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Content tagged with Test & Measurement
posted in February 2012
High temperature effects on wafer test probing processes
Design How-To  
2/29/2012   Post a comment
Automated probe mark analysis replaces time-consuming manual analysis, delivering statistically valid quantitative data in an easy-to-interpret format in minimal time. It enables the test engineer to rapidly assess the probing process, identify and analyze issues within the process and define solution options.
Visure Solutions announces test management extension for IRQA
Product News  
2/27/2012   Post a comment
Visure Solutions has integrated test management into its IRQA requirements engineering solution.
Network auto-tester sets speed and simplicity benchmark for Ethernet connectivity test
Product News  
2/27/2012   Post a comment
With one touch of a button, the LinkRunner AT performs six essential connectivity tests and returns the results to the user in less than 10 seconds, paying for itself in about a month.
ISO 26262 cuts electronics complexity risks: Pt. 1- Requirements and assessment flow
Design How-To  
2/23/2012   2 comments
Future development and integration of automotive safety functions will strengthen the need to have safe system development processes and to provide evidence that all reasonable safety objectives are satisfied. ISO 26262 provides guidance to reduce these risks to a tolerable level by providing feasible requirements and processes.
EDA/IP Weekly Roundup – Feb 22nd
Blog  
2/22/2012   Post a comment
Agilent, Premier Farnell, Real Intent, Verific, Blue Pearl, Elliptic, Cyclos and Cadence made the lineup today. See here for their news…
Audio analyzer offers direct PDM interface for MEMS microphone testing
Product News  
2/22/2012   Post a comment
The APx PDM option allows APx500 series audio analyzers to connect directly to any device with a PDM input or output, enabling comprehensive testing of audio in the fast-moving telecom industry.
Test problems grow as chip integration increases
News & Analysis  
2/18/2012   6 comments
As the level of chip and component integration increases, so too does the problem testing the ever more intricate products, with engineers struggling to keep up.
Industry considers counterfeit risk analysis tool
Blog  
2/17/2012   11 comments
Obsolescence, market shortages and price hikes are the key motivational factors for counterfeiters to target a part and make a quick buck, according to data compiled by electronic components database firm SiliconExpert Technologies.
Viewpoint: An Evolution in Design for Test
Blog  
2/16/2012   1 comment
Designers relate to Design for Test (DFT) in much the way that small children relate to scary programs on TV: if they cover their eyes with their hands, perhaps it will go away…
Eight-channel RF measurement broadens LTE analysis
Product News  
2/15/2012   Post a comment
Agilent Technologies Inc. has enhanced its N7109A multi-channel signal analyzer for emerging multichannel LTE, LTE-Advanced and MIMO RF measurement requirements, including LTE antenna beam forming and LTE-Advanced carrier aggregation.
Bridging software and hardware to accelerate SoC validation
Design How-To  
2/15/2012   2 comments
As the complexity of systems-on-chip (SoCs) continues to increase, it is no longer possible to ignore the challenges caused by the convergence of software and hardware development. To deliver increased integration within a reasonable cost and time, the industry must transition to a new approach – design for visibility.
Counterfeit parts putting military at risk
News & Analysis  
2/15/2012   18 comments
Counterfeit parts are increasingly finding their way into mission critical military and healthcare equipment, with the number of fake electronic parts soaring dramatically over the past couple of years, according to market research organization IHS iSuppli.
Software tools ease AUTOSAR compliance
Design How-To  
2/9/2012   Post a comment
The AUTOSAR initiative is tackling the industry-wide constraints of complexity, competition, and cost. AUTOSAR provides incentives for manufacturers to replace their proprietary software/hardware interfaces with standardized ones linked to an independent architectural layer.
Probing technology performs DDR4 and JEDEC timing analysis
Product News  
2/8/2012   Post a comment
The Kibra 480 platform features proprietary probing technology designed for non-intrusive monitoring of DDR4's higher transfer speeds without signal calibration and setup.
Scope module characterizes 10-Gb/s to 32-Gb/s designs
Product News  
2/8/2012   Post a comment
Agilent Technologies Inc. has introduced a waveform analyzer for verifying and validating high-speed electrical communications systems and components.
