Design Con 2015
Breaking News
Content tagged with Test & Measurement
posted in December 2001
A Time-Domain-Based Technique for Noise Measurements
News & Analysis  
12/14/2001   Post a comment
Although electronic noise is often a critical design parameter in an analog system, evaluation of noise performance of circuits that perform a frequency translation from RF to baseband is not easy to do. Torben Larsen and colleagues from Aalborg University in Denmark describe a time-domain-based technique to determine the noise factor of a device with a low desired output frequency.
Advantest doubles speed system-on-chip testing with new dynamic handler
News & Analysis  
12/13/2001   Post a comment
TOKYO -- Advantest Corp. has introduced a new dynamic test handler capable of doubling the throughput of high-end logic and system-on-chip testing by performing tests on up to eight devices simultaneously. The maximum throughput of 6,000 devices per hour is twice the capacity of the system's predecessor, Advantest said.
Electromagnetic-Compatibility Analysis Using TEM Cells
News & Analysis  
12/10/2001   Post a comment
Transverse-electromagnetic (TEM) cells are important structures for analyzing the electromagnetic compatibility (EMC) of electronic components. Kresimir Malaric of University of Zagreb, Croatia discusses the design and analysis of several types of TEM cells available for emission testing of small equipment, calibration of RF probes, and biomedical experiments.
Teradyne packs digital and image testing in parallel tester for CMOS sensors
News & Analysis  
12/5/2001   Post a comment
TOKYO -- Teradyne Inc.'s Japan Division today formally launched a new CMOS image sensor tester, which is capable of parallel testing devices with 25-MHz as the measurement frequency and data capture rate. The integrated system puts the power of a complete 100-MHz digital tester and an image sensor tester into the space of a single test head, Teradyne said.
Agilent rolls out low-cost tester for nonvolatile memory devices
News & Analysis  
12/3/2001   Post a comment
CHIBA, Japan -- During the Semicon Japan trade show here this week, Agilent Technologies Inc. will roll out a new member of its Versatest line of memory testers. Agilent will announce the Versatest Series Model V4100 TDS, a low-cost test development system for nonvolatile memory chips. Available at 40-, 70- and 100-MHz, the Model V4100 TDS enables the development of test programs, which, in turn, can be transferred to its Model V4400 tester for production purposes.


Top Comments of the Week
Flash Poll
Like Us on Facebook

Datasheets.com Parts Search

185 million searchable parts
(please enter a part number or hit search to begin)
EE Life
Frankenstein's Fix, Teardowns, Sideshows, Design Contests, Reader Content & More
<b><a href=Betajet">

The Circle – The Future's Imperfect in the Present Tense
Betajet
3 comments
The Circle, a satirical, dystopian novel published in 2013 by San Francisco-based writer Dave Eggers, is about a large, very powerful technology company that combines aspects of Google, ...

Max Maxfield

Recommended Reads From the Engineer's Bookshelf
Max Maxfield
6 comments
I'm not sure if I read more than most folks or not, but I do I know that I spend quite a lot of time reading. I hate to be idle, so I always have a book or two somewhere about my person -- ...

Martin Rowe

No 2014 Punkin Chunkin, What Will You Do?
Martin Rowe
2 comments
American Thanksgiving is next week, and while some people watch (American) football all day, the real competition on TV has become Punkin Chunkin. But there will be no Punkin Chunkin on TV ...

Rich Quinnell

Making the Grade in Industrial Design
Rich Quinnell
16 comments
As every developer knows, there are the paper specifications for a product design, and then there are the real requirements. The paper specs are dry, bland, and rigidly numeric, making ...

Special Video Section
The LT8640 is a 42V, 5A synchronous step-down regulator ...
The LTC2000 high-speed DAC has low noise and excellent ...
How do you protect the load and ensure output continues to ...
General-purpose DACs have applications in instrumentation, ...
Linear Technology demonstrates its latest measurement ...
10:29
Demos from Maxim Integrated at Electronica 2014 show ...
Bosch CEO Stefan Finkbeiner shows off latest combo and ...
STMicroelectronics demoed this simple gesture control ...
Keysight shows you what signals lurk in real-time at 510MHz ...
TE Connectivity's clear-plastic, full-size model car shows ...
Why culture makes Linear Tech a winner.
Recently formed Architects of Modern Power consortium ...
Specially modified Corvette C7 Stingray responds to ex Indy ...
Avago’s ACPL-K30T is the first solid-state driver qualified ...
NXP launches its line of multi-gate, multifunction, ...
Doug Bailey, VP of marketing at Power Integrations, gives a ...
See how to ease software bring-up with DesignWare IP ...
DesignWare IP Prototyping Kits enable fast software ...
This video explores the LT3086, a new member of our LDO+ ...
In today’s modern electronic systems, the need for power ...