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Content tagged with Test & Measurement
posted in October 2007
Functional tester targets automotive apps
Product News  
10/31/2007   Post a comment
Agilent Technologies has introduced a low-cost, small-footprint functional tester designed for automotive test markets.
TI's sub-1 GHz RF SoC integrates USB controller
Product News  
10/30/2007   Post a comment
The CC1111 is particularly useful when designed into a low-power sensor network utilizing TI's proprietary SimpliciTI network protocol.
Memory tester targets multi-chip packages
Product News  
10/30/2007   Post a comment
The T5781 test system from Advantest offers high test speeds of 533-Mbits/s for next-generation MCPs, devices that combine multiple memory types, including NAND, NOR and DRAM, in a single package.
Failure module simulates faults for auto electronic control unit testing
Product News  
10/30/2007   Post a comment
ETAS has released the ES4440 Compact Failure Simulation Module to insert electrical faults in the wire harness of a powertrain Electronic Control Unit (ECU) to verify the software and hardware passes diagnostics tests.
Wafer probe cards lower wire-bond logic, SoC test costs
Product News  
10/30/2007   Post a comment
FormFactor has developed a family of advanced wafer probe cards designed to address the rising cost and technology challenges associated with testing wire bond logic and system-on-chip (SoC) devices.
Boundary scan system debugs/tests complex PCBs in one package
Product News  
10/29/2007   Post a comment
XJTAG has released version 2.0 of its XJTAG boundary scan development system that offers several enhancements that simplify and speed up printed-circuit-board (PCB) debug and test.
2 Gbits/s test system targets bi-directional interfaces
Product News  
10/29/2007   Post a comment
Advantest's 2 Gbits/s test solution with 36-channels, zero round trip, and multi-strobe technology provides high accuracy testing of source-synchronous interfaces including DDR2/DDR3.
Probing solution delivers oscilloscope measurements in extreme temperatures
Product News  
10/29/2007   Post a comment
Agilent says it has introduced the industry's first probing solution for making oscilloscope measurements in environmental chambers and in other applications with extreme temperature conditions.
Test bench allows engineers to validate DisplayPort designs
Product News  
10/29/2007   Post a comment
Tektronix latest test product represents a complete bench for engineers wanting to optimize and validate the performance of their DisplayPort designs.
Synopsys boosts manufacturing test quality
Product News  
10/26/2007   Post a comment
Aimed at design organizations worldwide, the TetraMAX small delay defect automatic test pattern generator (ATPG) from Synopsys is designed to improve manufacturing test quality compared with conventional at-speed test methods.
Network probing platform monitors video transport in IPTV networks
Product News  
10/26/2007   Post a comment
Tektronix has introduced a network monitoring platform that monitors quality of video transport services in IPTV networks in real-time.
Tester combines lab testing with a portable form factor
Product News  
10/26/2007   Post a comment
JDSU has introduced the ONT-503, a compact 40/43G tester that combines lab testing needs with a portable form factor.
Anritsu's microwave signal synthesizer delivers super fast switching
Product News  
10/26/2007   Post a comment
The MG37020A utilizes advanced VCO-based hardware architecture to achieve its switching speed of 100 microseconds per point.
Mobile WiMAX test system delivers high measurement throughput
Product News  
10/25/2007   Post a comment
Agilent Technologies and Fujitsu Microelectronics partner to deliver chipset test system for Mobile WiMAX with high measurement throughput.
Panel explores the expanded role of test in DFM
News & Analysis  
10/25/2007   Post a comment
What role does testing have in the design-for-manufacturing process? Plenty, according to a panel of experts from industry and academia at the International Test Conference.
ST takes fresh approach to MCU evaluation
Product News  
10/25/2007   Post a comment
ST has developed a self-contained, pre-programmed evaluation package for the recently-announced STM32 flash microcontroller family that provides both a fun introduction and serious development tools and links to an on-line development community.
TI fellow defines conditions and requirements for adaptive test at ITC
News & Analysis  
10/24/2007   Post a comment
In his address at the International Test Conference in Santa Clara, Calif., Ken Butler, TI fellow at Texas Instruments, said growth in portable applications calls for the adoption of adaptive test, and that these changes in test strategies require corresponding modifications to design-for-test (DFT) tools and automatic test equipment (ATE).
