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Content tagged with Test & Measurement
posted in October 2012
Engineering horror at Disney
Blog  
10/31/2012   4 comments
When roller coasters go wrong...very, very wrong.
Tektronix boosts PCIe 3.0 Tx/Rx automation test
Product News  
10/26/2012   Post a comment
A new interference test set and other enhancements to Tektronix’ BERTScope bit-error-rate testers and PCI Express test software give silicon, host, and card designers a powerful automated transmitter/receiver compliance and debug platform for the PCI Express 3.0 bus standard.
What's mine is mine, what's yours is negotiable
Blog  
10/25/2012   1 comment
In today's complicated testing environments, where we find ourselves managing thousands of local or networked resources that are often shared between multiple users, this is often the easiest way to make sure no one else accesses a critical element in our test setup while we are running a test.
NASA and WPI open robot competition
News & Analysis  
10/25/2012   Post a comment
NASA and the Worcester Polytechnic Institute (WPI) have opened registration and are seeking teams to compete in next year's robot technology demonstration competition, which offers as much as $1.5 million in prize money.
Measuring HSIC USB without disturbing the system
Design How-To  
10/19/2012   Post a comment
High Speed Inter-Chip USB (HSIC USB) has recently become popular for connecting application processors to wireless modems and other peripherals in smartphones, tablets, and other mobile products.
State of the Art in Sub-10ps Pulse Generators: Technology, Performance, and Applications
Design How-To  
10/19/2012   2 comments
Pulse generators boasting rise times in the sub-10 ps regime have a wide range of important applications in electronics and semiconductor design, manufacturing, and test.
Test laser diodes with dual-channel picoammeter/voltage source
Product News  
10/18/2012   Post a comment
Keithley's picoammeter provides two independent picoammeter/source channels in a 2U, half-rack enclosure, allowing simultaneous 6-1/2-digit measurements across both channels.
Silicon Valley Nation: Coming home
Blog  
10/16/2012   6 comments
When a museum display of the late analog engineer Jim Williams' engineering bench ended, the question loomed: What to do with it?
Host controller gains USB-IF certification for Windows
Design How-To  
10/16/2012   1 comment
ASMedia, a leading Taiwanese supplier of xHCI-compatible host controllers, has leveraged MCCI’s USB 3.0 host system software stack for Windows and onsite support to achieve USB-IF SuperSpeed logo certification for its xHCI 1.0-compatible ASM1042 USB 3.0 host controller.
London Calling: Fireworks at Electronica
Blog  
10/15/2012   Post a comment
The biannual Electronica exhibition in Munich, Germany, returns in November under a cloud of economic angst. Can the event help shake up the tech sector?
Testing high-speed memory with non-intrusive embedded instruments, part 3
Design How-To  
10/12/2012   Post a comment
The final article in this series examines the tradeoffs among the non-intrusive methods and discusses how they have been implemented in the industry.
Agilent DMM withstands extreme winter weather
Product News  
10/12/2012   Post a comment
A handheld digital multimeter with a 4.5-digit OLED display, the U1273AX from Agilent Technologies operates in temperatures as low as –40°C for maintenance and troubleshooting in cold winter weather.
5G comms research gains funding
Design How-To  
10/10/2012   Post a comment
Huawei and Samsung are supporting the University of Surrey, which has won funding of more than $50 million, to create a center for fifth generation mobile communications research at its campus in Guildford, England.
Silicon Europe seeks to boost R&D, manufacturing
Design How-To  
10/8/2012   2 comments
Four European organizations join forces to address declining manufacturing through an initiative to coordinate investment in electronics.
RTD data logger is accurate to within ±0.05°C
Product News  
10/5/2012   Post a comment
Omega's compact data-logging module employs a 100-O platinum RTD sensing element for temperature measurement in the manufacturing lab, as well as R&D environments.
Security the main challenge for wireless?
The Engineering Life - Around the Web  
10/5/2012   6 comments
Wireless technology still has huge challenges ahead of it according to Intel’s chief technology officer, Justin Rattner.
Testing high-speed memory with non-intrusive embedded instruments, part 2
Design How-To  
10/1/2012   Post a comment
Learn how non-intrusive debug and test methods can meet the challenges that design and manufacturing engineers encounter.


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