Lab test system gets handset trace capability Product News 2/28/2006 Post a comment RF test equipment vendor Aeroflex adds handset trace capability to its existing SystemAT test system. The SystemAT is used for regression testing wireless network software prior to rollout, and handset validation/interoperability testing. It also accommodates network load and capacity testing.
PCI-X board runs parallel TI DSPs Product News 2/27/2006 Post a comment Designed for high-speed I/O and processing, here's news of a board-level PCI-X drop-in that harnesses the power of up to nine TI TMS320C6414T DSPs. With that you can get over 2000-Mbytes/s of concurrent I/O, and the ability to combine any number of customer-specific channels of data for up to 500-Mbytes/s of continuous data input from an external source.
USB data-acq modules synchronously sample multiple analog signals Product News 2/23/2006 Post a comment Check out this series of analog-input multi-function data acquisition modules for USB 2.0. They provide two or four channels of simultaneous 16-bit analog measurement at throughput speeds up to 2-MHz/channel. Each channel has its own 16-bit A/D converter that uses a common clock and trigger for synchronous sampling of all analog and digital inputs at the exact same instant in time.
Video tester gets HDMI CEC support Product News 2/22/2006 Post a comment Providing a Consumer Electronic Control test approach, ranging from development through pre-compliance testing, video test maker Quantum Data now has an HDMI CEC development and compliance test suite for its existing test equipment. CEC is an HDMI option that provides automatic power-on, automatic signal routing, and single-point remote control for CEC-enabled products.
High-speed XMC data-acq board packs Virtex-4 FPGA Product News 2/22/2006 Post a comment Designed for high-speed data acquisition applications such as software-defined radio, SIGINT, tactical communications, and radar, here's a VITA 42 board that can simultaneously sample two inputs at frequencies up to 210-MHz, at a resolution of 12 bits. Total aggregate I/O bandwidth is 12.5-Gbits/s.
Probe targets Serial RapidIO, PCI Express Product News 2/21/2006 Post a comment Check out this Serial RapidIO protocol analysis probe. An optional modification can add PCI Express analysis capability. The probe works with most Agilent Technologies 16700 and 16900 logic analyzer modules.
How much test compression is enough? Design How-To 2/20/2006 Post a comment Scan compression is necessary, but you can reach a point of diminishing returns with test data volume reduction (TDVR), says Synopsys' Chris Allsup. This article shows you how to determine what you really need.
TechWing vows to fight patent claim News & Analysis 2/17/2006 Post a comment TechWing Inc., the Korean IC test equipment maker locked in a patent dispute with Advantest Corp., said it will fight the Japanese company's petition in a Taiwan court.
Yokogawa expands in Singapore News & Analysis 2/15/2006 Post a comment Yokogawa Electric plans to ramp up investment in its regional headquarters in Singapore as part of an effort to boost the company's presence in Southeast Asia.
Event-identification signal-integrity software searches scope waveform data Product News 2/14/2006 Post a comment Event identification software lets users of Agilent Infiniium oscilloscopes identify signal integrity problems. The software works by scanning through thousands of acquired waveforms/s and then isolating anomalous signal behavior. This brings the company's scopes closer to the mythical Find Problem button that would let a scope automatically inspect each signal it acquires and inform the user of any signal integrity problems it discovered.
Low-noise oscilloscopes have upgradeable bandwidths Product News 2/14/2006 Post a comment Scope maker Agilent Technologies is dishing up a new oscilloscope series the comapny claims has the industry's lowest-noise floors. These boxes are also bandwidth-upgradeable. You can choose versions exhibiting exceptionally flat responses to 2-GHz out to 13-GHz bandwidth.
Study: global PCB test gear market to grow News & Analysis 2/13/2006 Post a comment Global PCB automatic test equipment (ATE) manufacturers are set to get a major share of their revenues from functional testing and the boundary scan segment the next five years, according to a study by Frost and Sullivan.
Spirent acquires VoIP test company News & Analysis 2/13/2006 Post a comment Communications technology company Spirent Communications has acquired QuadTex Systems, a supplier of test tools for Internet protocol multimedia subsystem and Voice-over-IP testing, for $7.5 million in cash.
HSDPA user-equipment tester checks throughput Product News 2/13/2006 Post a comment Wireless analysis provider Spirent Communications announces the latest member of its WCDMA testing family of products. Spirent's User Equipment Performance Tester is designed to accelerate the deployment of next generation wireless. Its platform can evaluate all aspects of data throughput for HSDPA and the R99 recommendation, from the physical layer to the application layer.