FPGA debugger works at full speed
Product News  
10/24/2007   Post a comment
EDA startup EDAptability has announced the availability of its FPGA and ASIC debugging tool TotalScope. With a combination of RTL level elaboration, model extraction and modification techniques with simulation, the tool offers unrivaled signal visibility, the company claims.
JTAG signal multiplexer offers secondary port autodetection
Product News  
10/23/2007   Post a comment
Maxim claims to introduce the industry's first MicroTCA-compliant JTAG multiplexer with 18 secondary and 3 master ports in a single chip.
Researchers propose new design technique
News & Analysis  
10/23/2007   Post a comment
Researchers from the Indian Institute of Technology together with another institute in Kolkata have proposed a layout-aware, coverage-driven technique for Illinois Scan Architecture used to cut test application time and test data volume in high-density circuits.
Free audio analysis software
Audio DesignLine Blog  
10/22/2007   Post a comment
This free, versatile computer-based audio analysis system doesn't require any proprietary hardware or a specific computer platform.
Converters enable four-port network analysis in W-band applications
News & Analysis  
10/22/2007   Post a comment
ZVA-Z110 mm-wave converters add the W-band frequency range of 75 GHz to 110 GHz to the high-end network analyzers from Rohde & Schwarz. This covers important frequency bands used in emerging vehicle distance radar applications (77 GHz) or aerospace and defense applications (94 GHz).
Automatic test pattern generation with on-chip compression improves test quality
Product News  
10/19/2007   Post a comment
Magma's advanced automatic test pattern generation (ATPG) products support simultaneous analysis of multiple fault models, leverage multi-threading and on-chip compression to improve test quality and reduce turnaround time and costs of nanometer ICs.
Microwave signal generator achieves fast switching
Product News  
10/18/2007   Post a comment
Anritsu Company has introduced the MG37020A fast-switching microwave signal generator that uses an advanced VCO-based hardware architecture to achieve a switching speed of 100 microseconds per point.
Test platform offers conformance testing of Ethernet OAM
Product News  
10/18/2007   Post a comment
Agilent has announced the availability of a single-platform solution for protocol emulation and conformance testing of Ethernet Operations, Administration and Maintenance (E-OAM).
RF module delivers testing of multi-port RF SoC devices
Product News  
10/18/2007   Post a comment
Advantest has introduced a RF test solution for low-cost testing of multi-port RF SoC devices used widely in cellular phones and other wireless products and equipment.
Oscilloscope PCI Express card records two channels at 200 MS/s
Product News  
10/18/2007   Post a comment
Strategic Test has introduced the UF2e-2031 oscilloscope PCI Express card that is suited for applications that require high-speed data acquisition and deep memory.
Signal generator delivers 100 microsecond switching speed over 10 MHz to 20 GHz
News & Analysis  
10/18/2007   Post a comment
The MG37020A fast-switching microwave signal generator, from Anritsu utilizes an advanced VCO-based hardware architecture to achieve best-in-class frequency switching speed.
1-GHz oscilloscopes deliver 5 GS/s sampling rate
Product News  
10/17/2007   Post a comment
LeCroy Corp. has introduced two M-Type 1-GHz oscilloscopes that bring LeCroy's large display/small footprint and 5 GS/s sampling rate to 1-GHz oscilloscopes.
Test bench addresses PCIe compliance for transmitters, receivers
Product News  
10/16/2007   Post a comment
SyntheSys Research has released the BERTScope PCIe Test Bench, which the company says is the first complete solution for PCI Express transmitter and receiver physical layer compliance testing at 2.5 and 5.0 GT/s rates.
System timing controller offers synchronization of multiple PXI systems
Product News  
10/15/2007   Post a comment
National Instruments has released the latest additions to its timing tools portfolio including a PXI Express timing and synchronization controller and a PXI module that synchronizes PXI systems over GPS, IRIG and IEEE 1588.
