the latest version of its SwifTest 5.2 realtime statistical sampling software suite for semiconductor testing. This new version promises to reduce test cost, improve quality, and boost test efficiency. The company will also be supporting Teradyne test platforms.
Agilent joins ZigBee Alliance News & Analysis 10/24/2005 Post a comment Agilent Technologies Inc. has announced it is the first test and measurement equipment manufacturer to join the ZigBee Alliance, an association of more than 100 companies working to enable cost-effective, low-power, wirelessly networked monitoring and control products based on an open global standard.
Sound and vibration recorders rely on RAID Product News 10/21/2005 Post a comment Offering secure digital data recording with 12-Mbit/s recording rates, Sony Manufacturing Systems America is starting to roll out a series of sound and vibration recorders. These modular data-acq systems rely on redundant 200-Gbyte hot-swappable RAID arrays for storage.
Connectorless Probing Enables HyperTransport Debug at 2.4Gb/s News & Analysis 10/20/2005 Post a comment HyperTransport is becoming one of the most popular links for chip-to-chip communication. As HyperTransport continues to appear in more and more platforms, system engineers are requiring sophisticated debug tools to aid in validation. In most cases, engineers select a logic analyzer as their debug tool of choice. One of the biggest challenges facing engineers as they try to debug HyperTransport links is making the physical connection between their logic analyzer and the target system. Brock J. La
RF signal generators get better radar pulse-modulation performance Product News 10/19/2005 Post a comment Working with radar system design? If so, check out Anritsu's enhancements to its DC-to-daylight RF signal generators. The company is adding pulse modulation improvements that provide narrower leveled pulses. You also get increased resolution when using internal pulse generation, and higher-frequency waveform generators to simulate modulated signals.
Download free boundary-scan info Product News 10/18/2005 Post a comment Germany-based Gopel electronic GmbH has some IEEE-1149.x/JTAG boundary-scan Web-downloads describing the integration of boundary-scan into automatic test equipment. The Web site has useful tutorials, too.
VXS board packs dual 2.2-Gsample/s A/D channels Product News 10/18/2005 Post a comment Here's news of a VXS plug-in that combines an FPGA with a dual-channel 2.2-Gsample/s A/D. The 6U-sized VME/VXS payload card can be used for high-speed streaming data conversion, offering up to 10-bit resolution and multi-channel synchronization. eeProductCenter Senior Tech Editor Alex Mendelsohn reports.
Performance Analysis for Objective Methods of Video Quality Assessment Design How-To 10/18/2005 Post a comment Despite of the fact that assessment of video quality can be best accomplished by human visual systems, there is a great need to identify the objective methods, which can be performed quickly and repeatedly, and can be standardized. Moreover the results obtained by these objective methods should be closely correlated with the results obtained through subjective tests. This article comes up with performance analysis of various objective methods for assessing video compression quality that approxim
PHY layer data-generator works to 12.5-Gbits/s Product News 10/17/2005 Post a comment Agilent Technologies announces a serial bit-error-ratio tester with advanced jitter generation capabilities for jitter-tolerance testing of serial gigabit devices. Automated and compliant jitter-tolerance testing covers all popular serial bus standards, such as PCI Express, SATA, Fibre Channel, FB-DIMM, CEI, Gigabit Ethernet and XFP.
USB pods work as multi-channel scopes, spectrum analyzers Product News 10/11/2005 Post a comment New 2-channel and 4-channel PC oscilloscope adapters from Saelig offer 12-bit-resolution data conversion, 20-Msample/s sampling rates, and 512-ksample memory buffers. A USB 2.0 connection powers these units, eliminating the need for external power supplies. They can also be used as spectrum analyzers, multimeters, and dataloggers.
Tektronix protocol analyzer helps deploy triple-play UMTS services Product News 10/10/2005 Post a comment Test-and-measurement house Tektronix is rolling out a new generation UMTS Terrestrial Radio Access Network protocol analyzer. Tek's new platform delivers UMTS data capture and realtime analysis hardware, facilitating the deployment of so-called triple play services over third-generation UMTS networks.
USB data acquisition modules cut cost/channel Product News 10/10/2005 Post a comment Data acquisition vendor Data Translation announces new modules the company claims can lower the cost of making measurements by up to 55 percent. Both high input-channel USB modules are for applications requiring large numbers of signal inputs.
Less-than-$10,000 RF spectrum analyzer debuts Product News 10/6/2005 Post a comment Offering a low-cost portable platform for a range of applications, Agilent Technologies introduces compact high-performance RF spectrum analyzers for under $10,000. Models are available to cover from 100-kHz to either 3-GHz or 6-GHz.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.