A Time-Domain-Based Technique for Noise Measurements News & Analysis 12/14/2001 Post a comment Although electronic noise is often a critical design parameter in an analog system, evaluation of noise performance of circuits that perform a frequency translation from RF to baseband is not easy to do. Torben Larsen and colleagues from Aalborg University in Denmark describe a time-domain-based technique to determine the noise factor of a device with a low desired output frequency.
Advantest doubles speed system-on-chip testing with new dynamic handler News & Analysis 12/13/2001 Post a comment TOKYO -- Advantest Corp. has introduced a new dynamic test handler capable of doubling the throughput of high-end logic and system-on-chip testing by performing tests on up to eight devices simultaneously. The maximum throughput of 6,000 devices per hour is twice the capacity of the system's predecessor, Advantest said.
Electromagnetic-Compatibility Analysis Using TEM Cells News & Analysis 12/10/2001 Post a comment Transverse-electromagnetic (TEM) cells are important structures for analyzing the electromagnetic compatibility (EMC) of electronic components. Kresimir Malaric of University of Zagreb, Croatia discusses the design and analysis of several types of TEM cells available for emission testing of small equipment, calibration of RF probes, and biomedical experiments.
Teradyne packs digital and image testing in parallel tester for CMOS sensors News & Analysis 12/5/2001 Post a comment TOKYO -- Teradyne Inc.'s Japan Division today formally launched a new CMOS image sensor tester, which is capable of parallel testing devices with 25-MHz as the measurement frequency and data capture rate. The integrated system puts the power of a complete 100-MHz digital tester and an image sensor tester into the space of a single test head, Teradyne said.
Agilent rolls out low-cost tester for nonvolatile memory devices News & Analysis 12/3/2001 Post a comment CHIBA, Japan -- During the Semicon Japan trade show here this week, Agilent Technologies Inc. will roll out a new member of its Versatest line of memory testers.
Agilent will announce the Versatest Series Model V4100 TDS, a low-cost test development system for nonvolatile memory chips. Available at 40-, 70- and 100-MHz, the Model V4100 TDS enables the development of test programs, which, in turn, can be transferred to its Model V4400 tester for production purposes.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.