Digital-to-analog Conversion is everywhere Design How-To 3/26/2008 Post a comment Only a few know the differences in architecture and what advantages and disadvantages a string architecture has over an R2R ladder, and vice versa. Knowing the differences and how those general purpose DACs work enables the designer to choose the best DAC for their application. This article will shed some light on the basic operation of DACs and will give some answers to questions you always wanted to know.
Surface monitoring for industrial production gets smart News & Analysis 3/25/2008 Post a comment Against the background of growing quality requirements as well as increasing pressure to increase productivity, automatic surface monitoring technologies increasingly gain importance. With its MASC System (Modular Algorithms for Surface Control), Fraunhofer Institute Techno- und Wirtschaftsmathematik (Fraunhofer ITWM) has developed a set of software tools that detect and classify material defects through image processing.
Fail-safe gyro sensors targets high-reliability applications Product News 3/20/2008 Post a comment Austrian fabless chip vendor SensorDynamics has introduced two angular rate sensors which integrate monitoring circuitry at chip and module level. This double safety enables designers to use them in automotive applications as well as in other application areas where very high levels of resilience and safety are a requirement.
NI expands data logging portfolio Product News 3/19/2008 Post a comment National Instruments has announced four new C Series modules for data-logging applications including vibration/acoustical data logging and in-vehicle, structural, temperature and pressure testing.
Design for Low-Power Manufacturing Test Design How-To 3/18/2008 Post a comment The very process of testing digital circuits routinely increases their dynamic power consumption to levels far exceeding their power specification. The best way to avoid test power problems is to incorporate power-aware testing techniques in the design-for-test (DFT) process.
Sensors become ubiquitous and intelligent Industrial Control DesignLine Blog 3/17/2008 Post a comment While still far from covering the entire industrial value chain, the "digital factory" concept is gaining momentum. Industrial Automation " this is something that most often deals with factory floor topics, aiming at controlling all aspects of production directly via computer.
AOI provider Camtek faces class action lawsuit News & Analysis 3/13/2008 Post a comment The law office of Jacob Sabo (Tel Aviv, Israel) has filed a class action lawsuit in the District Court for the Northern District of California, claiming that inspection systems specialist Camtek Ltd. (Migdal Haemek, Israel) and some of its executives violated federal securities laws.
Getting More Test for Less Design How-To 3/11/2008 Post a comment In the world of IC manufacturing test, new types of defects continue to develop with newer fabrication processes and materials. These developments have led to an explosion in the amount of test data volume required and the amount of test time needed for testing each IC during manufacturing test. The article covers new fault models and test compression techniques.
Gas flow sensor customized News & Analysis 3/11/2008 Post a comment Component manufacturer Omron Europe has launched a new service to designers of industrial and medical electronics: The company offers customer specific alignment for its widespread MEMS-based D6F gas flow sensors.
Video quality analysis with automated, scripted testing Design How-To 3/7/2008 Post a comment Subjective video analysis is useful for development and evaluation purposes but does not lend itself to operational monitoring, production line testing, troubleshooting, or equipment specific repeatable measurements. The demand for objective video quality testing arose from the need for quantitative, repeatable video analysis.
Gas analyzer uses Coldfire processor Product News 3/6/2008 Post a comment Witt-Gasetechnik (Witten, Germany) plans to equip its mixing, metering and analysis units for technical gases with standard digital controllers. The first controllers will be launched this spring.
EVE launches ZeBu-Personal emulator News & Analysis 3/6/2008 Post a comment At the dawn of the Design Automation Conference (DATE) in Munich, Germany, Emulation and Verification Engineering SA (Palaiseau, France), a developer of hardware and software coverification tools, unveiled its ZeBu-Personal for system-on-chip (SoC) hardware verification and software development.
As data rates begin to move beyond 25 Gbps channels, new problems arise. Getting to 50 Gbps channels might not be possible with the traditional NRZ (2-level) signaling. PAM4 lets data rates double with only a small increase in channel bandwidth by sending two bits per symbol. But, it brings new measurement and analysis problems. Signal integrity sage Ransom Stephens will explain how PAM4 differs from NRZ and what to expect in design, measurement, and signal analysis.
January 2016 Cartoon Caption ContestBob's punishment for missing his deadline was to be tied to his chair tantalizingly close to a disconnected cable, with one hand superglued to his desk and another to his chin, while the pages from his wall calendar were slowly torn away.122 comments