Book to celebrate ten years of DATE News & Analysis 11/15/2007 Post a comment Organizers of the Design Automation and Test in Europe (DATE) conference are celebrating ten years of the event with a book that collates 30 of the best papers presented at the event since its inception.
Teradyne rolls duo PCB tester News & Analysis 11/13/2007 Post a comment With the introduction of a PCB tester equipped with two independent test modules, Teradyne claims to effectively double throughput without doubling price and manufacturing floor footprint.
Battle-hardened veterans of the electronics industry have heard of the “connected car” so often that they assume it’s a done deal. But do we really know what it takes to get a car connected and what its future entails? Join EE Times editor Junko Yoshida as she moderates a panel of movers and shakers in the connected car business. Executives from Cisco, Siemens and NXP will share ideas, plans and hopes for connected cars and their future. After the first 30 minutes of the radio show, our listeners will have the opportunity to ask questions via live online chat.