When MEMS Meets Metrology Blog 4/29/2013 Post a comment Advancing capabilities in test and measurement take two mutually supportive paths: refinement of exiting approaches and adaptation of apparently unrelated technologies.
Tips for increasing oscilloscope vertical resolution - Part I Design How-To 4/4/2013 1 comment Measurement of small signals can be challenging as the ability to view them is impacted not only by the noise of the scope, but also by scope settings and probing. Agilent presents techniques to help your scope show smaller signals than you’ve previously seen with it.
In conjunction with unveiling of EE Times’ Silicon 60 list, journalist & Silicon 60 researcher Peter Clarke hosts a conversation on startups in the electronics industry. One of Silicon Valley's great contributions to the world has been the demonstration of how the application of entrepreneurship and venture capital to electronics and semiconductor hardware can create wealth with developments in semiconductors, displays, design automation, MEMS and across the breadth of hardware developments. But in recent years concerns have been raised that traditional venture capital has turned its back on hardware-related startups in favor of software and Internet applications and services. Panelists from incubators join Peter Clarke in debate.