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Content tagged with Test & Measurement
posted in February 2008
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Rohde & Schwarz adds MIMO precoding to its LTE signal generators
Product News  
2/29/2008   Post a comment
By including the latest revisions of the 3GPP LTE standard in the firmware, Rohde & Schwarz is enabling greater test flexibility at lower cost.
Agilent scopes boast industry's biggest display, fastest waveform update rate
Product News  
2/28/2008   Post a comment
Agilent Technologies Inc. has introduced 10 new oscilloscope models with bandwidths up to 1 GHz and a memory waveform update rate of up to 100,000 waveforms per second.
Avoiding noise and EMI problems in DSP systems
Design How-To  
2/28/2008   Post a comment
Noise and EMI can disrupt the operation of a DSP system or cause the design to fail FCC certification. Here's how to avoid these problems with PCB layout and return path decoupling.
ARM tools add support for DaVinci and OMAP35x
Product News  
2/27/2008   Post a comment
The ARM RealView family of development tools will provide enhanced support for the Texas Instruments DaVinci and OMAP35x platforms, including the recently-released DaVinci TMS320DM355 digital media processor and OMAP35x processors.
Power mode technologies verify today's SoCs
Design How-To  
2/27/2008   Post a comment
The power architectures on today's power-cycled system-on-chip designs can be distressingly complex.
Analyst: Inspection systems provider Camtek should be sold
News & Analysis  
2/26/2008   Post a comment
Automated optical inspection (AOI) systems maker Camtek Ltd. (Migdal Haemek, Israel) should prepare itself to be acquired by one of the larger providers of semiconductor equipment, according to a new research note by the investment house Oppenheimer Israel.
Complex SoC Testing with a Core-Based DFT Strategy
Design How-To  
2/26/2008   Post a comment
Using a core-based test strategy combined with scan compression offers one of the most effective ways to limit both huge data volumes and high power consumption of complex SoC tests.
IBM, AMD claim first EUV 'test chip'
News & Analysis  
2/26/2008   Post a comment
Advanced Micro Devices Inc.--along with partner IBM Corp.--claim that they have produced a working ''test chip'' utilizing extreme ultraviolet (EUV) lithography for the critical layers in a device.
Instrument combines pulse and digital delay generator characteristics
Product News  
2/26/2008   Post a comment
Berkeley Nucleonics has released a new pulse and delay generator platform, combining the characteristics of a pulse generator with a digital delay generator in a single benchtop instrument.
Rohde & Schwarz RF switching matrix handles all types of automated tests
Product News  
2/25/2008   Post a comment
Users can deploy the controllable switch platform to set up calibration systems, switch test instruments and amplifiers in a test system, or multiplex devices under test (DUTs).
Aeroflex : Radio test set now has an RF spectrum analyzer option
Product News  
2/25/2008   Post a comment
Aeroflex has announced an RF spectrum analyzer option for the 3500 hand-held 1 GHz radio test set. The option allows users to see the signal they are receiving instead of just the frequency.
New ways to measure torque
Design How-To  
2/23/2008   Post a comment
If you have not upgraded your torque measuring and controlling apparatus recently, be prepared to find new systems that are fast, accurate, flexible, inexpensive, require less maintenance and are simpler to install. See how they can help.
Given Imaging's Q4 revenue jumps 25%
News & Analysis  
2/22/2008   Post a comment
Revenues of Given Imaging Ltd. (Yoqneam, Israel), a startup that supplies a camera which can be swallowed to obtain pictures of the digestive tract, increased 24.8 percent to $34.2 million compared to $27.5 million in the fourth quarter of 2006.
Multi-band mobile WiMAX receiver helps accelerate global network deployments
News & Analysis  
2/22/2008   Post a comment
Agilent Technologies has introduced a measurement receiver for Mobile WiMAX, extending the technology support of its existing drive test receiver platform.
Aeroflex/AT4 wireless conformance test systems designated official test equipment for WiMAX Certification
News & Analysis  
2/22/2008   Post a comment
Aeroflex and AT4wireless have announced that the WiMAX Forum has designated the Aeroflex/AT4 wireless MINT223x protocol conformance test (PCT) system and AT4 wireless MINT T2110 radio conformance test (RCT) system as official test equipment for WiMAX Certification (802.16-2005).
Anritsu's analyzers add options for advanced HSDPA and W-CDMA
Product News  
2/21/2008   Post a comment
Both analyzers incorporate advanced DSP and parallel-measurement technologies to dramatically reduce manufacturing and inspection test times.
