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Content tagged with Test & Measurement
posted in April 2004
TTL-I/O PXI plug-in maxes memory
Product News  
4/29/2004   Post a comment
Strategic Test Corp. has a 125-MHz 1-channel to 16-channel digital I/O card for PXI systems. All of the on-board memory can be used when recording or replaying with 16, 8, 4, 2 or 1 channels.
Focus-On: Standards for test coverage reports
Product News  
4/29/2004   Post a comment
Industry efforts are under way to develop a standard method for reporting test coverage, with the goal of having a reporting standard for stuck-at faults ready in time for next year's International Test Conference.
Desktop safety tester checks insulation-resistance, leakage
Product News  
4/28/2004   Post a comment
A new electrical safety tester meets the requirements of design, engineering, production line or type-testing applications. The digital instrument can perform a suite of standard electrical safety tests, with traceability of test results and records.
Module conditions bridge sensors
Product News  
4/27/2004   Post a comment
Here's news of a signal-conditioning module for bridge-type sensors. It's designed to power and signal-condition most strain gauge or piezoresistive sensors, configured as single-, half-, or full-bridge types.
High-speed data-storage tester meets industry conformance specs
Product News  
4/27/2004   Post a comment
Network and data-storage test house I-TECH is rolling out a test suite that's recognized under the Fibre Channel Industry Association's SANmark Qualified Program.
Production tester addresses high-speed serial chip tests
Product News  
4/27/2004   Post a comment
Here's news of what may be the semiconductor test industry's first high-speed production tester for identifying the maximum number of product defects at the lowest cost. This system enables signal-integrity testing of high-speed serial links operating as fast as 6.4-Gbits/s, using a loopback/built-in self-test approach. The system promises to deliver cost savings in excess of 50% over conventional at-speed production approaches.
TDR and VNA measurements shed light on Gbits/s interconnects
News & Analysis  
4/26/2004   Post a comment
With Time Domain Reflectometry (TDR) designers can deduce information on device-under-test (DUT) properties as the location of failures, the line impedance and the time delays for high speed signals, writes Dima Smolyansky, measurement expert at TDA Systems. But Frequency Domain Vector Network Analysis (VNA) using a synchronized sweep between a sine wave stimulus, and a narrow band filter at the receiver end requires additional software to make sense of the picosecond-readings captured by TDR sc
Fast WLAN analyzer rides the IEEE-488 bus__for now
Product News  
4/23/2004   Post a comment
Anritsu's got a new single-instrument test set for WLAN testing that can conduct both transmitter and receiver measurements based on the IEEE-802.11 standard. The comapny says its new instrument will make WLAN measurements ten times faster than existing test alternatives. eeProductCenter Senior Tech Editor Alex Mendelsohn looks at what Anritsu's insterument can---and can't---do.
PCI-bus A/D plug-in grabs 8-Gbytes of continuous analog data
Product News  
4/22/2004   Post a comment
Touting unprecedented storage-depth and speed, this PCI-bus data-acq board packs deep storage depth. Capable of continuously acquiring two simultaneous channels, each running at up to 800-Megasamples/s, and storing up to 4-Gsamples of uninterrupted data on each, this board offers extreme memory depth for unheard of record lengths.
BIST targets GHz-speed serial I/O
Product News  
4/21/2004   Post a comment
High-speed serial I/O is proliferating, as the advantages of fast serial links drive parallel I/O buses out of board designs. But, how do you test these GHz-speed I/O systems?
PCI plug-ins put wideband storage scope, spectrum analyzer functions on PCs
Product News  
4/20/2004   Post a comment
Gage Applied Technologies has a new PCI bus digitizer that can sample as fast as 200 Msamples/s with a resolution of 14 bits. The company's latest CompuScope 14200 is billed as a general-purpose digitizer, but it can do precision signal capture.
VME signal conditioner handles bridge-type strain gauges
Product News  
4/19/2004   Post a comment
A new 8-channel VME bus strain-gauge signal conditioner plug-in uses individual remote-sensed excitation supplies for every channel. The single-width 6U-sized VME bus B-size VXI modules also pack filtering and normalization functions.
PXI-2.0-compliant plug-ins run programmable resistors
Product News  
4/16/2004   Post a comment
Modular instrumentation house Pickering Interfaces is offering some neat PXI programmable resistor modules. These PXI 2.0 plug-ins let programmable resistors and potentiometers simulate external sensors and controls.
High bit-rate recorders to use modular signal interfaces
Product News  
4/15/2004   Post a comment
Working with MIL/aero technologies and systems? If so, data-acquisition equipment supplier Heim Data Systems is pre-announcing some nifty cabinet-level data-acq gear. The company's recorder will be equipped with modular signal interfaces and interchangeable media cartridges, so that it can adapt to changing requirements in airborne and mobile applications.
HV meters exhibit 100-Gohm input-Z for automotive ESD testing
Product News  
4/15/2004   Post a comment
Here's news of two portable battery-powered high-voltage meters designed specifically for ESD testing. These LCD-readout meters are just the ticket to meet the new automotive industry's latest SAE-J1113-13 test standard.
Programmable PCI-bus synthesizer boards pack fast DDS chips
Product News  
4/14/2004   Post a comment
Senior Tech Editor Alex Mendelsohn reviews some half-size PCI boards that operate as direct-digital synthesized RF generators. These plug-ins can run in either 64-bit or 32-bit 33-MHz or 66-MHz PCI slots, at either 5 V or 3.3 V.
