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Content tagged with Test & Measurement
posted in December 2005
Electronic rheostat provides decades of load resistance
Design How-To  
12/27/2005   Post a comment
Electronic rheostats deliver years of load resistance, fine-resolution resistance values, and better thermal management.
Signal creation software serves mobile WiMAX, WiBro
Product News  
12/21/2005   Post a comment
Test-and-measurement vendor Agilent Technologies releases signal creation software for mobile WiMAX and WiBro applications. The software runs on Agilent's microwave vector signal generators.
Audio analyzers are compact
Product News  
12/21/2005   Post a comment
Rohde & Schwarz is adding two compact audio analyzers to its Smart Instruments family. Models generate single-channel and dual-channel sinewave, two-tone, and noise signals.
Walter Hewlett to retire from Agilent's board
News & Analysis  
12/19/2005   Post a comment
Electronics supplier Agilent Technologies Inc. has announced that Walter Hewlett will retire as a director of the company effective March 1, 2006.
Strategische Test-Partnerschaft mit PTS in China
News & Analysis  
12/19/2005   Post a comment
GÖPEL electronic, Entwickler und Lieferant spezieller JTAG/Boundary Scan Lösungen, ist mit dem chinesischen Unternehmen Production Test Systems Ltd. eine umfassende Partnerschaft eingegangen.
50-MHz waveform generators include PLL capabilities
Product News  
12/19/2005   Post a comment
Although technologies such as microwave RF, RapidIO, and PCI Express occupy the leading-edge limelight these days, not everyone needs GHz-domain test gear. There are still many applications for lower-frequency equipment. Fluke Corp., for example, has some function generators for 50-MHz or lower applications.
ATE pin-driver chip provides differential drive and receive
Product News  
12/15/2005   Post a comment
Billed as the first IC to integrate differential drive and receive capabilities, the Semtech E7725 driver/window comparator is for ATE applications. The dual-channel chip combines signal drive and receive capabilities for single-ended and fully differential modes.
Battery powered vector network analyzers go afield
Product News  
12/14/2005   Post a comment
Anritsu's got two portable handheld vector network analyzers that can make vector-corrected 1-port and 1-path 2-port measurements from 2-MHz all the way out to 6-GHz. Weighing just 6-lbs, these VNAs can replace racks of benchtop gear, and their USB and Ethernet hooks give you the connectivity needed to transfer data to other lab equipment. eeProductCenter Tech Editor Alex Mendelsohn reports.
Fiber-optic panels backlight LCD displays for pressure test gauges
Product News  
12/14/2005   Post a comment
Lumitex has introduced fiber-optic panels that use a single LED light source for backlighting LCD displays in digital pressure test gauges.
OTN core switching tester gets OTU1 capabilities
Product News  
12/14/2005   Post a comment
Broadband communications test-and-measurement house Innocor adds OTU1 test capabilities to an existing next-generation test equipment line for OTN. The adjunct addresses the needs of transport applications that require FEC and OTN Digital Wrapper testing at 2.666-Gbit/s line rates.
Amplified Noise Source delivers wide 10 MHz to 6 GHz bandwidth in wireless test applications
News & Analysis  
12/14/2005   Post a comment
An amplified noise source, the NW6G-M features broadband frequency coverage from 10 MHz to 6 GHz, offering users a wide bandwidth while meeting the highest standards for todays’ tests.
Agilent unveils test software for mobile WiMAX
Product News  
12/12/2005   Post a comment
Agilent Technologies Inc. has introduced a software program that creates test waveforms for mobile WiMAX and WiBro applications.
LabVIEW USB link uses I2C, SPI to test consumer ADCs, EEPROMs
Product News  
12/11/2005   Post a comment
National Instruments has developed a new USB interface device – the USB-8451 - for use with inter-integrated circuit (I2C) and serial peripheral interface (SPI) communication devices.
125-Msample/s PCI digitizers will be modular, multi-channel
Product News  
12/9/2005   Post a comment
A line of single-slot PCI digitizers will feature up to eight channels, and up to 4-Gbytes of on-board acquisition memory. They will operate at sampling speeds up to 125-Msamples/s/channel, and come in at a cost of less than a kilobuck/channel.
USB pod helps develop and test serial devices
Product News  
12/7/2005   Post a comment
A simple plug-and-play USB-connected pod can be used with LabVIEW software to create programs to test, validate, and program devices such as LCDs, data converters, and memories.
PC-hosted oscilloscope plug-ins offer up to 16-bit resolution
Product News  
12/6/2005   Post a comment
Available in both 14-bit and 16-bit vertical resolution versions, here are PCI/PXI plug-in digitizer boards that pack benchtop oscilloscope features. Low noise, low distortion, and low-drift circuitry gives wide dynamic range. eeProductCenter's Alex Mendelsohn reports.
Shielded RF test chambers are manual or automatic
Product News  
12/6/2005   Post a comment
Bothered by EMI when making critical measurements at RF? Then check out these sealed test chambers from Rohde and Schwarz. They can be used manually on the bench, or in automated test suites during production.
Ever-expanding scope line sets memory depth benchmark
Product News  
12/5/2005   Post a comment
Agilent continues to debut new models in its Infiniuum Series of digital storage scopes and mixed-signal scopes. These instruments set benchmarks for deep-memory performance.
AC power analyzers measure active and reactive variables
Product News  
12/5/2005   Post a comment
Here's a range of compact power analyzers that measure all the active and reactive variables in a wide variety of industrial applications where space is limited. The new devices provide dual pulse output for energy pulse retransmission.
Low-power IC test can be trying
Design How-To  
12/5/2005   Post a comment
Power is at a premium across mainstream applications ranging from battery-powered personal appliances to multiprocessor server farms. For designers, power management means controlling leakage power lost during standby mode as well as dynamic power consumption when multiple transistors switch in unison to perform desired functions. Designers address increased leakage current at more-advanced nanometer technologies through techniques such as multivoltage-supply design, using lower-supply-voltage d


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