Getting test-ready for 802.11ac Design How-To 4/24/2012 2 comments From a manufacturing test perspective, the evolution of WLAN standards is something that must be understood and planned for ahead of time.
IPv6 testing: Tips you need to know Design How-To 4/23/2012 2 comments This article considers the causes of poor IPv6 compatibility and how to address them by running a testing environment to detect problems, test vendor fixes and establish a validation process for network equipment.
Multi-Platform Integration Engineering Investigations 4/19/2012 8 comments Balloons, they seem like a simple product ... that’s what I use to think before I was asked to build a machine to make foil balloons.
Go inside Fluke's electrical metrology lab Design How-To 4/18/2012 5 comments Fluke's metrology lab sits atop the company's calibration chain where metrologists and technicians support primary standards, transfer standards, working standards, and calibrators for the company's entire line of electrical measurement products
Tackling GaN Measurement Challenges Design How-To 4/9/2012 1 comment After 30 years, silicon MOSFET development has approached its theoretical limits. Progress in silicon has slowed to the point where small gains involve…
Battle-hardened veterans of the electronics industry have heard of the “connected car” so often that they assume it’s a done deal. But do we really know what it takes to get a car connected and what its future entails? Join EE Times editor Junko Yoshida as she moderates a panel of movers and shakers in the connected car business. Executives from Cisco, Siemens and NXP will share ideas, plans and hopes for connected cars and their future. After the first 30 minutes of the radio show, our listeners will have the opportunity to ask questions via live online chat.