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Content tagged with Test & Measurement
posted in April 2012
Innovative IC can't trap lightning, but can let you know it's coming
Product News  
4/30/2012   10 comments
Austriamicrosystems AS3935 Franklin Lightning Sensor IC senses approach via analog circuitry plus waveform-analysis algorithms
Gore starts business, develops tests for portable electronics
News & Analysis  
4/30/2012   1 comment
Gore has created a new business unit, Gore Portable Electronic Vents, to concentrate on solutions to protect portable devices from water, dust and dirt ingress while maintaining the integrity of sound transmission.
Case Study: Determining root cause of damaging high-voltage transients
Design How-To  
4/30/2012   Post a comment
Determining the source of electrical high-voltage transients to prevent light-rail car failure.
Microelectronic sensing system enables in-flight arrow ballistics measurement
Design How-To  
4/30/2012   4 comments
Packing MEMS and more in your arrow leads to an unusual data-acquisition system
Standards effort seeks to put a charge in EV deployment
News & Analysis  
4/25/2012   9 comments
The American National Standards Institute is driving an effort to develop technical specs for electric vehicle technology and related efforts like battery development and an interoperable charging infrastructure.
Agilent PC software analyzes scope captures
Product News  
4/25/2012   Post a comment
The application supports a variety of popular waveform formats.
CISC's test system checks RFID tag performance
Product News  
4/25/2012   Post a comment
The unit comes with measurement software and a reference tag for self-calibration.
LeCroy regains oscilloscope bandwidth lead
Product News  
4/24/2012   1 comment
At 65 GHz, the Labmaster 10Zi is the world's highest-bandwidth oscilloscope
Getting test-ready for 802.11ac
Design How-To  
4/24/2012   2 comments
From a manufacturing test perspective, the evolution of WLAN standards is something that must be understood and planned for ahead of time.
IPv6 testing: Tips you need to know
Design How-To  
4/23/2012   2 comments
This article considers the causes of poor IPv6 compatibility and how to address them by running a testing environment to detect problems, test vendor fixes and establish a validation process for network equipment.
Testing E911
Design How-To  
4/20/2012   3 comments
LTE and FCC initiatives spur new testing needs.
Multi-Platform Integration
Engineering Investigations  
4/19/2012   8 comments
Balloons, they seem like a simple product ... that’s what I use to think before I was asked to build a machine to make foil balloons.
Book Excerpt: Signal and Power Integrity – Simplified (Second Edition)
4/19/2012   Post a comment
This book offers a framework for understanding the electrical properties of interconnects and materials that apply across the entire hierarchy…
Sensor architecture allows real-time auto emissions monitoring, Pt. 2
Design How-To  
4/19/2012   Post a comment
As opposed to current periodic emission-control system testing—sensors, MCUs, and memory come together in an updated approach to real-time exhaust monitoring for improved pollution control. This part--sensing emissions and future challenges.
Go inside Fluke's electrical metrology lab
Design How-To  
4/18/2012   5 comments
Fluke's metrology lab sits atop the company's calibration chain where metrologists and technicians support primary standards, transfer standards, working standards, and calibrators for the company's entire line of electrical measurement products
NI releases apps for LabView, CompactDAQ hardware
Product News  
4/17/2012   Post a comment
National Instruments has released several mobile apps that are compatible with LabView software and NI hardware.
MIMO channel emulator tackles complex testbeds
Product News  
4/17/2012   Post a comment
Azimuth Systems has launched the ACE MX2 MIMO channel emulator.
Flying-lead probe aids PCIe 3.0 protocol analysis
Product News  
4/17/2012   Post a comment
Intended for use with the Agilent U4301A PCIe 3.0 protocol-analyzer module, the U4324A flying-lead solder-down probe captures 8.0-GT/s (gigatransfer per second) traces from the DUT.
Scope roundup
Test & Measurement Designline Blogs  
4/17/2012   3 comments
There's been a lot of news and events surrounding oscilloscopes lately, so I thought I would do a round up for you.
TriQuint and U.S. military team up on gallium nitride ICs
News & Analysis  
4/16/2012   15 comments
TriQuint Semiconductor will work with the U.S. Army Research Laboratory to develop high-frequency and mixed signal integrated circuits based on gallium nitride technology.
