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Content tagged with Test & Measurement
posted in November 2005
14-bit A/D reaches 190 Msamples/s
Product News  
11/30/2005   Post a comment
Texas Instruments Inc. (TI) unveiled a 14-bit, 190 Msamples/second analog-to-digital (A/D) converter that is said to provide strong dynamic performance and low power dissipation.
TETRA option enhances radio test set
Product News  
11/30/2005   Post a comment
Test instrumentation house Aeroflex announces the availability of a TETRA Direct Mode option for its existing 3900 Series RF test platform TETRA is based on digital Private Mobile Radio and Public Access Mobile Radio technologies. The option gives a 3900 comprehensive direct mode call setup and parametric testing capabilities.
Thumbwheel-operated handheld measures eight physical quantities
Product News  
11/30/2005   Post a comment
Here's a nomadic instrument that can measure eight physical quantities such as humidity, air flow, temperature, or even water content in oil. A unique thumbwheel selector scheme accesses the unit's menus.
Here come 10-bit 4-Gsample/s RF digitizers
Product News  
11/29/2005   Post a comment
Got the need for data-conversion speed? Slated for RF and ATE applications, data conversion instrument maker Acqiris is readying what it claims will be the world's first 10-bit 4-Gsample/s digitizers. These 3U-sized PXI digitizers will exhibit input bandwidths up to 3 GHz.
PXI plug-in packs programmable resistance decade
Product News  
11/29/2005   Post a comment
Remember the days of resistance decade boxes and substitution boxes? Here’s a modern PCI equivalent that's PC-controlled, of course.
USB box works as general-purpose hardware resource
Product News  
11/29/2005   Post a comment
Here's a plug-and-play instrument using realtime embedded processing power that can operate as a bi-directional I/O system. Each pin or signal can be individually defined as an input, an output, or as a bi-directional line. A Windows interface communicates to your PC through a plug-and-play USB interface. eeProductCenter Senior Tech Editor Alex Mendelsohn reports.
TDNA approach simplifies S-parameter compliance testing
Design How-To  
11/28/2005   Post a comment
Cable-assembly compliance-testing procedures for high-speed digital standards increasingly require S-parameter measurements for key parameters. Time-domain network analysis offers benefits compared to using a traditional, frequency-based Vector Network Analyzer. The advantage of TDNA techniques compared to frequency-domain VNA is substantially lower costs.
Protocol-based WLAN test set serves design and production test
Product News  
11/23/2005   Post a comment
Anritsu's MT8860B Wireless LAN test set is designed for radio layer measurements on IEEE-802.11b/g devices. The integrated test set simulates a WLAN Access Point for testing devices under actual operating conditions.
Cascade, Credence partner on semi failure analysis
News & Analysis  
11/22/2005   Post a comment
Test and measurement provider Cascade Microtech plans to expand its capabilities in the semiconductor failure analysis market through a business partnership with Credence Systems.
32-channel data-acq card packs its own clock
Product News  
11/22/2005   Post a comment
Using either the PCI bus or a dedicated FPDP II link, a 5-Msample/s A/D card packs as many as 32 channels of data conversion. The system eliminates the need for auxiliary clocking by including a programmable clock source on-board.
Serial pulse data generator has stimulus capability to 13.5-GHz
Product News  
11/22/2005   Post a comment
Agilent Technologies claims the industry's fastest serial pulse data generator, with stimulus capability up to 13.5-GHz. its 81142A generator enables physical layer measurements for high-speed serial bus designs.
Software makes RF test gear play
Product News  
11/21/2005   Post a comment
Focus-On: Myriad test equipment and a variety of approaches encompass RF test. Software figures prominently. Application-oriented executables that run on RF hardware such as oscilloscopes and digitizers, as well as software-only emulators, comprise state-of-the-art test platforms. Here's a cross-section of some recent new products that reflect the trend.
Portable data logger supports Internet Protocol v6
Product News  
11/21/2005   Post a comment
The Datum-y XL100 portable data logger from Yokogawa has a range of communications capabilities, and claims to be the world's first measuring instrument to support the IPv6 (Internet Protocol Version 6) logo. Measuring 155 x 56 x 155 mm and weighing around 800 grams, the instrument is suited to field service and maintenance applications.
Multiplier circuit measures real power in high-frequency PWMs
Design How-To  
11/20/2005   Post a comment
It's important to be able to measure average and RMS power, not just instantaneous power, in many situations. An all-analog circuit can make the measurement practical.
Optical power meter takes 100,000-readings/s
Product News  
11/18/2005   Post a comment
As Internet paths get faster, optical test equipment is increasingly called upon to measure both passive and active lightwave components. Here's an instrument that provides both speed and repeatability when measuring fiber optic systems. It can be used on the bench or in ATE racks.
Logic analyzers probe Altera FPGAs using JTAG
Product News  
11/16/2005   Post a comment
Working with Altera FPGAs? Then check out this software for Tektronix logic analyzers that enables realtime debugging. You can select a specific group of signals to be probed, without needing to recompile the FPGA file.
RF-tight enclosures are miniature screen rooms
Product News  
11/16/2005   Post a comment
Ever wished you had an RF-tight screen room in your lab? If you're working with RF (especially receiving systems) and you don't have one, fret no more; there's an alternative. Azimuth Systems has a line of RF isolation enclosures that can help you test multiple-input-multiple-output Rf systems. Its RF-proof enclosures mount in standard 19-in. racks, or they can sit on your bench.
Software helps peer into Ultra Wideband, WiMedia
Product News  
11/15/2005   Post a comment
Software down-conversion lets 15-GHz realtime oscilloscopes from Tektronix do debug and analysis Ultra Wideband RF.
