REVIEW: Low cost oscilloscopes keep digital memory turned on Product News 4/24/2007 Post a comment LeCroy is debuting its latest mixed-signal oscilloscopes in its WaveRunner Xi and WaveSurfer Xs Series. With analog bandwidths up to 2-GHz, a maximum digital input frequency of 500-MHz, and long memory of 50 Mpoints/channel, LeCroy's scopes can also be used to troubleshoot serial data buses and dissect their protocols. eeProductCenter Senior Technical Editor Alex Mendelsohn reports.
Sussex researchers get funding for non-invasive testing News & Analysis 4/23/2007 Post a comment A group of researchers at the University of Sussex Centre for Physical Electronics and Quantum Technology have won just over £750,000 of funding to investigate areas where the team's patented electric potential sensors (EPS) technology used to measure electric fields could be adapted into areas such as non-invasive testing of semiconductor devices.
Agilent cuts its BSIM3-based CMOS extraction time to two days Product News 4/20/2007 Post a comment Agilent Technologies announced the shipment of the BSIM3 model extraction package for use with Agilent's integrated circuit characterization and analysis program (IC-CAP) device modeling software. The BSIM3 package contains the same speed and efficiency featured in the newer BSIM4 and PSP extraction modules.
Agilent reduces endurance test time for NVM cells Product News 4/19/2007 Post a comment Agilent announced new hardware and software capabilities for its B1500A Semiconductor Device Analyzer and EasyEXPERT software test shell, which reduce the time required for the testing and characterization of advanced non-volatile memory (NVM) cells and other next-generation semiconductor devices.
REVIEW: Portable deep-memory scopes aim for price-sensitive sweet spot Product News 4/18/2007 Post a comment Oscilloscope vendor Agilent Technologies now offers six scopes with 1-Mpoints of deep memory. The company's latest 5000 Series instruments merge high-resolution lab-quality waveform acquisition and measurement capability with lightweight and extreme portability. eeProductCenter test-and-measurement editor Alex Mendelsohn reports.
LabVIEW 8.2.1 supports Windows Vista Product News 4/18/2007 Post a comment National Instruments announced the availability of a new version of LabVIEW, the graphical design platform for test, control and embedded system development, for use with Windows Vista.
Test tools critical to innovation Design How-To 4/16/2007 Post a comment Constant product innovation has driven a thriving equipment-manufacturing industry over the last two decades. Innovation's enabler has been a steady stream of tools and technologies that help software developers work faster and smarter. Developers have clearly benefited from productivity-enhancing tools and technologies. Testers now need 21st-century tools to stay in parity. Without such solutions, test becomes a barrier to innovation.
REVIEW: Economy RF spectrum analyzer troika sweeps the field Product News 4/12/2007 Post a comment Anritsu's latest so-called economy spectrum analyzers include models that cover 9-kHz through to 20-GHz. These nomadic instruments, three in all, shape up as cost-effective alternatives for benchtop analyzers. eeProductCenter Senior Technical Editor Alex Mendelsohn reports.
Fuji gives Given Imaging's video capsule a boost Product News 4/12/2007 Post a comment Fujicon Corporation is joining forces with Given Imaging Ltd. (Yoqneam, Israel), a startup which supplies a camera that can be swallowed to obtain pictures of the digestive tract. The companies will develop products for the gastrointestinal endoscopy and diagnostic fields.
ETSI, AT4 to co-host mobile WiMAX PlugFest News & Analysis 4/10/2007 Post a comment Two of the leading organizations writing and testing for WiMAX Forum Certification in Europe, ETSI and AT4 wireless, are to co-host the third, public mobile WiMAX PlugFest. The event is scheduled for May 13-19, 2007 in Sophia Antipolis, France.
Voltage monitor guaranteed over high temps for automotive apps Product News 4/3/2007 Post a comment Check out Linear's latest triple supply voltage monitor that guarantees operation across -40°C to 125°C. The LTC1728H-5 monitors 5V, 3.3V and one adjustable trip threshold set with an external resistive divider network, giving users the flexibility to monitor voltages as low as 1-V.
REVIEW: Parametric testers pack asynchronous, synchronous parallel capabilities Product News 4/3/2007 Post a comment Agilent Technologies now has a next-generation parametric test platform designed for those of you working in semiconductor fabs and research environments. Agilent's 4080 Series covers the full range of measurement requirements from mainstream IC processes to advanced fab processes beyond 45-nm feature sizes. eeProductCenter Senior Tech Editor Alex Mendelsohn reports.
PCI oscilloscopes extend speed, channel density Product News 4/2/2007 Post a comment National Instruments announced PCI versions of two high-speed, high-density digitizers/oscilloscopes, extending the company's high-speed PCI offering to 2 GS/s (PCI-5152) and low-cost PCI offering (PCI-5015) to $500 per channel.
Toolkit analyzes analog, digital RF signals Product News 4/2/2007 Post a comment Mindready announced the latest software-defined radio toolkit release, the Universal Radio Tester (URT) Version 3.0, aimed at improving test systems for audio, video, navigation and automotive applications.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Are the design challenges the same as with embedded systems, but with a little developer- and IT-skills added in? What do engineers need to know? Rick Merritt talks with two experts about the tools and best options for designing IoT devices in 2016. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.