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posted in April 2007
Ixia moves test chassis to desktop
News & Analysis  
4/30/2007   Post a comment
Spectrum analyzers offer digital demodulation for wireless networks
Product News  
4/27/2007   Post a comment
Aimed at wireless design, R&D and production test engineers, the Aeroflex 3280 Series spectrum analyzers now offers digital demodulation for analyzing 802.11a, b and g wireless networks.
Finding hidden problems: Why a scope's update rate matters
Design How-To  
4/25/2007   Post a comment
A fast update rate, a frequently misunderstood characteristic, is critical to an oscilloscope's ability to display problems with signal anomalies or glitches.
Low-cost in-circuit test system is easy to use
Product News  
4/24/2007   Post a comment
Agilent Technologies has introduced a low-cost in-circuit test system for original design manufacturers that need "just enough test" for high-volume digital consumer and personal computer motherboards.
X-ray inspection systems deliver high-throughput 3D coverage
Product News  
4/24/2007   Post a comment
Agilent Technologies says its Medalist x6000 3D X-ray inspection systems offer more than double the throughput of leading 3D solutions while using full 3D capability to find PCBA solder and manufacturing assembly defects.
REVIEW: Low cost oscilloscopes keep digital memory turned on
Product News  
4/24/2007   Post a comment
LeCroy is debuting its latest mixed-signal oscilloscopes in its WaveRunner Xi and WaveSurfer Xs Series. With analog bandwidths up to 2-GHz, a maximum digital input frequency of 500-MHz, and long memory of 50 Mpoints/channel, LeCroy's scopes can also be used to troubleshoot serial data buses and dissect their protocols. eeProductCenter Senior Technical Editor Alex Mendelsohn reports.
Production-line system runs 1,000 IC tests per second
Product News  
4/23/2007   Post a comment
ProductionLine Testers (PLT) plans to introduce a smaller IC test system that is twice as fast as its current model at the Semicon West 2007 conference in San Francisco in July.
IBM claims highest resolution MRI
News & Analysis  
4/23/2007   Post a comment
IBM Corp. will demonstrate what it claims is the world's first nanoscale MRI capable of imaging structures as small as 103 atoms.
Sussex researchers get funding for non-invasive testing
News & Analysis  
4/23/2007   Post a comment
A group of researchers at the University of Sussex Centre for Physical Electronics and Quantum Technology have won just over £750,000 of funding to investigate areas where the team's patented electric potential sensors (EPS) technology — used to measure electric fields — could be adapted into areas such as non-invasive testing of semiconductor devices.
Microwave spectrum analyzers cover 9-kHz to 20-GHz
Product News  
4/22/2007   Post a comment
Anritsu is offering value-oriented bench test engineers a powerful yet affordable product for microwave spectrum analysis.
Agilent cuts its BSIM3-based CMOS extraction time to two days
Product News  
4/20/2007   Post a comment
Agilent Technologies announced the shipment of the BSIM3 model extraction package for use with Agilent's integrated circuit characterization and analysis program (IC-CAP) device modeling software. The BSIM3 package contains the same speed and efficiency featured in the newer BSIM4 and PSP extraction modules.
Agilent reduces endurance test time for NVM cells
Product News  
4/19/2007   Post a comment
Agilent announced new hardware and software capabilities for its B1500A Semiconductor Device Analyzer and EasyEXPERT software test shell, which reduce the time required for the testing and characterization of advanced non-volatile memory (NVM) cells and other next-generation semiconductor devices.
REVIEW: Portable deep-memory scopes aim for price-sensitive sweet spot
Product News  
4/18/2007   Post a comment
Oscilloscope vendor Agilent Technologies now offers six scopes with 1-Mpoints of deep memory. The company's latest 5000 Series instruments merge high-resolution lab-quality waveform acquisition and measurement capability with lightweight and extreme portability. eeProductCenter test-and-measurement editor Alex Mendelsohn reports.
Test platform measures entertainment electronics in smart cars
Product News  
4/18/2007   Post a comment
Agilent Technologies Inc. introduced an addition to its TS-5000 family of automotive electronics functional test systems: a system built to test all infotainment and telematic modules in cars.
LabVIEW 8.2.1 supports Windows Vista
Product News  
4/18/2007   Post a comment
National Instruments announced the availability of a new version of LabVIEW, the graphical design platform for test, control and embedded system development, for use with Windows Vista.
Integrated test systems expedite semiconductor characterization
Product News  
4/16/2007   Post a comment
Keithley Instruments launched the ACS (Automated Characterization Suite) integrated test systems for semiconductor characterization at the device, wafer and cassette level.
Test tools critical to innovation
Design How-To  
4/16/2007   Post a comment
Constant product innovation has driven a thriving equipment-manufacturing industry over the last two decades. Innovation's enabler has been a steady stream of tools and technologies that help software developers work faster and smarter. Developers have clearly benefited from productivity-enhancing tools and technologies. Testers now need 21st-century tools to stay in parity. Without such solutions, test becomes a barrier to innovation.

