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Content tagged with Test & Measurement
posted in December 2006
Multi-function DMMs make 4-wire measurements with two test leads
Product News  
12/27/2006   Post a comment
Two 6-1/2-digit graphical DMMs sport 14 measurement functions, with ranges to measure temperature, capacitance, period and frequency. A 2 x 4 ohms function uses patented split terminal jacks that let you perform 4-wire measurements using only two leads instead of four. Click to read Senior Tech Editor Alex Mendelsohn's comments.
LXI leverages Ethernet for test
Product News  
12/26/2006   Post a comment
Focus-On: For decades, IEEE-488/GPIB served well in small- and medium-sized test systems, with VXI-based testers meeting the needs of high channel-count applications. Time marches on. Test engineers now seek high-bandwidth systems that are relatively easy to configure and are low in cost. Enter Ethernet-connected LXI.
3GPP wireless library eases way through evolving standard
Product News  
12/20/2006   Post a comment
Hastening next-generation mobile communications product development, Agilent Technologies rolls out its 3GPP LTE Wireless Library for use with the company's existing Advanced Design System EDA software. The library is expected to help you speed development of evolving 3GPP Long Term Evolution designs.
Agilent rolls oscilloscope-based DDR2 compliance test
Product News  
12/15/2006   Post a comment
Test-and-measurement equipment supplier Agilent Technologies debuts what it says is the industry's first oscilloscope-based DDR2 compliance test application. It runs on two of the company's scope lines.
Single-chip comprises THD analyzer
Product News  
12/14/2006   Post a comment
Build your own test gear. Specialized IC supplier Mixed Signal Integration has a nifty CMOS chip that can measure THD. The device is a single-chip 1/6th octave-wide five-harmonic distortion analyzer.
Data acquisition modules connect through USB
Product News  
12/14/2006   Post a comment
Connecting data-acq modules to a computer couldn't be any easier than plugging them into a USB port. Here's the first module in a family of USB modules that ultimately will include reed relay, Form C relay, optically isolated input, TTL interfaces to solid-state relays,and A/D and D/A types.
Understanding SDRs and their RF Test Requirements, Part 2
Design How-To  
12/13/2006   Post a comment
Part 2 of this article takes a closer look at how to use a signal analyzer and vector signal generator to emulate the behavior of the SDR's receiver and transmitter.
Consortium preps multicore CPU benchmarks
News & Analysis  
12/12/2006   Post a comment
The Embedded Microprocessor Benchmark Consortium (EMBC) has started work on a standard suite of tests to measure performance of multicore processors and expects a benchmark suite could be available in six to eight months.
Lavi Lev takes helm at Credence Systems
News & Analysis  
12/8/2006   Post a comment
Lavi Lev has left Cadence Design Systems to become president and CEO of Credence Design Systems, as the troubled automatic test equipment (ATE) provider posts a $481.6 million loss for its fiscal 2006.
Mini data-acq controllers accommodate up to 600 I/O ports
Product News  
12/6/2006   Post a comment
Here's news of a family of miniature slow-speed data logger/recorders that accommodate plug-in I/O cards. Up to 600 channels of signal data can be acquired at sample rates up to 100-samples/s on each channel.
Portable OTDR troubleshoots optical fiber waveguides, connectors
Product News  
12/5/2006   Post a comment
eeProductCenter Senior Tech Editor Alex Mendelsohn reviews Anritsu Instruments's ACCESS Master MT9083A Series. They're all-in-one field-measuring OTDRs for optical network test.
Agilent fields Draft-802.11n MIMO test solution
Product News  
12/5/2006   Post a comment
A MIMO upgrade kit is available for customers who own the N4010A test set.
Signal integrity analyzers encompass triple-domain measurement
Product News  
12/5/2006   Post a comment
Slated for signal integrity analysis during design, characterization, and production, test-and-measurement maker Wavecrest is rolling out a family of all-in-one triple-domain signal analyzers for testing clock circuits, PLLs, and oscillators.
$8000 software is free to Agilent and Yokogawa realtime oscilloscope users
Product News  
12/4/2006   Post a comment
Focusing on clock and timing engineering and related measurement science, Amherst Systems Associates announces a North American kickoff of a program that will aggressively give away premium oscilloscope analysis and productivity software. The company's M1 Oscilloscope Tools will go to targeted users of Agilent and Yokogawa realtime oscilloscopes.
What good is an automobile without its battery?
Design How-To  
12/4/2006   Post a comment
Today's cars are extremely dependent on their electronics and, in turn, on the battery. Continuously monitoring the battery's condition is critical to vehicle dependability and reliability.
Characterizing and troubleshooting wide-band RF systems
Design How-To  
12/4/2006   Post a comment
Troubleshooting an RF design requires the ability to trace a signal from baseband to a wide band digitally modulated RF output. Advanced real-time spectrum analyzers (RTSAs) can be used to facilitate the acquisition, measurement, and analysis of digitally-modulated and pre-distorted RF signals.

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Leonard Nimoy, We'll Miss you
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Like many of you, I was saddened to hear the news of Leonard Nimoy's death. His Star Trek character Mr. Spock was an inspiration to many of us who entered technical fields.

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