TTL-I/O PXI plug-in maxes memory Product News 4/29/2004 Post a comment Strategic Test Corp. has a 125-MHz 1-channel to 16-channel digital I/O card for PXI systems. All of the on-board memory can be used when recording or replaying with 16, 8, 4, 2 or 1 channels.
Focus-On: Standards for test coverage reports Product News 4/29/2004 Post a comment Industry efforts are under way to develop a standard method for reporting test coverage, with the goal of having a reporting standard for stuck-at faults ready in time for next year's International Test Conference.
Module conditions bridge sensors Product News 4/27/2004 Post a comment Here's news of a signal-conditioning module for bridge-type sensors. It's designed to power and signal-condition most strain gauge or piezoresistive sensors, configured as single-, half-, or full-bridge types.
Production tester addresses high-speed serial chip tests Product News 4/27/2004 Post a comment Here's news of what may be the semiconductor test industry's first high-speed production tester for identifying the maximum number of product defects at the lowest cost. This system enables signal-integrity testing of high-speed serial links operating as fast as 6.4-Gbits/s, using a loopback/built-in self-test approach. The system promises to deliver cost savings in excess of 50% over conventional at-speed production approaches.
TDR and VNA measurements shed light on Gbits/s interconnects News & Analysis 4/26/2004 Post a comment With Time Domain Reflectometry (TDR) designers can deduce information on device-under-test (DUT) properties as the location of failures, the line impedance and the time delays for high speed signals, writes Dima Smolyansky, measurement expert at TDA Systems. But Frequency Domain Vector Network Analysis (VNA) using a synchronized sweep between a sine wave stimulus, and a narrow band filter at the receiver end requires additional software to make sense of the picosecond-readings captured by TDR sc
Fast WLAN analyzer rides the IEEE-488 bus__for now Product News 4/23/2004 Post a comment Anritsu's got a new single-instrument test set for WLAN testing that can conduct both transmitter and receiver measurements based on the IEEE-802.11 standard. The comapny says its new instrument will make WLAN measurements ten times faster than existing test alternatives. eeProductCenter Senior Tech Editor Alex Mendelsohn looks at what Anritsu's insterument can---and can't---do.
PCI-bus A/D plug-in grabs 8-Gbytes of continuous analog data Product News 4/22/2004 Post a comment Touting unprecedented storage-depth and speed, this PCI-bus data-acq board packs deep storage depth. Capable of continuously acquiring two simultaneous channels, each running at up to 800-Megasamples/s, and storing up to 4-Gsamples of uninterrupted data on each, this board offers extreme memory depth for unheard of record lengths.
BIST targets GHz-speed serial I/O Product News 4/21/2004 Post a comment High-speed serial I/O is proliferating, as the advantages of fast serial links drive parallel I/O buses out of board designs. But, how do you test these GHz-speed I/O systems?
Portable analyzer tests mechanical machinery, systems, components Product News 4/19/2004 Post a comment If you're working with mechanical systems, or if you're just a gearhead at heart, you'll love this new PC-based battery-powered hardware/software package from IOtech. You can even use it to detect defects in a objects such as automotive disk brake pads to gear housings. And, you can do that in production-line settings.
High bit-rate recorders to use modular signal interfaces Product News 4/15/2004 Post a comment Working with MIL/aero technologies and systems? If so, data-acquisition equipment supplier Heim Data Systems is pre-announcing some nifty cabinet-level data-acq gear. The company's recorder will be equipped with modular signal interfaces and interchangeable media cartridges, so that it can adapt to changing requirements in airborne and mobile applications.
Opinion, Part II: Synthetic test is the future of test, but the technology is available now Product News 4/13/2004 Post a comment Instruments that can synthesize stimulus and measurement use a combination of algorithms and hardware modules. The benefits of a malleable synthetic-instrument system can be compelling. In this second part of a 2-part eeProductCenter Opinion article, Aeroflex author Marvin Rozner, Jr. looks at how synthetic instrumentation treats hardware in the much the same way that object-oriented programming treats software.
8-channel low-freq counter ushers in PXI family Product News 4/6/2004 Post a comment Test equipment vendor KineticSystems is rolling out what it says will be the first of a family of test-and-measurement modules for PXI systems. The first product of the family is a single-width 3U module that accommodates eight frequency measurement channels. It can be used to monitor pulse sources in the range of 0.06-Hz to 100-kHz.
Aeroflex inks gov-oriented on-line accord with TestMart Product News 4/6/2004 Post a comment Test-and-measurement supplier Aeroflex announces that one of its divisions is inking an accord with on-line service provider TestMart. Under the terms of the pact, TestMart will provide a set of government marketplace services to serve Aeroflex's federal- and defense-related user base. Care to dive into all the related government acronynms? If so, read on.
8-GHz Tektronix scopes use DSP to maintain fidelity Product News 4/5/2004 Post a comment Debuting with Windows XP, scope maker Tektronix is readying its new TDS6000B digital storage oscilloscope line. It's in lockstep with Moore's Law, thanks to its 32-Msample deep memory, and ultra-high sample rate. Indeed, these scopes tout timebases that sweep as fast as 25-ps/division, with interpolation yielding an astounding 500-fs/pt. The 20-Gsample/s rate on all four channels touts an equivalent time-sample rate of 2-Tera-samples/s!
Boundary-scan controllers support three communications interfaces Product News 4/2/2004 Post a comment JTAG Technologies, a provider of IEEE-1149.1 techniques for testing and programming high-density boards, announces an extension of its line of high-performance boundary-scan controllers. The company's DataBlaster Triple-Serial Interface units support JTAG testing with a choice of USB, Ethernet, or FireWire interfaces.
A Book For All Reasons Bernard Cole1 Comment Robert Oshana's recent book "Software Engineering for Embedded Systems (Newnes/Elsevier)," written and edited with Mark Kraeling, is a 'book for all reasons.' At almost 1,200 pages, it ...