Measurement bits test WLAN and GSM/EDGE RFIC, mobile handsets
Product News  
11/15/2005   Post a comment
As cellphones and handhelds increasingly connect into wireless local area networks, test-and-measurement house Aeroflex responds with a measurement suite that can be of use by developers of WLAN-connected products. The company is also expanding features of its existing GSM/EDGE measurement software.
World's first commercial HSUPA tester?
Product News  
11/15/2005   Post a comment
Here's news of what is claimed to be the world's first commercially available test system for High Speed Uplink Packet Access. The product provides support for 3GPP Release 6 HSUPA wireless.
Modular power system expands to 1.2-kW
Product News  
11/15/2005   Post a comment
Expanding its line of modular power sources, Agilent Technologies is rolling out four new ultra-fast modules and two mainframes that extend to 1200-W. With these products, the company claims it's now the industry leader in the number of outputs and amount of power that can be packed into a 1U-sized rack-mountable system.
LXI-compatible DMMs pack graphical Web interfaces
Product News  
11/15/2005   Post a comment
Targeting both bench-level users and ATE builders, Agilent Technologies is introducing an expanded family of DMM replete with built-in Web servers that make them operating-system independent.
PCI Express board acquires images from two cameras
Product News  
11/11/2005   Post a comment
Check out this image acquisition plug-in board that can acquire images from two independent base-configuration Camera Link cameras. Using PCI Express, this system can acquire images at speeds up to 255-Mbytes/s with clock rates up to 85-MHz.
Network-transparent modules implement remote JTAG testing
Product News  
11/10/2005   Post a comment
Here's news of an IEEE-1149.1 test product that makes it possible to execute boundary-scan tests on targets with test-clock frequencies of up to 40-MHz, over an unlimited distance, across asynchronous network paths. eeProductCenter Senior Tech Editor Alex Mendelsohn reports.
Test solutions verify emerging MIMO WLAN technologies
Product News  
11/10/2005   Post a comment
LitePoint Corp. has come up with two new wireless test solutions, a stand alone test system and an add-on software package for the company's existing units, to put the latest MIMO WLAN products through their paces.
Test acquisition improves results for JDS Uniphase
News & Analysis  
11/9/2005   Post a comment
Broadband and optical components supplier JDS Uniphase Corp. posted a net loss of $67.0 million, or 4 cents per share on sales of $258.3 million in its first fiscal 2006 quarter ended September.
Boundary-scan test goes into MicroTCA spec
Product News  
11/9/2005   Post a comment
By being the first boundary-scan IEEE-1149.1/JTAG company to join the PICMG, ASSET InterTech is helping to define a system-level JTAG architecture as part of the MicroTCA standard. MicroTCA promises small system footprint, low power, small module size, low cost, and advanced management facilities.
Agilent waveform generator now supported by LabVIEW
Product News  
11/8/2005   Post a comment
Test equipment maker Agilent Technologies says its existing arbitrary waveform generator now works with National Instruments's popular LabVIEW graphical programming environment. LabVIEW provides instrument control for the AWG, and reduces test program development by eliminating the need to learn text-based programming protocols.
Nomadic tester option checks electromagnetic near-fields
Product News  
11/8/2005   Post a comment
Everyone who works with any reasonably high level of RF should be concerned about near-field radiation, whether it’s to ensure conformance with regulatory limits, or whether it’s health-related. If that's you, check out Willtek Communications's handheld tester and new options. Together they can help you make the appropriate electromagnetic field measurements.
MMIC driver amps span 20GHz
Product News  
11/8/2005   Post a comment
Communication and military markets can benefit from Hittite Microwave Corp.'s driver amplifier die and packaged PA.
USB-connected module comprises 100-MHz mixed-signal oscilloscope
Product News  
11/4/2005   Post a comment
Here's news of a USB-connected all-in-one PC-based mixed signal oscilloscope adapter. It packs a lot of performance into a compact module, and when you factor-in its price at less than a kilobuck, it’s an instrument worth investigating.
inTest posts strong quarter
News & Analysis  
11/2/2005   Post a comment
Semiconductor automatic test equipment (ATE) interface solutions supplier inTest Corp. reported net income of $0.4 million, or 4 cents per share on sales of $16.4 million in the third quarter, compared to a net loss of $1.8 million, or 21 cents per share on sales of $12.2 million the previous quarter.
Plug-and-play USB modules tout simultaneous-channel data conversion, digital I/O
Product News  
11/2/2005   Post a comment
Here's an industry-first in data acquisition. A line of plug-and-play boards and modules give you true simultaneous analog data acquisition---with no MUXing. Playing on a USB 2.0 network, up to a dozen separate 16-bit A/D channels operate with less than 1-ns aperture uncertainty. All analog and digital sub-system functions sample simultaneously to yield a data throughput of 225-kHz/channel.
Vehicle bus analyzer decodes CAN in symbolic format
Product News  
11/1/2005   Post a comment
If you're an automotive systems designer, check out these new scope adjuncts from LeCroy. The company claims it has the first oscilloscopes that can decode CAN Bus serial data into symbolic application-layer text.
Low-cost box converts PC into network analyzer
Product News  
11/1/2005   Post a comment
Ten-Tec's got a new RF vector network analyzer that's low in cost but provides quite a few of the capabilities of pricey bench-top analyzers that cost thousands. This unit works with your PC, covering 200-kHz to 120-MHz.
Series 9 DesignSuite integrating design and test
Product News  
11/1/2005   Post a comment
Executives said the release of Electronics Workbench Series 9 DesignSuite more tightly integrates design and test, the reason cited for National Instruments acquisition of the company earlier this year.


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