Analyzers test next-gen data rates, Tx/Rx characteristics
Product News  
2/21/2008   Post a comment
Anritsu Company has introduced HSDPA high data rate and W-CDMA band XI test options for its MT8820B/MT8815B radio communication analyzers.
802.11n test tool addresses early stages of product development
Product News  
2/21/2008   Post a comment
VeriWave, Inc. has expanded its WLAN performance testing and analysis portfolio by delivering what it claims is the first 802.11n debugging, troubleshooting and device test tool to address the early development stages of 802.11-compliant devices.
KLA-Tencor to buy Belgian T&M gear maker
News & Analysis  
2/21/2008   Post a comment
Chip tool maker KLA-Tencor Corp (San Jose, Calif.) is to buy Belgian inspection equipment specialist ICOS Vision Systems Corporation NV in a deal valued at $465.8 million (Euros 316.9 million).
LeCroy scope receives PCI-SIG approval
Product News  
2/20/2008   Post a comment
LeCroy Corp. has announced that its SDA 13000 serial data analyzer has been approved by the PCI-SIG for PCI-Express Gen 2 add-in card testing using SigTest.
8-bit PCI digitizer offers more data-acquisition options
Product News  
2/20/2008   Post a comment
Agilent Technologies has introduced two new options for its compact, low-power, high-speed Acqiris 8-bit PCI digitizer.
NI LabVIEW 8.5 module delivers more model-based control
Product News  
2/20/2008   Post a comment
National Instruments has released the NI LabVIEW 8.5 Control Design and Simulation Module, as an extension to its LabVIEW graphical system design platform.
Hall-effect sensor/ASIC integration shrinks current transducers (Part 2 of 2)
Design How-To  
2/20/2008   Post a comment
Technology advances allow for flexibility in installation and use of these versatile current sensors
PCI and PXI interfaces deliver NI LabVIEW to PROFIBUS networks
Product News  
2/19/2008   Post a comment
National Instruments has introduced PCI and PXI PROFIBUS interfaces that enable NI LabVIEW software to be integrated into benchtop, real-time and device test PROFIBUS networks.
ORL module provides key measurement for optical passive components
Product News  
2/19/2008   Post a comment
Yokogawa Corporation of America has released an optical return loss (ORL) module for its modular rack-mounted AQ2200 Multiple Application Test System (MATS).
Wireless UWB HD video: Appendix A: Test methodology
Design How-To  
2/19/2008   Post a comment
This article describes the test methodology employed by octoScope to test Radiospire's wireless, uncompressed HD video
Wireless HD video: Raising the UWB throughput bar (again)
Design How-To  
2/19/2008   Post a comment
This article reviews the promise and technical challenges facing UWB, reports on the most recent test results, and analyzes a particular approach to UWB. It also discusses the throughput and encryption considerations for HD video distribution.
40G transport module adds field installation, maintenance testing
Product News  
2/19/2008   Post a comment
JDSU has introduced a 40G Transport module, a field installation and maintenance tester, to its T-BERD/MTS-8000 platform.
Agilent Technologies and Anite claim first-to-market LTE UE protocol tester
News & Analysis  
2/19/2008   Post a comment
Agilent Technologies and Anite have introduced the first product in a planned portfolio of 3GPP LTE R&D test products developed on Agilent's new E6620A LTE UE test platform.
Entry level microwave spectrum analyzer targets WiMAX, WCDMA and other mobile applications
News & Analysis  
2/17/2008   Post a comment
The portable FSL18 18-GHz spectrum analyzer from Rohde & Schwarz expands the company's product portfolio for spectrum analysis to meet the increasing demand for compact instruments in applications such as the installation and maintenance of WiMAX networks.
Which current sensor for power measurement?
Design How-To  
2/16/2008   Post a comment
Solid-core or split-core transformer technology for your application? Take a close look at the various types to help you make the best high-performance, cost-effective decision.
Rohde & Schwarz unveils mobile spectrum analyzer for WLAN, WiMAX, WCDMA
Product News  
2/15/2008   Post a comment
The R&S FSL18's I/Q demodulation bandwidth plus the software capabilities of the R&S FSL family to make it only instrument in its class to support the WLAN, WiMAX and WCDMA standards.
Aeroflex portable RF spectrum analyzer delivers high-performance
Product News  
2/15/2008   Post a comment
The P25 tests will include C4FM modulation fidelity, frequency error, power and symbol deviation measurements.
