Fluke unveils 5-kV insulation tester Product News 2/20/2004 Post a comment Featuring an incremental ramp function, automatic key parameter calculations, and a Windows PC interface, Fluke Corp.'s got a new battery-powered portable that's a 5-kV insulation resistance tester. The safety-rated meter provides insulation resistance testing up to 1-teraohm.
PXI Systems Alliance releases new PXI 2.1 specs Product News 2/19/2004 Post a comment The PXI Systems Alliance announces the release of new PXI 2.1 specs. These are expected to enhance PXI requirements, and separate hardware and software specifications, permitting each to evolve separately in the future as required by PXI standards.
RF test set makes cost-effective WLAN, Bluetooth tests Product News 2/18/2004 Post a comment Test-and-measurement giant Agilent Technologies has a new wireless connectivity tester that includes an option that can speed up measurements and improves accuracy. That's just the ticket for high-volume manufacturing. This test set isn't just a Bluetooth tester. It can be used with a variety of RF connectivity schemes, including most of today's and tomorrow's wireless data technologies.
A/D converter achieves 7.5 ENOB at 1.6 GHz Product News 2/17/2004 Post a comment National Semiconductor Corporation announced a CMOS analog-to-digital converter that requires 75 percent less power than most comparable products on the market. The 8-bit ADC081000 digitizes signals at sampling rates up to 1.6 GHz while consuming just 1.4 watts from a 1.9 volt nominal supply.
Automated test summit's coming to a city near you! Product News 2/13/2004 Post a comment Hosted by data-acq and test instrument maker National Instruments and partners, The 2004 Automated Test Summit looks like it's shaping up as a nifty way to explore developments in test-and-measurement, and to learn new test strategies and techniques.
Precision calibrator tests AC wattmeters, watt-hour meters Product News 2/10/2004 Post a comment Here's news of automated and network-ready instrumentation that can substitute for lash-ups of individual voltage sources, current sources, and phase-angle meters when making AC mains tests. One adjunct serves as a primary watt and watt-hour standard, where it ensures traceability to NIST and other worldwide standards.
Opinion: Rack-and-stack instruments are often a better choice than VXI or PXI systems Product News 2/9/2004 Post a comment At first blush, PXI and VXI test systems can appear integrated and efficient, but shortcomings such as unreliable operating systems and software, packaging restrictions, and limited mixed-vendor support can significantly undermine their value. On the other hand, rack-and-stack ATE systems of mature and robust instruments, tied together with proven interfaces, can provide equal or higher value at lower cost of ownership and much better reliability.
Modular test system gets Serial Attached SCSI boost Product News 2/6/2004 Post a comment High-speed data storage test equipment maker I-TECH announces that it now has Serial Attached SCSI analysis support for its existing modular storage tester. This add-on makes the system a multi-protocol tester for analysis and monitoring of storage devices and infrastructure. With the popularity of SAS on the rise, this announcement of an upgrade to the mainframe is timely.
Tek adds clock recovery module to signal analyzers, scopes Product News 2/6/2004 Post a comment If you use test gear for cutting-edge serial data standards such as XAUI, SATA, or 10 GbE, scope maker Tektronix now has a clock recovery module for use with the company's 8000 Series Communication Signal Analyzers and sampling scopes. You can test optical and electrical serial data signals from 50-Mbits/s to as high as 40-Gbits/s.
Gbytes of acquisition memory land on CompactPCI/PXI platforms Product News 2/4/2004 Post a comment Board-level test-and-measurement and data-acq vendor Gage Applied Technologies is releasing very large memory options for CompactPCI/PXI platforms. Gage has adapted its hardware and software, previously only available for the PCI platform, to create digitizers with up to 2-Gbytes of on-board acquisition memory.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.