Opinion, Part II: Synthetic test is the future of test, but the technology is available now
Product News  
4/13/2004   Post a comment
Instruments that can synthesize stimulus and measurement use a combination of algorithms and hardware modules. The benefits of a malleable synthetic-instrument system can be compelling. In this second part of a 2-part eeProductCenter Opinion article, Aeroflex author Marvin Rozner, Jr. looks at how synthetic instrumentation treats hardware in the much the same way that object-oriented programming treats software.
Analog MUX, data converter combo is low cost, easy-to-implement
Product News  
4/12/2004   Post a comment
Here's a PCI and PC/104-bus analog MUX---replete with on-board power converter circuits---that can run as a standalone product or with an 8-channel A/D board. eeProductCenter's Alex Mendelsohn provides additional insight above and beyond the vendor's notes.
Low-cost mezzanine plug-in pops 10-MHz digital scope functions into systems
Product News  
4/8/2004   Post a comment
Here's news of a new 10-MHz-bandwidth M-Module mezzanine card that lets you add multi-channel digital storage oscilloscope functions to systems based on a wide variety of open buses, including Compact PCI, PXI and VME. Alternatively, you can also install it in bus-less standalone systems.
New approaches to RF analysis are needed to analyze wireless signals
Product News  
4/8/2004   Post a comment
Opinion: Swept spectrum analyzers can't keep pace with today's RF signals. Gathering RF signal information using realtime approaches is better, but even that is only a beginning. The strength of realtime RF acquisition is in analysis. Tektronix's Rick King explains why.
Agilent crafts GUI for PCI Express test applications
Product News  
4/7/2004   Post a comment
Test-and-measurement house Agilent Technologies now has a graphical user interface for its popular serial protocol tester. Agilent says its GUI tool can dramatically reduce the setup time of PCI Express transactions to test designs.
8-channel low-freq counter ushers in PXI family
Product News  
4/6/2004   Post a comment
Test equipment vendor KineticSystems is rolling out what it says will be the first of a family of test-and-measurement modules for PXI systems. The first product of the family is a single-width 3U module that accommodates eight frequency measurement channels. It can be used to monitor pulse sources in the range of 0.06-Hz to 100-kHz.
Aeroflex inks gov-oriented on-line accord with TestMart
Product News  
4/6/2004   Post a comment
Test-and-measurement supplier Aeroflex announces that one of its divisions is inking an accord with on-line service provider TestMart. Under the terms of the pact, TestMart will provide a set of government marketplace services to serve Aeroflex's federal- and defense-related user base. Care to dive into all the related government acronynms? If so, read on.
HDMI-certified video generators target HDTV, home theater systems
Product News  
4/6/2004   Post a comment
If you're developing HDTV or home theater equipment, here's news of new signal generators that can give you a way to test both digital HDMI and analog legacy video interfaces.
8-GHz Tektronix scopes use DSP to maintain fidelity
Product News  
4/5/2004   Post a comment
Debuting with Windows XP, scope maker Tektronix is readying its new TDS6000B digital storage oscilloscope line. It's in lockstep with Moore's Law, thanks to its 32-Msample deep memory, and ultra-high sample rate. Indeed, these scopes tout timebases that sweep as fast as 25-ps/division, with interpolation yielding an astounding 500-fs/pt. The 20-Gsample/s rate on all four channels touts an equivalent time-sample rate of 2-Tera-samples/s!
Boundary-scan controllers support three communications interfaces
Product News  
4/2/2004   Post a comment
JTAG Technologies, a provider of IEEE-1149.1 techniques for testing and programming high-density boards, announces an extension of its line of high-performance boundary-scan controllers. The company's DataBlaster Triple-Serial Interface units support JTAG testing with a choice of USB, Ethernet, or FireWire interfaces.
Option makes Anritsu network test set first to support upcoming ITU-T jitter standard
Product News  
4/1/2004   Post a comment
Test-and-measurement firm Anritsu is debuting a precision jitter analysis system that's expected to significantly enhance the measurement accuracy and repeatability of jitter measurements. Anritsu claims its new test instrument is the only one in the industry to support the phase-analysis method recommended in the revised ITU-T Draft 0.172 (2003.11). Parts Search

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What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.

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4:48:30 PM
michigan0 Sang Kim First, 28nm bulk is in volume manufacturing for several years by the major semiconductor companies but not 28nm FDSOI today yet. Why not? Simply because unlike 28nm bulk the LDD(Lightly Doped Drain) to minimize hot carrier generation can't be implemented in 28nm FDSOI. Furthermore, hot carrier reliability becomes worse with scaling, That is the major reason why 28nm FDSOI is not manufacturable today and will not be. Second, how can you suppress the leakage currents from such ultra short 7nm due to the short channel effects? How thin SOI thickness is required to prevent punch-through of un-dopped 7nm FDSOI? Possibly less than 4nm. Depositing such an ultra thin film less then 4nm filum uniformly and reliably over 12" wafers at the manufacturing line is extremely difficult or not even manufacturable. If not manufacturable, the 7nm FDSOI debate is over!Third, what happens when hot carriers are generated near the drain at normal operation of 7nm FDSOI? Electrons go to the positively biased drain with no harm but where the holes to go? The holes can't go to the substrate because of the thin BOX layer. Some holes may become trapped at the BOX layer causing Vt shift. However, the vast majority of holes drift through the the un-dopped SOI channel toward the N+Source,...
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