Measurement receiver speeds up mobile WiMAX deployment
Product News  
2/15/2008   Post a comment
Agilent Technologies has introduced a measurement receiver that enables the deployment, optimization and troubleshooting of mobile WiMAX networks by identifying coverage and interference problems.
Agilent, Anite partner on LTE UE protocol tester
Product News  
2/14/2008   Post a comment
Agilent Technologies and Anite plc have introduced the first product in a portfolio of 3GPP LTE R&D test products based on Agilent's new E6620A LTE UE test platform.
Real-time signaling analyzer incorporates LTE, SAE technology
Product News  
2/13/2008   Post a comment
Agilent Technologies has extended its signaling analyzer real-time platform to include LTE and SAE technology.
IXIA to demo mobile network testing with real-world triple-play traffic
Product News  
2/13/2008   Post a comment
Ixia plans to demonstrate the industry's first real-world, triple-play testing for Gateway GPRS Support Nodes (GGSNs) at the Mobile World Congress using its newly enhanced IxLoad 4.10 application
Agilent adds WiMAX manufacturing test support for Sequans Wave 2 chipset
Product News  
2/12/2008   Post a comment
Agilent adds WiMAX calibration and verification software to its one-box wireless networking test set for WiMax devices based on the Sequans Wave 2 chipset.
MIPI D-PHY test solution delivers digital serial analysis for mobile devices
Product News  
2/11/2008   Post a comment
Agilent claims the industry's first MIPI D-PHY protocol test solution that supports the Camera Serial Interface (CSI-2) and Display Serial Interfaces (DSI) for mobile devices.
Instrument-grade pre-emphasis processor supports key serial data standards
Product News  
2/11/2008   Post a comment
SyntheSys Research's BERTScope DPP is a 12.5 Gbit/s instrument capable of programmable three-tap pre-emphasis for compliance testing to many standards, including 10G BASE-KR, serial attached SCSI and 8 GT/s PCI Express.
Economy-class microwave analog signal generator delivers fast switching
Product News  
2/8/2008   Post a comment
Agilent Technologies has announced the availability of a compact microwave analog signal generator that provides fast switching speeds and frequency coverage to 20, 32 or 40 GHz.
DesignCon 2008: product roundup
Product News  
2/7/2008   Post a comment
Missed DesignCon 2008? Get all the latest and greatest product announcements here.
National Instruments acquires MicroLEX
News & Analysis  
2/7/2008   Post a comment
National Instruments is expanding its presence in the professional and consumer video and audio testing market with the acquisition of MicroLEX Systems A/S.
LTE test solution provides fast evaluation of uplink/downlink signals
Product News  
2/7/2008   1 comment
Anritsu Company has introduced three software packages for its MS269xA signal analyzer series that create a tool to support the evaluation of 3GPP LTE uplink and downlink signals.
National Instruments releases USB digitizers, digital multimeter for portable measurement
Product News  
2/7/2008   Post a comment
National Instruments introduces the USB-5132/5133 digitizers and NI USB-4065 digital multimeter with bus-powered and plug-and-play operation for portable, benchtop and OEM applications.
12.5 Gbits/s test instrument delivers programmable 3-tap pre-emphasis
Product News  
2/7/2008   Post a comment
SyntheSys Research has introduced its BERTScope Digital Pre-Emphasis Processor. The company said it is the industry's first 12.5 Gbits/s instrument capable of programmable 3-tap pre-emphasis for compliance testing to high-speed serial data standards.
Automated compliance test tool supports UWB, Serial ATA and PCIe Gen 1
Product News  
2/6/2008   Post a comment
LeCroy Corp. has enhanced its QualiPHY automated serial data compliance test framework for high-speed data standards with analysis software packages for UltraWideband, Serial ATA and PCI Express Gen 1.
Precision waveform analyzer touts lowest intrinsic jitter
Product News  
2/6/2008   Post a comment
Agilent Technologies has introduced a precision waveform analyzer for design verification and validation of high-speed electrical communications systems and components.
Tektronix uses National Instruments' tester in Serial ATA effort
News & Analysis  
2/6/2008   Post a comment
Tektronix Inc. unveiled a new compliance test suite for Serial ATA based on National Instruments Inc.'s TestStand platform.
Physically Aware Test Development
Design How-To  
2/5/2008   Post a comment
Manufacturers and designers are forced to look at new test techniques to get better correlation between the test and final applications. These new test techniques, which typically use physical design information to handle complex defect mechanisms, are the result of experience with the processes and research into the various failure mechanisms from both industry and academia.
Page 1 / 2   >   >>


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