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posted in April 2013
Book excerpt: Agilent’s LTE and the Evolution to 4G Wireless, part 2
Design How-To  
4/30/2013   Post a comment
Use over-the-air testing to improve performance of SISO and MIMO devices.
Tracking down interference in complex RF environments
Design How-To  
4/30/2013   4 comments
Agilent system engineers report how the use of "gapless capture" allows the continuous measurement of data over long durations to ensure the capture of RF events.
How small vendors compete in analog IC market
Design How-To  
4/29/2013   13 comments
A case study of two AFE ICs confirms a significant potential for small IC vendors.
When MEMS Meets Metrology
Blog  
4/29/2013   Post a comment
Advancing capabilities in test and measurement take two mutually supportive paths: refinement of exiting approaches and adaptation of apparently unrelated technologies.
EDA/IP weekly roundup – April 24th 2013
Blog  
4/24/2013   Post a comment
ARM, Aspen Labs, CEVA, Corelis, Digi-Key, EDAC, IC Manage and Mouser made the lineup today. See here for their news…
MIT measures deformability of cancer cells
Design How-To  
4/24/2013   Post a comment
MIT engineers are applying microchannel resonator technology to measure physical changes in tumor cells as they become metastatic.
Tektronix releases PA4000 power analyzer
Product News  
4/19/2013   Post a comment
Marking its entrance into the power analyzer market, Tektronix this week debuted the PA4000 power analyzer.
Tektronix expands into power analyzer market
Design How-To  
4/13/2013   1 comment
Acquisition of Voltech gives Tektronix a head start in product development.
Slideshow: Top 10 test & measurement products
Design How-To  
4/12/2013   Post a comment
Here's a look at the 10 most popular T&M products over the past year. I think the #1 product will surprise you; it surprised me.
Measure of chaos: When uncertainty runs amok
Blog  
4/10/2013   Post a comment
Can a butterfly flapping its wings in Japan cause a tornado in Silicon Valley? Ransom explains the roots of chaos with a simple carpentry metaphor.
Tips for increasing oscilloscope vertical resolution - Part 2
Design How-To  
4/10/2013   1 comment
In the second part of this two-part series, Agilent Technologies discusses four other techniques that can help your scope see smaller signals than you have previously seen with it.
GPS simulator verifies WAAS LPV navigation systems
Product News  
4/4/2013   Post a comment
Aeroflex has added the ability to simulate WAAS LPV approach procedures to its GPSG-1000 portable GPS simulator to expedite and validate the installation of WAAS-capable navigation systems in aircraft.
Tips for increasing oscilloscope vertical resolution - Part I
Design How-To  
4/4/2013   1 comment
Measurement of small signals can be challenging as the ability to view them is impacted not only by the noise of the scope, but also by scope settings and probing. Agilent presents techniques to help your scope show smaller signals than you’ve previously seen with it.
Using color sensors to diagnose skin diseases
Design How-To  
4/3/2013   8 comments
Mazet discusses the demand for precise color measurements to evaluate skin diseases and prepare treatment or assess treatment success.
FPGAs supercharge instrument flexibility
Design How-To  
4/1/2013   Post a comment
A growing number of instrument vendors are giving users the ability to customize internal FPGAs, delivering a significant increase in flexibility and speed.
Book excerpt: Agilent’s LTE and the Evolution to 4G Wireless, part 1
Design How-To  
4/1/2013   Post a comment
Learn about beamforming, over-the-air MIMO testing, and a special discount offer just for EE Times readers.


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