Putting an audiophile "tweak" to the test Audio DesignLine Blog 10/27/2010 15 comments A longstanding audiophile product - a "quantum/superconducting"-based device that claims to achieve previously unnattainable "levels of signal purity and transparency" - undergoes some objective tests by some skeptical audio DIYers.
Testing SerDes I/O links the third time around Design How-To 10/27/2010 2 comments This article describes the main objectives of SerDes testing at the system level. It then presents major test and measurement considerations, starting with BER and proceeding to jitter, clock recovery, and protocol awareness.
CDR module gets the jitters Engineering Investigations 10/21/2010 4 comments A supplier’s clock and data recovery module will not stay synchronized. Engineers are hesitant to complain after their first problem with the module turned out to be an embarrassing layout error.
The changing face of electronic test instrumentation Test & Measurement Designline Blogs 10/21/2010 1 comment Over the last 20 years, many different types of software applications have evolved to help relieve the test engineer from spending huge blocks of time writing code. Today, software products exist to create waveforms, analyze vector signals and make highly accurate measurements using advanced methodologies. These software tools can be integrated into a larger automated test environment and many instruments are now PC-based so the applications can now run directly on the instrument.
Are design and test conflicting or symbiotic? Blog 10/20/2010 7 comments These days, IC design engineers have more functionality to implement in their designs than ever before, even though design schedules are shrinking. Although design-for-test (DFT) is absolutely necessary to enable thorough and cost-effective manufacturing test, it potentially makes the overall design process even more challenging.
What IEEE 1588 means for your next T&M system design Design How-To 10/19/2010 Post a comment Timing and synchronization are crucial in building test and measurement (T&M) systems, which makes the IEEE 1588 Precision Time Protocol’s ease of use and high performance especially attractive to system designers. This paper offers an overview of the benefits IEEE 1588 brings to T&M systems, especially when paired with LXI Class B instrument capabilities, and illustrates how these capabilities can be integrated into instruments that can serve as powerful building blocks for creating high perfor
Testing high brightness LEDs in a production environment Design How-To 10/13/2010 13 comments Visible light emitting diodes (LEDs) combine high efficiency and long lifetimes. Today, they’re used in a wide range of applications. Extensive R&D efforts by manufacturers have led to the creation of devices with higher luminous flux, longer lifetimes, greater chromaticity, and more lumens per watt. Accurate and cost-effective testing is critical to ensure device reliability and quality.
ST's Carmelo Papa appointed chairman of EPoSS News & Analysis 10/11/2010 Post a comment Carmelo Papa, executive vice president and general manager of the industrial and multisegment business within STMicroelectronics, has been appointed chairman of a European think-tank for smart system integration.
T&M gets dedicated designline Test & Measurement Designline Blogs 10/4/2010 1 comment Welcome to the Test & Measurement Designline, the latest addition to the EE Times Group's 'heads down' communities designed to help engineers tackle practical, technical and software challenges to bring product specification to reality.
A long-term strategy in a new market: Rohde & Schwarz Design How-To 10/4/2010 Post a comment Recently, measurement systems vendor Rohde & Schwarz announced to bring its first oscilloscopes to market, entering a new market segment. EE Times Europe had the opportunity to discuss the implications of this step with one of the company’s top managers, Roland Steffen, who oversees the measurement division.
Towards a wireless world Product How-To 10/4/2010 1 comment Nearing the end of operational life, the entire Globalstar constellation of 48 telecommunications satellites will be replaced by Thales Alenia Space – Europe’s largest satellite manufacturer.One of the critical roles of these facilities is testing satellites to ensure that highly sensitive components can withstand the thunderous acoustics and jarring vibrations of vehicle launch.
As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.
January 2016 Cartoon Caption ContestBob's punishment for missing his deadline was to be tied to his chair tantalizingly close to a disconnected cable, with one hand superglued to his desk and another to his chin, while the pages from his wall calendar were slowly torn away.122 comments