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Content tagged with Test & Measurement
posted in May 2002
Advantest, Synopsys team up on failure diagnostics for complex ICs
News & Analysis  
5/21/2002   Post a comment
SANTA CLARA, Calif. -- Advantest Corp. announced it was collaborating with Synopsys Inc. to develop a fast, accurate failure diagnostics system for deep-submicron system-on-chip (SoC) designs. The failure diagnostics tools will leverage Synopsys' TetraMAX automatic test pattern generation (ATPG) technology, said Advantest.
Credence cuts mixed-signal test costs with building-block approach
News & Analysis  
5/15/2002   Post a comment
FREMONT, Calif. -- Credence Systems Corp. today rolled out its newest configurable chip tester for mixed-signal ICs, saying that the ASL 2000MS system will support low-cost testing with a highly-flexible "building-block" architecture.


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