Multi-function BER tester pinpoints hits Product News 12/22/2003 Post a comment Here's a spanking new instrument from Noise/Com that will let you do eye mask, BER, and jitter tests for fast serial data streams. Use it in the lab or networked on the factory floor, or for more esoteric things such as semiconductor characterization.
Open-source planning tool helps make live voice-quality measurements Product News 12/19/2003 Post a comment Here's news of an open-source add-on tool for making meaningful voice quality measurements on all kinds of telephony gear---both wired and wireless.
Used during the design phase of a product, it can yield margin by avoiding customer-related issues in the field. It can also help you evaluate voice network performance.
Multi-slot optical test set supports FEC for 10GbE Ethernet G.709 Product News 12/17/2003 Post a comment The extension of LAN-based Ethernet into core networks has fueled the use of Gigabit Ethernet, and especially 10-Gigabit Ethernet as defined in the IEEE-802.3ae spec. Here's news of an optical test suite that can give you a look at a stack's Layer 1 and Layer 2 data flows, and even provide some Layer 3 transaction information, dishing up meaningful insight about IP packet errors, bit-error rates, and operational alarms. Unfortunately, the vendor is mum about price. Yuk!
Keithley combo checks semiconductor wear-out Product News 12/15/2003 Post a comment Test instrument maker Keithley Instruments now has available a semiconductor characterization system with software that runs under Windows. It now runs not only semiconductor characterization tests, but also stress-measure and reliability tests.
Users of this system can now run not only semiconductor characterization tests, but also stress-measure and reliability tests.
Optimism spreads to IC-equipment industry News & Analysis 12/11/2003 Post a comment After a period of little or no investment, chip makers are beginning to increase their capital spending, especially in China, Japan, and other regions, said James Morgan, chairman of Applied Materials Inc.
Software Concepts, Agilent roll "Mobile IP" connectivity test Product News 12/8/2003 Post a comment Instrument maker Agilent Technologies and embedded communications development house Software Concepts jointly announce modified versions of wireless test products. These products work together to deliver network emulation and Mobile IP connectivity for developers of wireless data applications.
Configuring Switch Systems for Cost-Effective Testing News & Analysis 12/8/2003 Post a comment Ideally a test engineer would connect a separate instrument to each test point of a Device Undergoing Test (DUT), thereby providing the highest performance and most accurate measurements. But this is costly and often unnecessary. Agilent Technologies' Chuck Reynolds explains that test engineers who choose carefully among a number of switch options will realize some attractive cost savings.
Opinion: Challenges confront RFIC, WLAN testers Product News 12/3/2003 Post a comment Prices of wireless devices are being squeezed constantly. That, in turn, means relentless downward price pressure on RF integrated circuits. One way to keep RFIC costs down is to achieve the lowest possible test cost. Here's a summary of the challenges in test.
Accord helps EEs model non-linear, microwave, RF devices Product News 12/3/2003 Post a comment Instrument supplier Anritsu is teaming up with EDA supplier Modelithics to give developers the ability to do characterization of frequency-translating devices such as microwave mixers, up- and down-converters, and frequency multipliers. Characterization of devices working at frequencies as high as 40-GHz is possible.
Blog That A-Ha Moment Larry Desjardin 10 comments Have you ever had an a-ha moment? Sure, you have. The Merriam-Webster dictionary defines it as "a moment of sudden realization, inspiration, insight, recognition, or ...