Truchard and Kodosky of NI: Enthusiasm undimmed News & Analysis 3/30/2012 1 comment Dr. James Truchard and Jeff Kodosky, two cofounders of National Instruments Corp. (Austin, Texas) honored with the lifetime achievement award at the UBM Electronics ACE awards on Tuesday (March 27), sat down with EE Times to discuss a 35-year progress since the formation of their company.
Functional safety implementations in modern MCUs Design How-To 3/22/2012 6 comments Implementation of safety measures is on the rise in today’s automotive world in order to minimize the hazards in case of system malfunctions. Safety critical automotive operations need compliance with ISO 26262 (ASILx) and IEC 61508 (SILx) standards as their safe operation is directly linked to human and social safety.
DESIGN West RF preview Design How-To 3/20/2012 Post a comment If you are heading out to DESIGN West this year (March 26-29, McEnery Convention Center in San Jose), there are a lot of great things for RF & microwave engineers.
Software speeds cellular UE testing Product News 3/7/2012 Post a comment Agilent's N5972A interactive functional test software provides an automated and simplified interface for testing cellular user equipment in a controlled laboratory environment
EIS simplifies battery measurement and characterization Design How-To 3/5/2012 3 comments Electrochemical impedance spectroscopy (EIS) is increasingly important for measuring and characterizing batteries and other electrochemical systems. This non-invasive measurement method can be exploited not only in modeling energy storage such as batteries and fuel cells, but also in basic battery research and diagnostics.
ISO 26262 cuts electronics complexity risks: Pt. 2- Design for robustness Design How-To 3/2/2012 Post a comment Future development and integration of automotive safety functions will strengthen the need to have safe system development processes and to provide evidence that all reasonable safety objectives are satisfied. ISO 26262 provides guidance to reduce these risks to a tolerable level by providing feasible requirements and processes.
Product Roundup: Mobile World Congress, part 2 Product News 3/2/2012 Post a comment Wish you had made it to Barcelona? Never fear, intrepid reporter Larry Desjardin (contributing editor for Test & Measurement World) was on the scene, covering the best and brightest test equipment on display at Mobile World Congress.
A Book For All Reasons Bernard Cole3 comments Robert Oshana's recent book "Software Engineering for Embedded Systems (Newnes/Elsevier)," written and edited with Mark Kraeling, is a 'book for all reasons.' At almost 1,200 pages, it ...