Ultrawideband SoCs pose new challenges to manufacturers
Design How-To  
10/15/2007   Post a comment
Increased call for higher-quality wireless connectivity and capability to deliever audio, video, and data makes higher demands on ATE industry because of wider bandwidth, higher frequencies and frequency hopping specifications.
Rohde & Schwarz : mm-wave converters allow measurements in W band
Product News  
10/15/2007   Post a comment
The VA-Z110 mm-wave converters add the frequency range from 75 GHz to 110 GHz (W band) to the high-end network analyzers from Rohde & Schwarz.
Characterization system measures a broad capacitance range
Product News  
10/14/2007   Post a comment
The Model 4200-CVU instrument from Keithley comes as a module that plugs into any available instrument slot of the Model 4200-SCS, allowing fast and easy capacitance measurements from femtoFarads (fF) to nanoFarads (nF), at frequencies from 10-kHz to 10-MHz.
Rohde & Schwarz's millimeter wave converters target W band measurements
Product News  
10/12/2007   Post a comment
R&S ZVA-Z110 mm-wave converters add a new frequency range—from 75 GHz to 110 GHz (W band)—to Rohde & Schwarz's high-end network analyzers.
13-GHz oscilloscope targets next-generation serial data standards
Product News  
10/12/2007   Post a comment
LeCroy has launched its SDA 13000 13-GHz digital oscilloscope for next-generation serial data standards.
Test platform connects OEMs and Tier-ones
Product News  
10/12/2007   Post a comment
In order to enable a comprehensive test strategy for automotive projects across design processes and enterprise boundaries, Berner and Mattner has developed the software platform Messina.
IC verification tool maker sets up in Europe
News & Analysis  
10/11/2007   Post a comment
Berkeley Design Automation, Inc., the specialist developer of circuit analysis tools for analog and RF integrated circuits, has established a European sales office in Farnborough, England.
French solar cell tool specialist bought by Amtech
News & Analysis  
10/10/2007   Post a comment
Amtech Systems Inc. has acquired French solar cell and semiconductor automation equipment maker R2D Ingeniere (Montpellier) for $6.1 million and has invested a further $1 million in working capital, largely for expanding the solar business.
RF test system supports 4x4 MIMO applications
Product News  
10/9/2007   Post a comment
Keithley has introduced a 4x4 MIMO RF test system for RF communications equipment and devices, which includes new capabilities for its family of RF signal generators and analyzers.
Oscilloscope enhancements deliver easier debugging, improved signal fidelity
Product News  
10/8/2007   Post a comment
Tektronix has improved its DPO7000 and DPO/DSA70000 series oscilloscopes with new capabilities including enhanced signal fidelity and easier debugging of high-speed serial buses.
Body fat meter is thinly priced
Teardown  
10/8/2007   1 comment
There always seems to be some medical widget at David Carey's local Walgreen's that get the wheels of his curiosity turning. This time it was Omron's $50 (or less) HBF-306 personal body fat meter that drew the Portelligent teardown specialist's eye.
Test platform delivers both functional and bulk VoIP testing
Product News  
10/4/2007   Post a comment
Ixia has announced the IxLoad SIP solution it claims is the first VoIP test platform to provide both functional and bulk VoIP testing.
Agilent expands HDMI test platform
Product News  
10/4/2007   Post a comment
Agilent has expanded its HDMI test platform to address four sectors: source testing, sink testing, media physical layer evaluation and protocol test.
Sweden plans a city-wide meter reading system with ZigBee
News & Analysis  
10/3/2007   Post a comment
The city of Gothenburg, Sweden, will soon host the largest reported ZigBee network when it deploys a utility metering system for 270,000 homes.
Software performs serial data link analysis
Product News  
10/1/2007   Post a comment
Tektronix has introduced an end-to-end high-speed serial data analysis software package with test capabilities. The 80SJNB Advanced software runs on the Tektronix DSA8200 digital serial analyzer.
PXI modules, chassis, and software enable wireless test
Product News  
10/1/2007   Post a comment
Aeroflex has announced a configurable RF test platform that operates up to 6GHz for cellular, wireless data, RFIC, and general purpose wireless test applications.


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