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Content tagged with Test & Measurement
posted in February 2002
New IC-testing requirements will rescue ATE market in 2002, say Schlumberger executives
News & Analysis  
2/21/2002   Post a comment
SAN JOSE -- The automatic test equipment (ATE) business fell a staggering 64.2% in 2001 over 2000, but the market should rebound and achieve modest growth in 2002, according to executives from Schlumberger Semiconductor Solutions here today. The worldwide ATE market suffered its worst downturn in history last year, falling from $6.7 billion in terms of sales in 2000, to $2.4 billion in 2001, according to VLSI Research Inc. of San Jose.
LogicVision, National create IC for remote mixed-signal test using bus standard
News & Analysis  
2/13/2002   Post a comment
SAN JOSE -- LogicVision Inc. and National Semiconductor Corp. today announced joint development of the industry's first IC supporting the new IEEE 1149.4 mixed-signal test bus, which potentially opens the door for a new level of remote diagnostics of systems.
Advantest aims to outgrow tester market in sluggish 2002
News & Analysis  
2/12/2002   Post a comment
SANTA CLARA, Calif. -- It could be another tough year in the automatic test equipment (ATE) business, where the worldwide market is projected to be relatively flat in 2002 compared to 2001, said a top executive with Japan's Advantest Corp. in an interview this week.
Advantest steps up SoC test development in new U.S. R&D center
News & Analysis  
2/12/2002   Post a comment
SANTA CLARA, Calif. -- Japan's Advantest Corp. here has established a new U.S. R&D center that will help develop a future line of automatic test equipment (ATE) for system-on-a-chip (SoC) designs, according to the company's top U.S. executive.
Keithley teams with probe supplier GGB to offer wafer-level parametric testing
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2/8/2002   Post a comment
CLEVELAND -- Keithley Instruments Inc. here has entered into a partnership with GGB Industries Inc. of Naples, Fla., to share technical and marketing support for each other's products in semiconductor wafer-level parametric testing.
Tektronix to use IBM's 0.18-micron SiGe in future test instruments
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2/7/2002   Post a comment
BEAVERTON, Ore. -- Tektronix Inc. here today announced plans to use next-generation 0.18-micron silicon-germanium (SiGe) technology from IBM Corp. in test instruments, such as digital oscilloscopes.


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