Amkor's Q3 profit plummets News & Analysis 10/29/2008 Post a comment Chip-packaging provider Amkor Technology saw its third quarter profit plummet to $34 million, down 48 percent from the second quarter and down 44 percent from the third quarter of 2007.
Opinion: Test your mindset News & Analysis 10/27/2008 Post a comment When designers and test engineers make their annual pilgrimage to the Mecca of T&M this week, they won't find the same-old, same-old. The 39th ITC is about getting them to work in union.
Characterizing power control devices Design How-To 10/14/2008 Post a comment Understand how to characterize power switching semiconductors like IGBTs and MOSFETs with a realistic load so that the design parameters for their drive circuitry can be optimized.
Teams partner for maskless ICs News & Analysis 10/9/2008 Post a comment Fujitsu Microelectronics Limited and e-Shuttle, Inc. have adopted the design for e-beam technology from design and software company DS2 to deliver cost and time reductions for producing prototypes, derivatives and ICs.
RF level control sensors with high dynamic range Product News 10/6/2008 Post a comment The R&S NRP-Z28 and -Z98 RF level control sensors from Rohde & Schwarz are designed to enhance the performance of power measurements. Both products are suited for situations when highly accurate RF levels must be supplied over a wide dynamic range.
Agilent offers a new approach to nonlinear component characterization using X-parameters News & Analysis 10/6/2008 Post a comment Utilizing a solution that employs both nonlinear component characterization and X-parameters provides critical insight, essential to accurately measuring a device's nonlinear behavior. Agilent Technologies' Nonlinear Vector Network Analyzer (NVNA) supports both methods in a highly integrated, powerful and simple to use instrument. With a minimum amount of external hardware, this solution effectively converts a 4-port PNA-X microwave network analyzer into a high-performance nonlinear analyzer fro
Groups to collaborate on WiMedia radio tesing News & Analysis 10/1/2008 Post a comment The WiMedia Alliance, which promotes the adoption, standardization and multi-vendor interoperability of ultra-wideband (UWB) worldwide, has teamed with the Wireless Alliance for Testing Experiment and Research (Walter) grouping to focus on European development of the technology needed for measurement, calibration and testing of UWB radio products.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.