iPhone-based ECG is saving lives, even ahead of regulatory OK
Design How-To  
4/13/2012   Post a comment
Mass-market consumer products are bringing new options to medical instrumentation markets
Sensor architecture allows real-time auto emissions monitoring, Pt. 1
Design How-To  
4/12/2012   10 comments
As opposed to current periodic emission-control system testing—sensors, MCUs, and memory come together in an updated approach to real-time exhaust monitoring for improved pollution control.
Real-time scope punches to 63-GHz true analog bandwidth, on two channels
Product News  
4/11/2012   Post a comment
Agilent Infiniium 90000 Q-Series also hits 33 GHz on four channels
Agilent Infiniium oscilloscope reaches 63-GHz-bandwidth
Product News  
4/11/2012   Post a comment
Examines Agilent's 63-GHz-bandwidth real-time-sampling DSO as it compares to other high-performance scopes available today.
Digital pressure sensors boast high resolution, accuracy
Product News  
4/11/2012   Post a comment
Customization includes pressure ranges, sensor interface, and communication protocol.
Tips for testing processor cores
Design How-To  
4/11/2012   Post a comment
You can structure the test aspects of the processor core in a manner that makes them effective and predictable.
Apps ease test and measurement tasks on all levels
News & Analysis  
4/11/2012   2 comments
Testing has become a world of applications one can access and use from fixed and mobile devices to control the testing environment in both large enterprise settings as well as in local engineering labs.
Improve production test of high-speed RF components
Design How-To  
4/10/2012   1 comment
Using BER-SNR correlation, designers can test adjacent-channel rejection in VHF receiver ICs.
Tackling GaN Measurement Challenges
Design How-To  
4/9/2012   Post a comment
After 30 years, silicon MOSFET development has approached its theoretical limits. Progress in silicon has slowed to the point where small gains involve…
Dual power booster adds serious muscle to op amp outputs
Product News  
4/9/2012   Post a comment
Cirrus Logic/Apex PB63 two-channel amp drives semiconductor, flat-panel test, motors up to ±75V/2A
Two-wire Hall sensors target body electronics
Product News  
4/6/2012   4 comments
Melexis switch & latch Hall effect sensors designed for rugged automotive, industrial, and consumer applications.
Book excerpt: Power integrity for I/O interfaces: with signal integrity/power integrity co-design
Design How-To  
4/5/2012   Post a comment
The power to signal coupling noise can get amplified due to the channel effects and resonances. This, in turn, gets translated into jitter at the receiver…
National security threat: hacking the smart grid
News & Analysis  
4/5/2012   4 comments
The nation’s smart grid is constantly under threat of real attack and potentially no amount of investment in securing it will help, according to a white hat security expert.
Tektronix delivers test solution for Thunderbolt physical layer electrical validation
Product News  
4/5/2012   Post a comment
Tektronix, Inc. has announced a comprehensive test solution for Thunderbolt technology, a new, high-speed, multi-protocol I/O technology designed to provide headroom for next generation display and I/O requirements. 
LeCroy rolls out WaveStation generator line
Product News  
4/4/2012   1 comment
The instrument's color display lets you view waveform shape, along with various parameters.
Selecting high-speed ADCs for high-frequency applications
Design How-To  
4/3/2012   3 comments
This article covers the converter features required to obtain the best possible performance for high-frequency applications and system design considerations.
How to characterize wireless ICs faster at less cost
Design How-To  
4/2/2012   1 comment
In this application-based article, ST-Ericsson works with National Instruments to validate and characterize RFICs in three weeks instead of two months.

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Rajaram Regupathy, Cypress Semiconductor

Add USB Battery Charging Protocols to an Android-Based Design
Rajaram Regupathy, Cypress Semiconductor
Post a comment
Editorial Note: Excerpted from Unboxing Android: A hands on approach with real world examples, by Rajaram Regupathy, the author takes you through the process incorporating effective power ...

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Making the Grade in Industrial Design
Rich Quinnell
As every developer knows, there are the paper specifications for a product design, and then there are the real requirements. The paper specs are dry, bland, and rigidly numeric, making ...

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