A Current Sensing Tutorial--Part 1: Fundamentals
Design How-To  
2/8/2012   4 comments
Here’s Part 1 of a tutorial on current sensing that will provide the fundamentals of current sensing, devices used for current sensing, how to calculate the accuracy of a solution, and guidelines for printed circuit board (PCB) layout and troubleshooting
Rohde & Schwarz simplifies measurements on LTE devices
Product News  
2/8/2012   Post a comment
Rohde and Schwarz's open switch and control platform (OSP) equipped with the OSP-B155 option can be used to measure radiated spurious emissions (RSE) on LTE devices.
Challenges of testing mobile memories
Design How-To  
2/8/2012   1 comment
I recently spoke with Cecil Ho, President of CST, about the challenges of testing mobile memories, and he gave me his perspective from his vantage point at CST.
Brief history of scopes
Blog  
2/8/2012   1 comment
I have been serving as interim editor over at scope junction and wanted to share a little bit of history that I dug up on the oscilloscope.
Nostalgic about HP test equipment
Engineering Pop Culture!  
2/7/2012   34 comments
Any electronics engineer or technical person you speak to will know about Hewlett-Packard (HP) test equipment. And many of them will talk nostalgically of a certain item they have owned or worked with.
Test op-amps for input bias current
Design How-To  
2/7/2012   3 comments
In this article, we discuss two methods for testing input bias current.
Intel terahertz supplier secures $5.5 million in funds
News & Analysis  
2/6/2012   1 comment
TeraView Ltd. (Cambridge, England), a startup company founded in 2001 to develop terahertz systems for imaging and spectroscopy, has announced it has secured $5.5 million of investment from a consortium of U.S., Asian and European institutional and corporate investors.
DesignCon Best in Test awards highlight advances
Design How-To  
2/3/2012   Post a comment
Test & Measurement World honored the test industry with an event held during the 2012 DesignCon show
DesignCon 2012 test equip roundup
Product News  
2/3/2012   Post a comment
See what test equipment vendors demonstrated and debuted at the exhibition.
Extreme Design: When radar failure at 12,000 feet is not an option
Design How-To  
2/3/2012   8 comments
Battery and backup failures needed to be investigated and diagnosed—in harsh, remote operating conditions and venue
Signal Integrity Reference Kit
Blog  
2/2/2012   Post a comment
The folks over at Tektronix have created a reference kits about signal integrity containing a primer and webinar…
Panel probes T&M’s tech chiefs
News & Analysis  
2/2/2012   Post a comment
A DesignCon panel probed the leaders of the major test and measurement companies on a broad range of issues.
Select Schottky diodes based on avalanche performance
Design How-To  
2/2/2012   Post a comment
For reverse battery protection, peak avalanche power gauges pulse performance while having low forward voltage drop.
Aircraft industry heads upward
Military & Aerospace Blog  
2/1/2012   Post a comment
Analysts project 9.3% growth in 2012.
CEA-Leti opens 3-D IC packaging service
News & Analysis  
2/1/2012   Post a comment
French research institute CEA-Leti has announced the launch of a 3-D packaging platform and service that provides industrial and academic partners with what it describes as a "mature" process for the production of 3-D interconnected products and projects.
Digital oscilloscopes offer low price point
Product News  
2/1/2012   2 comments
Rigol Technologies, Inc. offers the DS4000 series digital oscilloscope, a general purpose test instrument for multiple applications.
Demodulation software tests next generation Wi-Fi
Product News  
2/1/2012   Post a comment
ZTEC Instruments has released ZProtocol™ WLAN, a 802.11ac demodulation software for the analysis, characterization and test of the next generation of Wi-Fi RF integrated circuits (RFIC).
Aeroflex upgrades digital radio test set
Product News  
2/1/2012   Post a comment
Aeroflex Incorporated announced that an upgrade to its 3920 Radio Test Set supports P25 Phase II TDMA test functions and adds features for the development, manufacturing, and field test of both analog and digital private mobile radios (PMRs) and base stations.


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