When MEMS Meets Metrology Blog 4/29/2013 Post a comment Advancing capabilities in test and measurement take two mutually supportive paths: refinement of exiting approaches and adaptation of apparently unrelated technologies.
Tips for increasing oscilloscope vertical resolution - Part I Design How-To 4/4/2013 1 comment Measurement of small signals can be challenging as the ability to view them is impacted not only by the noise of the scope, but also by scope settings and probing. Agilent presents techniques to help your scope show smaller signals than you’ve previously seen with it.
Replay available now: A handful of emerging network technologies are competing to be the preferred wide-area connection for the Internet of Things. All claim lower costs and power use than cellular but none have wide deployment yet. Listen in as proponents of leading contenders make their case to be the metro or national IoT network of the future. Rick Merritt, EE Times Silicon Valley Bureau Chief, moderators this discussion. Join in and ask his guests questions.