ODM module tests fiber-optic networks Product News 12/20/2007 Post a comment JDSU has introduced the Optical Dispersion Measurement (ODM) module for its T-BERD/MTS-6000 and T-BERD/MTS-8000 optical test platforms, which is used for field testing fiber-optic networks.
Certification begins for mobile WiMAX products News & Analysis 12/20/2007 Post a comment Certified Mobile WiMAX products should start appearing on the market early next year as the WiMAX Forum said that suppliers vendors can start submitting their 2.3 GHz and 2.5 GHz gear for testing to the forum's lead certification lab at AT4 Wireless in Spain.
Probe card lowers IC test cost Product News 12/14/2007 Post a comment FormFactor, Inc. has expanded its TrueScale probe card family for wire bond SoC devices with the introduction of its PP40 wafer probe card. This probe card enables high-efficiency and high-parallelism wafer probing on advanced wire bond logic and SoC devices.
Sidebar: UWB Test Methodology Design How-To 12/13/2007 Post a comment This test focused on measuring UWB throughput over wireless and coaxial media. We have uploaded the latest drivers for all the devices under test from the manufacturer's web sites.
Chip test startup raises $16 million News & Analysis 12/10/2007 Post a comment Israeli Startup Optimal Test, which has developed a test suite for maximizing IC yields through managed test results, has raised $16 million in a second round of financing. The round was led by Evergreen Venture Partners, with the participation of the existing investors – Carmel Ventures and Pitango.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.