Dual RF power detector chips work to 11-GHz Product News 3/30/2006 Post a comment The fabs at IC house Linear Technology Corp. are dishing up dual-channel RF detector chips that work out to 11-GHz. LTC's Type LTC5533 chips can be used to measure RF power in multi-band WiFi, WiMAX and other radio applications.
3.5G wireless tester gets 1xEV-DO phone option Product News 3/29/2006 Post a comment Wireless test vendor Willtek Communications offers options for testing 1xEV-DO wireless devices. The company's existing 4400 Mobile Phone Tester, when fitted with these options, is now suitable for use in manufacturing, as well as by technicians at field repair centers.
Analog-output modules talk USB Product News 3/29/2006 Post a comment Data acquisition equipment vendor Measurement Computing now offers three 16-bit high-drive analog-output USB-compatible DAC modules. These are intended for use on PC-based data-acq systems, where they can provide 100-Hz/channel throughput.
Less-than-$1000 signal generator spans 1-Hz to 1-GHz Product News 3/28/2006 Post a comment Check out this $985 PC-controlled digitally synthesized signal generator that spans 1-Hz to 1-GHz. Developing analog and digital outputs, it accommodates a variety of waveform modulation options, operating as a signal source, function generator, and ARB.
Ultimate Products of the year Product News 3/27/2006 Post a comment Here is a list of the most significant products introduced in the past 12 months, chosen by qualified readers of EE Times and eeProductCenter. Electronic balloting was conducted quarterly, based on a list of 10 nominees submitted to readers by expert editors.
Automotive signal conditioning ICs go green Design How-To 3/22/2006 Post a comment As the deadline for implementing green, lead-free electronics packaging approaches, automotive system engineers must consider how they will accommodate the constraints and specifications of such new standards in their designs.
Development tools support wireless USB silicon Product News 3/16/2006 Post a comment If you're considering WiMedia-based ultra-wideband for your next product design, check out this reference design kit. It supports UWB silicon that works at wireless WiMedia data rates from 53-Mbits/s to USB's 480-Mbits---and even to 1-Mbit/s. The PCI Express mini card kit is based on Certified Wireless USB from the USB Implementers Forum.
Automated testing shoots for Dolby Digital certification Product News 3/16/2006 Post a comment Here's news of some macros for an automated system that tests audio gear for certification for the coveted Dolby Digital Certification. Software automatically configures and runs the required tests, presenting results on-screen and creating the requisite Dolby Certification documentation.
Deep-memory oscilloscope platforms probe automotive FlexRay Product News 3/15/2006 Post a comment Oscilloscope maker Yokogawa Electric is rolling out two FlexRay signal analyzers. These instruments let you simultaneously perform both protocol analyses and waveform observations for in-vehicle FlexRay control networks. This analyzer is claimed to be the first measuring instrument to integrate both functions.
Web-enabled programmable signal conditioners are Windows-equipped Product News 3/14/2006 Post a comment A 5U-sized chassis is the platform for a Web-connected 64-channel sensor signal-conditioning system. Multiple chasses can also be Ethernet-linked for high channel-count requirements. The compact unit features high performance capabilities powered by an onboard Pentium IV processor running Windows.
Boundary-scan test software extols system-wide coverage Product News 3/13/2006 Post a comment Here's news of a productivity-enhancing software application that extends the use of IEEE-1149.1 boundary-scan tools to testing and programming multi-assembly systems. These systems can comprise multiple boards, daughter cards, backplanes, connectors, and cables.
Agilent unveils optical test gear Product News 3/10/2006 Post a comment Agilent Technologies Inc. came to the Optical Fibers in Communications conference with a line of bit error rate testers spanning subgigabit rates for the production floor to the first 100-Gbit/sec bit error rate tester.
Leading-edge BERTs push PHY layer test horizons Product News 3/8/2006 Post a comment Because PHY layer test needs differ during development life cycles (ranging from leading-edge technology in research labs to small low-cost instruments suitable for high-volume manufacturing) Agilent Technologies now offers three very different bit-error-ratio testers. These instruments span the gamut of capabilities for conducting in-depth analyses and characterization, as well as production-line testing. One instrument accommodates 100-Gbit/s data streams!
SOC integration tips ease FlexRay vehicle network implementation Design How-To 3/8/2006 Post a comment New automotive applications such as advanced engine and emissions control and by-wire features require many more electronic components, each screaming for more data, deterministic behavior, and reliability. The FlexRay communication protocol was developed to fulfill these needs. Here's how design engineers can add it to their designs.
Test software enhances large data-set signal acquisition and analysis Design How-To 3/7/2006 Post a comment Focus-On: Large data-set signal acquisition and analysis. Recently introduced software addresses the problems associated with the acquisition of large data sets. Long record lengths generated by digital storage oscilloscopes, for example, can easily represent thousands of screen’s worth of signal activity. How do you wade through that and make sense of what your scope has acquired? Click to learn how.
Freebie handbook takes close look at test switching Product News 3/6/2006 Post a comment Want a handy desktop reference about switching functions for test applications? Test-and-measurement house Keithley Instruments is publishing a free Switching Handbook. This 190-page text covers the fundamentals of the switching function in test-and-measurement applications.
FPGA-based platform speeds in-vehicle testing Design How-To 3/3/2006 Post a comment Automotive tests often require unique equipment, resulting in large amounts of money spent on gear for only a few specific tests. Field-programmable gate arrays (FPGAs) permit engineers to create a single platform to solve a variety of in-vehicle test applications.
Plug-in digitizers get on-board peak detection Product News 3/1/2006 Post a comment Digitizer maker Gage Applied Technologies is releasing on-board peak detection for its existing PC-hosted digitizer boards. Gage's eXpert Peak Detection adjunct now permits detection of peaks within a set of digitized waveform data.
Air velocity transmitter uses hot-film sensor Product News 3/1/2006 Post a comment An air velocity transmitter from E+E Elektronik is designed for accurate measurement of air speed and gas flow at rates between 0 and 40-m. Its hot-film sensor element is based on state-of-the-art thin-film technology, guaranteeing high sensitivity even at very low mass flows.
Plug-in module accurately measures timing Product News 3/1/2006 Post a comment Check out this CompactPCI timing module. It offers the ability to measure events spaced as far apart as 20-seconds, with 50-ps timing resolution. The module can operate in either single-start or multi-start acquisition modes, with timing information on all independent channels encoded relative to a common channel.
Battle-hardened veterans of the electronics industry have heard of the “connected car” so often that they assume it’s a done deal. But do we really know what it takes to get a car connected and what its future entails? Join EE Times editor Junko Yoshida as she moderates a panel of movers and shakers in the connected car business. Executives from Cisco, Siemens and NXP will share ideas, plans and hopes for connected cars and their future. After the first 30 minutes of the radio show, our listeners will have the opportunity to ask questions via live online chat.