Advantest expands patent fight to Taiwan News & Analysis 2/9/2006 Post a comment Test equipment vendor Advantest Corp., which is locked in a patent dispute with Korean-based TechWing Inc., has petitioned a Taiwan court to temporarily block imports of TechWing's memory test handlers.
Analysis software tests playback-only audio gear Product News 2/8/2006 Post a comment Here's news of some application-specific software that can help you use a line of audio analyzer hardware to test MP3 and CD players, and other personal audio equipment. Sales of personal audio gear is forecast to double or even quadruple in the next five years, so testing is shaping up as a crucial competitive differentiator.
Serial data analyzer tests 10-Gbit/s signals, and beyond Product News 2/7/2006 Post a comment Aimed at PCI Express 2, FB-DIMM, 8X Fibre Channel, and SONET testing, here's an instrument that's optimized for testing serial data at speeds to 10-Gbits/s---and faster. It runs a suite of diagnostic tools that generate detail about the performance of a device; even those exhibiting complex jitter behavior.
PCIe compliance software suite speeds in-depth characterization testing Product News 2/7/2006 Post a comment Dishing up parallel bit-error-ratio test software that enables compliance and characterization testing for PCI Express, Agilent Technologies announces this capability for its existing parallel BERTs. This automated tool is for multi-lane PCIe receiver tolerance compliance and so-called deep-dive in-depth characterization testing.
Jitter compliance software serves serial Gbit designs Product News 2/6/2006 Post a comment Giving you upgraded measurement capability for its existing serial bit-error-ratio tester, Agilent Technologies announces the industry's first compliance test suite for jitter-tolerance testing of serial gigabit receivers operating at data rates up to 12.5-Gbits/s. Covered standards now include PCI Express Gen2, S-ATA, Fibre Channel 4G/8G, FB-DIMM, CEI 6/11G, 10-Gbit Ethernet, and XFP.
Nano is Everywhere, but What's Next? News & Analysis 2/6/2006 Post a comment With all the interest in nanotechnology and many discoveries already made, it's still a somewhat "wild and wooly" nano-world. In the past, as new frontiers were explored, they were measured and mapped so that others could follow the trail, verify the route and lead still more on to build and develop the "New World". In the nano world, one of the biggest challenges is "What do we use to draw the map?" What will it take to move it from a headline and make the work of the pioneers accessible to tho
Go-no-go hardware does point-of-return Bluetooth tests Product News 2/2/2006 Post a comment Communications test equipment vendor Willtek Communications has what it claims is the industry's first commercial Go-No-Go tester for Bluetooth wireless-equipped products. Priced at less than $1200, the company's wares are intended for exercising Bluetooth-enabled cellphones in field service shops where point-of-return testing is typically done.
Bluetooth tester gets Enhanced Data Rate hooks Product News 2/1/2006 Post a comment As the Bluetooth wireless phenomena becomes all-pervasive, more designers are compelled to adopt the technology. But, the complexity of the protocol, and the difficulty of working with RF at 2.4-GHz, can present challenges and struggles. What's needed is a way to test to a known set of parameters, using an instrument traceable to published standards. That's where Anritsu's latest Bluetooth test set comes in. eeProductCenter Senior Tech Editor Alex Mendelsohn reports.
Low cost portable oscilloscopes provide long capture times Product News 2/1/2006 Post a comment Oscilloscope maker LeCroy is extending its line of portable oscilloscopes. One of these new scopes is priced at less than $3000. Versions are available with bandwidths of 100-MHz, 200-MHz, 350-MHz, and 500-MHz, and all offer 2-Gsamples/s sample rates, with 500-kpoint memories.
In conjunction with unveiling of EE Times’ Silicon 60 list, journalist & Silicon 60 researcher Peter Clarke hosts a conversation on startups in the electronics industry. One of Silicon Valley's great contributions to the world has been the demonstration of how the application of entrepreneurship and venture capital to electronics and semiconductor hardware can create wealth with developments in semiconductors, displays, design automation, MEMS and across the breadth of hardware developments. But in recent years concerns have been raised that traditional venture capital has turned its back on hardware-related startups in favor of software and Internet applications and services. Panelists from incubators join Peter Clarke in debate.