Advantest, Synopsys team up on failure diagnostics for complex ICs News & Analysis 5/21/2002 Post a comment SANTA CLARA, Calif. -- Advantest Corp. announced it was collaborating with Synopsys Inc. to develop a fast, accurate failure diagnostics system for deep-submicron system-on-chip (SoC) designs. The failure diagnostics tools will leverage Synopsys' TetraMAX automatic test pattern generation (ATPG) technology, said Advantest.
What are the engineering and design challenges in creating successful IoT devices? These devices are usually small, resource-constrained electronics designed to sense, collect, send, and/or interpret data. Some of the devices need to be smart enough to act upon data in real time, 24/7. Specifically the guests will discuss sensors, security, and lessons from IoT deployments.