Memory tester targets multi-chip packages Product News 10/30/2007 Post a comment The T5781 test system from Advantest offers high test speeds of 533-Mbits/s for next-generation MCPs, devices that combine multiple memory types, including NAND, NOR and DRAM, in a single package.
Synopsys boosts manufacturing test quality Product News 10/26/2007 Post a comment Aimed at design organizations worldwide, the TetraMAX small delay defect automatic test pattern generator (ATPG) from Synopsys is designed to improve manufacturing test quality compared with conventional at-speed test methods.
ST takes fresh approach to MCU evaluation Product News 10/25/2007 Post a comment ST has developed a self-contained, pre-programmed evaluation package for the recently-announced STM32 flash microcontroller family that provides both a fun introduction and serious development tools and links to an on-line development community.
TI fellow defines conditions and requirements for adaptive test at ITC News & Analysis 10/24/2007 Post a comment In his address at the International Test Conference in Santa Clara, Calif., Ken Butler, TI fellow at Texas Instruments, said growth in portable applications calls for the adoption of adaptive test, and that these changes in test strategies require corresponding modifications to design-for-test (DFT) tools and automatic test equipment (ATE).
FPGA debugger works at full speed Product News 10/24/2007 Post a comment EDA startup EDAptability has announced the availability of its FPGA and ASIC debugging tool TotalScope. With a combination of RTL level elaboration, model extraction and modification techniques with simulation, the tool offers unrivaled signal visibility, the company claims.
Researchers propose new design technique News & Analysis 10/23/2007 Post a comment Researchers from the Indian Institute of Technology together with another institute in Kolkata have proposed a layout-aware, coverage-driven technique for Illinois Scan Architecture used to cut test application time and test data volume in high-density circuits.
French solar cell tool specialist bought by Amtech News & Analysis 10/10/2007 Post a comment Amtech Systems Inc. has acquired French solar cell and semiconductor automation equipment maker R2D Ingeniere (Montpellier) for $6.1 million and has invested a further $1 million in working capital, largely for expanding the solar business.
Body fat meter is thinly priced Teardown 10/8/2007 1 comment There always seems to be some medical widget at David Carey's local Walgreen's that get the wheels of his curiosity turning. This time it was Omron's $50 (or less) HBF-306 personal body fat meter that drew the Portelligent teardown specialist's eye.
As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.
January 2016 Cartoon Caption ContestBob's punishment for missing his deadline was to be tied to his chair tantalizingly close to a disconnected cable, with one hand superglued to his desk and another to his chin, while the pages from his wall calendar were slowly torn away.122 comments