PCI DAQ card integrates data acquisition and motion control
Product News  
4/16/2007   Post a comment
ADLINK Technology released the PCI-9221, a low-cost multi-function 16-bit resolution DAQ card featuring a sampling rate up to 250kS/s.
Student engineers develop and test a hybrid power train: Part 2 - the controller
Design How-To  
4/13/2007   Post a comment
Challenge X competition for a real-world hybrid vehicle taxes design, control, and organizational prowess. Here's a first-hand account of what's involved.
REVIEW: Economy RF spectrum analyzer troika sweeps the field
Product News  
4/12/2007   Post a comment
Anritsu's latest so-called economy spectrum analyzers include models that cover 9-kHz through to 20-GHz. These nomadic instruments, three in all, shape up as cost-effective alternatives for benchtop analyzers. eeProductCenter Senior Technical Editor Alex Mendelsohn reports.
Fuji gives Given Imaging's video capsule a boost
Product News  
4/12/2007   Post a comment
Fujicon Corporation is joining forces with Given Imaging Ltd. (Yoqneam, Israel), a startup which supplies a camera that can be swallowed to obtain pictures of the digestive tract. The companies will develop products for the gastrointestinal endoscopy and diagnostic fields.
Student engineers develop and test a hybrid power train: Part 1 - the model
Design How-To  
4/12/2007   Post a comment
Challenge X competition for a real-world hybrid vehicle taxes design, control, and organizational prowess. Here's a first-hand account of what's involved.
Sound, vibration analysis software offers interactive features
Product News  
4/10/2007   Post a comment
National Instruments released the NI Sound and Vibration Measurement Suite version 5.0, an interactive sound and vibration analysis software that includes the NI Sound and Vibration Assistant.
ETSI, AT4 to co-host mobile WiMAX PlugFest
News & Analysis  
4/10/2007   Post a comment
Two of the leading organizations writing and testing for WiMAX Forum Certification in Europe, ETSI and AT4 wireless, are to co-host the third, public mobile WiMAX PlugFest. The event is scheduled for May 13-19, 2007 in Sophia Antipolis, France.
USB protocol analyzer delivers fast packet-level timing
Product News  
4/5/2007   Post a comment
Total Phase has introduced the high-speed Beagle USB 480 protocol analyzer that features packet-level timing of 16.67 nanosecond resolution with real-time data display and filtering.
Protocol analyzer monitors MDIO bus traffic in real-time
Product News  
4/5/2007   Post a comment
Total Phase has released an improved and affordable Beagle protocol analyzer that now includes the ability to monitor MDIO bus traffic in real-time up to 2.5 MHz.
Understanding the basics of image and carrier suppression measurements
Design How-To  
4/4/2007   Post a comment
In the wireless world, direct upconversion RFICs are prone to several sources of error, and measurements such as carrier and image suppression are required to accurately characterize the effects of these errors.
Voltage monitor guaranteed over high temps for automotive apps
Product News  
4/3/2007   Post a comment
Check out Linear's latest triple supply voltage monitor that guarantees operation across -40°C to 125°C. The LTC1728H-5 monitors 5V, 3.3V and one adjustable trip threshold set with an external resistive divider network, giving users the flexibility to monitor voltages as low as 1-V.
REVIEW: Parametric testers pack asynchronous, synchronous parallel capabilities
Product News  
4/3/2007   Post a comment
Agilent Technologies now has a next-generation parametric test platform designed for those of you working in semiconductor fabs and research environments. Agilent's 4080 Series covers the full range of measurement requirements from mainstream IC processes to advanced fab processes beyond 45-nm feature sizes. eeProductCenter Senior Tech Editor Alex Mendelsohn reports.
REVIEW: Cost-effective scopes time-correlate analog, digital signals
Product News  
4/3/2007   Post a comment
Oscilloscope maker Tektronix rolls out its MSO4000 family of mixed-signal oscilloscopes. They combine realtime scope functions with logic analysis and a unique Wave Inspector search engine. eeProductCenter test-and-measurement editor Alex Mendelsohn reports.
PCI oscilloscopes extend speed, channel density
Product News  
4/2/2007   Post a comment
National Instruments announced PCI versions of two high-speed, high-density digitizers/oscilloscopes, extending the company's high-speed PCI offering to 2 GS/s (PCI-5152) and low-cost PCI offering (PCI-5015) to $500 per channel.
Toolkit analyzes analog, digital RF signals
Product News  
4/2/2007   Post a comment
Mindready announced the latest software-defined radio toolkit release, the Universal Radio Tester (URT) Version 3.0, aimed at improving test systems for audio, video, navigation and automotive applications.


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